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Synchrotron Refraction CT and Synchrotron Bragg Magnification CT for NDE

  • X-ray refraction topography techniques are based on ultra-small angle scattering by micro-structural elements causing phase-related effects such as refraction and total reflection at a few minutes of arc as the refractive index of X-rays is nearly unity. The refraction contrast is several times higher than “true absorption” and results in images of cracks, pores and fibre debonding separations below the spatial resolution of the detector. In most cases the investigated inner surface and interface structures correlate to mechanical properties. For the exploration of micro structured materials the refraction technique has been improved by a 3D Synchrotron Refraction Computed Tomography test station. The specimen is placed in an X-ray beam between two single crystals, which suppresses all sample scattering. In addition, an asymmetric cut second crystal can magnify the image up to 50 times revealing nano meter resolution. The technique is an alternative to other attempts on raising theX-ray refraction topography techniques are based on ultra-small angle scattering by micro-structural elements causing phase-related effects such as refraction and total reflection at a few minutes of arc as the refractive index of X-rays is nearly unity. The refraction contrast is several times higher than “true absorption” and results in images of cracks, pores and fibre debonding separations below the spatial resolution of the detector. In most cases the investigated inner surface and interface structures correlate to mechanical properties. For the exploration of micro structured materials the refraction technique has been improved by a 3D Synchrotron Refraction Computed Tomography test station. The specimen is placed in an X-ray beam between two single crystals, which suppresses all sample scattering. In addition, an asymmetric cut second crystal can magnify the image up to 50 times revealing nano meter resolution. The technique is an alternative to other attempts on raising the spatial resolution of CT machines.zeige mehrzeige weniger

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Metadaten
Autor*innen:Bernd R. MüllerORCiD, Axel Lange, Michael Harwardt, Manfred P. Hentschel, Bernhard Illerhaus, Jürgen Goebbels
Dokumenttyp:Zeitschriftenartikel
Veröffentlichungsform:Verlagsliteratur
Sprache:Englisch
Titel des übergeordneten Werkes (Englisch):Insight
Jahr der Erstveröffentlichung:2008
Verlag:British Institute of Non-Destructive Testing
Verlagsort:Northampton
Jahrgang/Band:50
Ausgabe/Heft:6
Erste Seite:316
Letzte Seite:319
Freie Schlagwörter:Aerospace; Bragg magnification; Computed Tomography (CT); Diffraction Enhanced Imaging (DEI); Lightweight materials; Metal Matrix Composites (MMC); Synchrotron radiation; X-ray refraction
DOI:10.1784/insi.2008.50.6.316
ISSN:0007-1137
Verfügbarkeit des Dokuments:Physisches Exemplar in der Bibliothek der BAM vorhanden ("Hardcopy Access")
Bibliotheksstandort:Sonderstandort: Publica-Schrank
Datum der Freischaltung:19.02.2016
Referierte Publikation:Ja
Datum der Eintragung als referierte Publikation:02.10.2008
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