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Imaging ToF-SIMS as a chemical metrology tool to support material and analytical science

  • As a chemical metrology tool time-of-flight secondary ion mass spectrometry (ToF-SIMS) has become a very popular technique to monitor the elemental, isotopic and molecular distribution in two or three dimensions. Its reduced sampling depth, high sensitivity, great structural specificity and the direct detection of hydrogen thereby increase the emergence of ToF-SIMS for material and analytical surface science, particularly due to recent instrumental developments improving mass, depth and lateral resolution. For basic surface science, adsorption processes and surface reactivity thus can be investigated in high detail on organic as well as inorganic samples. The use of multivariate data analysis in addition can effectively assist to identify trends in the complex SIMS raw data set and define key co-variances between certain samples or mass spectra. In this contribution the essence of ToF-SIMS is illustrated by discussing two highly relevant energy applications. First, for piezoelectricAs a chemical metrology tool time-of-flight secondary ion mass spectrometry (ToF-SIMS) has become a very popular technique to monitor the elemental, isotopic and molecular distribution in two or three dimensions. Its reduced sampling depth, high sensitivity, great structural specificity and the direct detection of hydrogen thereby increase the emergence of ToF-SIMS for material and analytical surface science, particularly due to recent instrumental developments improving mass, depth and lateral resolution. For basic surface science, adsorption processes and surface reactivity thus can be investigated in high detail on organic as well as inorganic samples. The use of multivariate data analysis in addition can effectively assist to identify trends in the complex SIMS raw data set and define key co-variances between certain samples or mass spectra. In this contribution the essence of ToF-SIMS is illustrated by discussing two highly relevant energy applications. First, for piezoelectric electroceramics oxygen exchange active zones have been visualized to determine the impact of external field-load to the oxygen vacancy distribution between anode and cathode. As a second case study the interaction of hydrogen species with the microstructure of a duplex stainless steel was investigated. It was concluded that ToF-SIMS has a valuable essence for detailing hydrogen related degradation mechanisms.zeige mehrzeige weniger

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Autor*innen:Gerald Holzlechner, Oded SobolORCiD, Thomas Böllinghaus, Wolfgang UngerORCiD
Persönliche Herausgeber*innen:W. Udomkichdecha, A. Mononukul, Thomas Böllinghaus, Jürgen Lexow
Dokumenttyp:Beitrag zu einem Sammelband
Veröffentlichungsform:Verlagsliteratur
Sprache:Englisch
Titel des übergeordneten Werkes (Englisch):Materials for energy infrastructure
Jahr der Erstveröffentlichung:2016
Verlag:Springer
Erste Seite:63
Letzte Seite:72
Veranstaltung:4th WMRIF Young scientists workshop
Veranstaltungsort:Boulder, CO, USA
Beginndatum der Veranstaltung:08.09.2014
Enddatum der Veranstaltung:10.09.2014
DOI:10.1007/978-981-287-724-6_7
ISBN:978-981-287-723-9
ISBN:978-981-287-724-6
Verfügbarkeit des Dokuments:Datei im Netzwerk der BAM verfügbar ("Closed Access")
Datum der Freischaltung:20.02.2016
Referierte Publikation:Nein
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