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Galvanomagnetic transport properties of nitrogenated (La, Sr)MnO3-Delta and LaMnO3-Delta

  • Epitaxial thin films of nitrogenated La0.65Sr0.30MnO3 were grown on MgO(100) substrates by pulsed laser deposition (PLD). The nitrogenation was achieved by a continuous nitrogen flow in the PLD chamber with pressures of up to 0.12 mbar. The chemical analysis of the samples regarding the exchange of oxygen by nitrogen was achieved by time of flight secondary ion mass spectrometry, sputtered neutral mass spectrometry (SNMS), X-ray photoelectron spectroscopy (XPS) and X-ray diffraction (XRD) and yielded a content of incorporated nitrogen ranging from 0.6% to 3.8%. Without nitrogenation the electrical resistivity of La0.65Sr0.30MnO3 exhibited a metal–insulator (MI) transition at about 180 K. The magnetoresistance (MR) effect (ΔR/R(0)) was about -50% at the transition temperature. Our nitrogen contents affected the MI transition so as to completely disappear and resulted in a resistivity increase of more than three orders of magnitude as well. By carefully reoxidizing the samples withEpitaxial thin films of nitrogenated La0.65Sr0.30MnO3 were grown on MgO(100) substrates by pulsed laser deposition (PLD). The nitrogenation was achieved by a continuous nitrogen flow in the PLD chamber with pressures of up to 0.12 mbar. The chemical analysis of the samples regarding the exchange of oxygen by nitrogen was achieved by time of flight secondary ion mass spectrometry, sputtered neutral mass spectrometry (SNMS), X-ray photoelectron spectroscopy (XPS) and X-ray diffraction (XRD) and yielded a content of incorporated nitrogen ranging from 0.6% to 3.8%. Without nitrogenation the electrical resistivity of La0.65Sr0.30MnO3 exhibited a metal–insulator (MI) transition at about 180 K. The magnetoresistance (MR) effect (ΔR/R(0)) was about -50% at the transition temperature. Our nitrogen contents affected the MI transition so as to completely disappear and resulted in a resistivity increase of more than three orders of magnitude as well. By carefully reoxidizing the samples with subsequent heat treatments in air the MI transition reappeared at lower temperatures and we found a continuously enhanced MR ratio for decreasing temperatures. MR ratios of more than -99% were observed for a magnetic field of 10 T. The results are interpreted as a percolation phenomenon of ferromagnetic–metallic domains within an antiferromagnetic–semiconducting matrix.zeige mehrzeige weniger

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Metadaten
Autor*innen:Marc Kreutzbruck, G. Lembke, C. Korte, B. Franz
Dokumenttyp:Zeitschriftenartikel
Veröffentlichungsform:Verlagsliteratur
Sprache:Englisch
Titel des übergeordneten Werkes (Englisch):Applied physics A
Jahr der Erstveröffentlichung:2007
Verlag:Springer
Verlagsort:Berlin
Jahrgang/Band:88
Ausgabe/Heft:1
Erste Seite:201
Letzte Seite:208
DOI:10.1007/s00339-007-3982-0
ISSN:0947-8396
Verfügbarkeit des Dokuments:Physisches Exemplar in der Bibliothek der BAM vorhanden ("Hardcopy Access")
Bibliotheksstandort:Sonderstandort: Publica-Schrank
Datum der Freischaltung:19.02.2016
Referierte Publikation:Ja
Datum der Eintragung als referierte Publikation:01.10.2007
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