Evaluation of electron microscopy techniques for the purpose of classification of nanomaterials
- Electron microscopy techniques such as TEM, STEM, SEM or TSEM (transmission in SEM) are capable of assessing the size of individual nanoparticles accurately. Nevertheless, the challenging aspect is sample preparation from powder or liquid form on the substrate, so that a homogeneous distribution of well-separated (deagglomerated) particles is attained. The systematic study in this work shows examples where the extraction of the critical, smallest particle dimension - as the decisive particle parameter for the classification as a NM - is possible by analysing the sample after ist simple, dry preparation. The consequences of additional typical issues like loss of information due to screening of smaller particles by larger ones or the (in)ability to access the constituent particles in aggregates are discussed.
Autor*innen: | Johannes Mielke, F. Babick, T. Uusimäki, P. Müller, E. Verleysen, Vasile-Dan HodoroabaORCiD |
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Dokumenttyp: | Zeitschriftenartikel |
Veröffentlichungsform: | Verlagsliteratur |
Sprache: | Englisch |
Titel des übergeordneten Werkes (Englisch): | Microscopy and Microanalysis |
Jahr der Erstveröffentlichung: | 2016 |
Verlag: | Cambridge |
Jahrgang/Band: | 22 |
Ausgabe/Heft: | Suppl. 3 |
Erste Seite: | 936 |
Letzte Seite: | 937 |
DDC-Klassifikation: | Naturwissenschaften und Mathematik / Chemie / Analytische Chemie |
Freie Schlagwörter: | Classification; Electron microscopy; Nanomaterial; Particle size distribution |
DOI: | 10.1017/S1431927616005523 |
URL: | https://www.cambridge.org/core/journals/microscopy-and-microanalysis/article/evaluation-of-electron-microscopy-techniques-for-the-purpose-of-classification-of-nanomaterials/0B66A25EA7F7A5A3622C02A359C8304F |
ISSN: | 1431-9276 |
ISSN: | 1435-8115 |
Verfügbarkeit des Dokuments: | Datei im Netzwerk der BAM verfügbar ("Closed Access") |
Datum der Freischaltung: | 25.11.2016 |
Referierte Publikation: | Nein |