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Fast model of electron transport for radiographic spectrum simulation

  • Correctly modeling the continuous photon spectrum of X-ray tubes requires detailed knowledge of the probability distribution of electron properties at the time of X-ray photon creation, in particular electron energy, depth within the target, and direction of movement. Semi-analytical X-ray spectrum models frequently assume a very simplified or even uniform distribution of electron direction. In the case of thick targets and small deviations from normal incidence this is a useful approximation. For thin targets or large deviations from normal incidence the correct distribution of electron directions becomes more important. As calculation speed is an important aspect of semi-analytical models compared to Monte Carlo simulations, fast evaluation of the distribution of electron properties is highly desirable. The approach presented here numerically evaluates the evolution of a discrete probability distribution of electron properties due to single electron scatter interactions within aCorrectly modeling the continuous photon spectrum of X-ray tubes requires detailed knowledge of the probability distribution of electron properties at the time of X-ray photon creation, in particular electron energy, depth within the target, and direction of movement. Semi-analytical X-ray spectrum models frequently assume a very simplified or even uniform distribution of electron direction. In the case of thick targets and small deviations from normal incidence this is a useful approximation. For thin targets or large deviations from normal incidence the correct distribution of electron directions becomes more important. As calculation speed is an important aspect of semi-analytical models compared to Monte Carlo simulations, fast evaluation of the distribution of electron properties is highly desirable. The approach presented here numerically evaluates the evolution of a discrete probability distribution of electron properties due to single electron scatter interactions within a plane target. This allows capturing the important aspects of the electron distribution while achieving runtimes of a few seconds up to a minute on a standard office PC.zeige mehrzeige weniger

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Metadaten
Autor*innen:Andreas Deresch, Carsten BellonORCiD, Gerd-Rüdiger Jaenisch, Uwe Ewert
Persönliche Herausgeber*innen:D.E. Chimenti, L.J. Bond
Dokumenttyp:Beitrag zu einem Tagungsband
Veröffentlichungsform:Verlagsliteratur
Sprache:Englisch
Titel des übergeordneten Werkes (Englisch):41st Annual review of progress in quantitative nondestructive evaluation (Proceedings)
Jahr der Erstveröffentlichung:2015
Herausgeber (Institution):American institute of physics (AIP)
Verlag:AIP Publishing
Jahrgang/Band:1650
Erste Seite:579
Letzte Seite:585
Freie Schlagwörter:Modeling; Radiography; Spectrum; Valildation
Veranstaltung:41st Annual review of progress in quantitative nondestructive evaluation
Veranstaltungsort:Boise, Idaho, USA
Beginndatum der Veranstaltung:20.07.2014
Enddatum der Veranstaltung:25.07.2014
DOI:10.1063/1.4914656
ISBN:978-0-7354-1292-7
Bemerkung:
Serientitel: AIP conference proceedings – Series title: AIP conference proceedings
Verfügbarkeit des Dokuments:Datei im Netzwerk der BAM verfügbar ("Closed Access")
Datum der Freischaltung:20.02.2016
Referierte Publikation:Ja
Datum der Eintragung als referierte Publikation:23.04.2015
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