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Industrial and synchrotron X-ray CT applications for materials characterisation

  • The combination of tomographic, microstructural data with other experimental techniques and with modeling is paramount, if we want to extract the maximum amount of information on material and component properties. In particular, quantitative image analysis, statistical approaches, direct discretization of tomographic reconstructions represent concrete possibilities to extend the power of the tomographic 3D representation to insights into the material and component performance. This logic thread holds equally for industrial and academic research, and valorizes expensive experiments such as those carried out at synchrotron sources, which cannot be daily repeated. We shall show a few examples of possible use of X-ray tomographic data for quantitative assessment of damage evolution and microstructural properties, as well as for non-destructive testing. We will also show how X-ray refraction computed tomography (CT) can be highly complementary to classic absorption CT, being sensitive toThe combination of tomographic, microstructural data with other experimental techniques and with modeling is paramount, if we want to extract the maximum amount of information on material and component properties. In particular, quantitative image analysis, statistical approaches, direct discretization of tomographic reconstructions represent concrete possibilities to extend the power of the tomographic 3D representation to insights into the material and component performance. This logic thread holds equally for industrial and academic research, and valorizes expensive experiments such as those carried out at synchrotron sources, which cannot be daily repeated. We shall show a few examples of possible use of X-ray tomographic data for quantitative assessment of damage evolution and microstructural properties, as well as for non-destructive testing. We will also show how X-ray refraction computed tomography (CT) can be highly complementary to classic absorption CT, being sensitive to internal interfaces.zeige mehrzeige weniger

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Autor*innen:Giovanni BrunoORCiD, Karsten Ehrig, Holger Haarring, Michael Harwardt, Manfred P. Hentschel, Bernhard Illerhaus, Andreas KupschORCiD, Axel Lange, Dietmar Meinel, Bernd R. MüllerORCiD, Yener Onel, Andreas Staude, Thomas Wolk
Dokumenttyp:Beitrag zu einem Tagungsband
Veröffentlichungsform:Verlagsliteratur
Sprache:Englisch
Titel des übergeordneten Werkes (Englisch):Conference on Industrial Computed Tomography (ICT) 2014 - Proceedings
Jahr der Erstveröffentlichung:2014
Herausgeber (Institution):FH Oberösterreich
Verlag:Shaker
Verlagsort:Aachen
Erste Seite:15
Letzte Seite:31
Freie Schlagwörter:Complex microstructure; Quantitative image analysis; Statistical analysis; X-ray absorption and refraction CT
Veranstaltung:iCT Conference 2014 - Conference on industrial computed tomography
Veranstaltungsort:Wels, Austria
Beginndatum der Veranstaltung:25.02.2014
Enddatum der Veranstaltung:28.02.2014
ISBN:978-3-8440-2557-6
Verfügbarkeit des Dokuments:Datei im Netzwerk der BAM verfügbar ("Closed Access")
Datum der Freischaltung:20.02.2016
Referierte Publikation:Nein
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