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Metrological Protocols for Reaching Reliable and SI-Traceable Size Results for Multi-Modal and Complexly Shaped Reference Nanoparticles

  • The study described in this paper was conducted in the framework of the European nPSize project (EMPIR program) with the main objective of proposing new reference certified nanomaterials for the market in order to improve the reliability and traceability of nanoparticle size measurements. For this purpose, bimodal populations as well as complexly shaped nanoparticles (bipyramids, cubes, and rods) were synthesized. An inter-laboratory comparison was organized for comparing the size measurements of the selected nanoparticle samples performed with electron microscopy (TEM, SEM, and TSEM), scanning probe microscopy (AFM), or small-angle X-ray scattering (SAXS). The results demonstrate good consistency of the measured size by the different techniques in cases where special care was taken for sample preparation, instrument calibration, and the clear definition of the measurand. For each characterization method, the calibration process is described and a semi-quantitative table grouping theThe study described in this paper was conducted in the framework of the European nPSize project (EMPIR program) with the main objective of proposing new reference certified nanomaterials for the market in order to improve the reliability and traceability of nanoparticle size measurements. For this purpose, bimodal populations as well as complexly shaped nanoparticles (bipyramids, cubes, and rods) were synthesized. An inter-laboratory comparison was organized for comparing the size measurements of the selected nanoparticle samples performed with electron microscopy (TEM, SEM, and TSEM), scanning probe microscopy (AFM), or small-angle X-ray scattering (SAXS). The results demonstrate good consistency of the measured size by the different techniques in cases where special care was taken for sample preparation, instrument calibration, and the clear definition of the measurand. For each characterization method, the calibration process is described and a semi-quantitative table grouping the main error sources is proposed for estimating the uncertainties associated with the measurements. Regarding microscopy-based techniques applied to complexly shaped nanoparticles, data dispersion can be observed when the size measurements are affected by the orientation of the nanoparticles on the substrate. For the most complex materials, hybrid approaches combining several complementary techniques were tested, with the outcome being that the reliability of the size results was improved.zeige mehrzeige weniger

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Metadaten
Autor*innen:N. Feltin, L. CrouzierORCiD, A. DelvalléeORCiD, F PellegrinoORCiD, V. MaurinoORCiD, D. BartczakORCiD, H. Goenaga-InfanteORCiD, O. TachéORCiD, S. MarguetORCiD, F. TestardORCiD, S. ArtousORCiD, F. Saint-AntoninORCiD, Christoph Salzmann, J. DeumerORCiD, C. GollwitzerORCiD, R. Koops, N. SebaïhiORCiD, R. Fontanges, M. Neuwirth, D. Bergmann, D. Hüser, T. Klein, Vasile-Dan HodoroabaORCiD
Dokumenttyp:Zeitschriftenartikel
Veröffentlichungsform:Verlagsliteratur
Sprache:Englisch
Titel des übergeordneten Werkes (Englisch):Nanomaterials
Jahr der Erstveröffentlichung:2023
Organisationseinheit der BAM:6 Materialchemie
6 Materialchemie / 6.1 Oberflächen- und Dünnschichtanalyse
Veröffentlichende Institution:Bundesanstalt für Materialforschung und -prüfung (BAM)
Verlag:MDPI
Verlagsort:Basel, CH
Jahrgang/Band:13
Ausgabe/Heft:6 - Special Issue "Identification and Quantification of Nanomaterials"
Aufsatznummer:993
Erste Seite:1
Letzte Seite:25
DDC-Klassifikation:Technik, Medizin, angewandte Wissenschaften / Ingenieurwissenschaften / Ingenieurwissenschaften und zugeordnete Tätigkeiten
Freie Schlagwörter:Certified reference nanomaterials; Electron microscopy; Hybrid metrology; Scanning probe microscopy; Small-angle X-ray scattering; Traceable nanoparticle size measurements;
Themenfelder/Aktivitätsfelder der BAM:Material
Material / Nano
DOI:10.3390/nano13060993
URN:urn:nbn:de:kobv:b43-571902
ISSN:2079-4991
Verfügbarkeit des Dokuments:Datei für die Öffentlichkeit verfügbar ("Open Access")
Lizenz (Deutsch):License LogoCreative Commons - CC BY - Namensnennung 4.0 International
Datum der Freischaltung:23.03.2023
Referierte Publikation:Ja
Datum der Eintragung als referierte Publikation:03.04.2023
Schriftenreihen ohne Nummerierung:Wissenschaftliche Artikel der BAM
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