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Edge artefacts of radiographic images by X-ray refraction

  • The relevance of nano sized structures and interfaces in upcoming technologies requires new non-destructive Xray techniques exploiting attenuation as well as scattering. In the course of driving the resolution and the contrast of modern radiography into micro and nano metre dimension the inevitable scattering effects require increased attention. Several radiologists interpret the observed edge artefacts simply by 'phase contrast' due to different X-ray path lengths within the sample and others refer to Fresnel scattering. The ultra small angle scattering is of high intensity and may reach the level of the primary beam. We present monochromatic synchrotron measurements on rather simply shaped objects (such as plates and cylinders) which prove clearly the dominance of refraction intensity over total reflection and coherent small angle scattering. The refraction conditions hold for angles of incidence of several degrees to the surface, but typical deflection angles range from severalThe relevance of nano sized structures and interfaces in upcoming technologies requires new non-destructive Xray techniques exploiting attenuation as well as scattering. In the course of driving the resolution and the contrast of modern radiography into micro and nano metre dimension the inevitable scattering effects require increased attention. Several radiologists interpret the observed edge artefacts simply by 'phase contrast' due to different X-ray path lengths within the sample and others refer to Fresnel scattering. The ultra small angle scattering is of high intensity and may reach the level of the primary beam. We present monochromatic synchrotron measurements on rather simply shaped objects (such as plates and cylinders) which prove clearly the dominance of refraction intensity over total reflection and coherent small angle scattering. The refraction conditions hold for angles of incidence of several degrees to the surface, but typical deflection angles range from several seconds to minutes of arc. Additionally to the concept of 'phase contrast' of the primary beam its deflection becomes the essential issue. The appropriate removal of the attenuation contribution enables the imaging of inner surfaces and interfaces by refraction scanning topography. The presented measurements of reference particles demonstrate the reliability of laboratory refraction scanners applying X-ray tubes.zeige mehrzeige weniger

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Metadaten
Autor*innen:Axel Lange, Andreas KupschORCiD, Bernd R. MüllerORCiD, Manfred P. Hentschel
Dokumenttyp:Beitrag zu einem Tagungsband
Veröffentlichungsform:Verlagsliteratur
Sprache:Englisch
Titel des übergeordneten Werkes (Englisch):18th WCNDT - World conference on nondestructive testing (Proceedings)
Jahr der Erstveröffentlichung:2012
Erste Seite:1
Letzte Seite:11(?)
Freie Schlagwörter:Nanocracks; Nanostructures; Phase contrast radiography; Refraction topography; Small angle scattering; X-ray refraction
Veranstaltung:18th WCNDT - World conference on nondestructive testing
Veranstaltungsort:Durban, South Africa
Beginndatum der Veranstaltung:2012-04-16
Enddatum der Veranstaltung:2012-04-20
URL:http://www.ndt.net/article/wcndt2012/papers/274_wcndtfinal00274.pdf
ISBN:978-0-620-52872-6
Verfügbarkeit des Dokuments:Physisches Exemplar in der Bibliothek der BAM vorhanden ("Hardcopy Access")
Bibliotheksstandort:Sonderstandort: Publica-Schrank
Datum der Freischaltung:19.02.2016
Referierte Publikation:Nein
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