S.H. Nowak, A. Bjeoumikhov, J. Von Borany, J. Buchriegler, F. Munnik, M. Petric, A.D. Renno, Martin Radtke, Uwe Reinholz, O. Scharf, L. Strüder, R. Wedell, R. Ziegenrücker
- We present results of recent development of the color X-ray camera, type SLcam®, allowing detection of X-ray images with few microns resolution. Such spectral resolution is achieved with the use of high-quality polycapillary optics combined with sub-pixel resolution. Imaging of Siemens star resolution test chart reveals that the resolution limit of SLcam® can go down to nearly 5µm. Several real sample examples of measurements carried out at the laboratory, synchrotron, and particle-induced X-ray emission beamlines are shown. This is the first time SLcam® is used as particle-induced X-ray emission detector.