Recent developments of photon counting and energy discriminating detectors for radiographic testing
- The direct detection of X-ray photons into electrical signals is enabled by usage of highly absorbing photo conducting materials (e.g. CdTe) as detection layer of an underlying CMOS semiconductor X-ray image detector. If the read-out speed is high enough (ca. 50 – 100 ns dead time) single X-ray photons can be counted and their energy measured. Read-out noise and dark image correction can be diminished. By setting energy thresholds, selected energy ranges of the X-ray spectrum can be detected or suppressed. This allows material discrimination or reduction of scattered radiation, which results in an enhanced contrast sensitivity.
Autor*innen: | Uwe ZscherpelORCiD |
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Koautor*innen: | David Schumacher, Uwe Ewert |
Dokumenttyp: | Vortrag |
Veröffentlichungsform: | Präsentation |
Sprache: | Englisch |
Jahr der Erstveröffentlichung: | 2017 |
DDC-Klassifikation: | Naturwissenschaften und Mathematik / Chemie / Analytische Chemie |
Freie Schlagwörter: | Direct detection; Dual energy imaging; Energy discrimination; Industrial X-ray imaging; Photon counting |
Veranstaltung: | 2017 Far East Forum on Nondestructive Evaluation & Testing |
Veranstaltungsort: | Xi`an, China |
Beginndatum der Veranstaltung: | 21.06.2017 |
Enddatum der Veranstaltung: | 24.06.2017 |
Verfügbarkeit des Dokuments: | Datei im Netzwerk der BAM verfügbar ("Closed Access") |
Datum der Freischaltung: | 27.07.2017 |
Referierte Publikation: | Nein |
Eingeladener Vortrag: | Nein |