Das Suchergebnis hat sich seit Ihrer Suchanfrage verändert. Eventuell werden Dokumente in anderer Reihenfolge angezeigt.
  • Treffer 35 von 257
Zurück zur Trefferliste

Applications of X-ray refraction to non-destructive characterization of ceramics and composites

  • X-ray refraction is analogous to visible light deflection by matter, with two main differences: 1- convex objects cause divergence (i.e., the refraction index n is smaller than 1), and 2- deflection angles are very small, from a few seconds to a few minutes of arc (i.e., n is near to 1). Trivially but importantly, deflection of X-rays is also sensitive to the orientation of the object boundaries. These features make X-ray refraction techniques extremely suitable to a) detect defects such as pores and microcracks, and quantify their densities in bulk (light) materials, and b) evaluate porosity and particle properties such as orientation, size, and spatial distribution (by mapping). While X-ray refraction techniques cannot in general image single defects, their detectability is simply limited by the wavelength of the radiation. We will thereby show the application of X-ray refraction 2D mapping (topography) and tomography to different sorts of problems in ceramic science and technology:X-ray refraction is analogous to visible light deflection by matter, with two main differences: 1- convex objects cause divergence (i.e., the refraction index n is smaller than 1), and 2- deflection angles are very small, from a few seconds to a few minutes of arc (i.e., n is near to 1). Trivially but importantly, deflection of X-rays is also sensitive to the orientation of the object boundaries. These features make X-ray refraction techniques extremely suitable to a) detect defects such as pores and microcracks, and quantify their densities in bulk (light) materials, and b) evaluate porosity and particle properties such as orientation, size, and spatial distribution (by mapping). While X-ray refraction techniques cannot in general image single defects, their detectability is simply limited by the wavelength of the radiation. We will thereby show the application of X-ray refraction 2D mapping (topography) and tomography to different sorts of problems in ceramic science and technology: 1) Sintering of SiC green bodies; 2) Porosity analysis in diesel particulate filter silicates; 3) fiber de-bonding in metal and polymer matrix composites; 4) micro-cracking of glass-precursor -eucryptite. We will see that the use of X-ray refraction analysis yields quantitative results, also directly usable in available models.zeige mehrzeige weniger

Volltext Dateien herunterladen

  • X-ray_refraction_keramik_verband_GB.pdf
    eng

Metadaten exportieren

Weitere Dienste

Teilen auf Twitter Suche bei Google Scholar Anzahl der Zugriffe auf dieses Dokument
Metadaten
Autor*innen:Giovanni BrunoORCiD
Koautor*innen:Bernd R. Müller, Matthias P. Hentschel, Andreas Kupsch, A. Lange, Dietmar Meinel, A. Staude
Dokumenttyp:Vortrag
Veröffentlichungsform:Präsentation
Sprache:Englisch
Jahr der Erstveröffentlichung:2013
DDC-Klassifikation:Naturwissenschaften und Mathematik / Chemie / Analytische Chemie
Freie Schlagwörter:Computertomographie; Keramiken; Kompositen; Röntgenrefraktion; TF Material
Veranstaltung:Herbsttreffen des Verbandes der Keramik Industrien
Veranstaltungsort:Fraunhofer IWM, Freiburg im Breisgau, Germany
Beginndatum der Veranstaltung:27.10.2016
Verfügbarkeit des Dokuments:Datei im Netzwerk der BAM verfügbar ("Closed Access")
Datum der Freischaltung:17.11.2016
Referierte Publikation:Nein
Eingeladener Vortrag:Nein
Einverstanden
Diese Webseite verwendet technisch erforderliche Session-Cookies. Durch die weitere Nutzung der Webseite stimmen Sie diesem zu. Unsere Datenschutzerklärung finden Sie hier.