Spectroscopic analysis of packaging concepts for high-power diode laser bars
- Double-side cooled high-power diode laser bars packaged by different techniques on different types of passive heat sinks are analyzed in terms of packaging-induced strain. Reference data from standard devices being single-side cooled only and packaged by conventional soft and hard soldering are also presented. Thermal profiling across the devices complements the results. The most suitable packaging architecture and technique for double-side cooled bars is identified. Measurements of the laser emission near field and electroluminescence pattern provide direct reference to the functionality of the devices. Furthermore, a type of cross calibration of the methods used for strain analysis is made, since all techniques are applied to the same set of bars. This involves micro photoluminescence, micro Raman, and degree-of-polarization electroluminescence spectroscopy.
Autor*innen: | M. Hempel, Mathias ZieglerORCiD, S. Schwirzke-Schaaf, J.W. Tomm, D. Jankowski, D. Schröder |
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Dokumenttyp: | Zeitschriftenartikel |
Veröffentlichungsform: | Verlagsliteratur |
Sprache: | Deutsch |
Titel des übergeordneten Werkes (Deutsch): | Applied physics A |
Jahr der Erstveröffentlichung: | 2012 |
Verlag: | Springer |
Verlagsort: | Berlin |
Jahrgang/Band: | 107 |
Ausgabe/Heft: | 2 |
Erste Seite: | 371 |
Letzte Seite: | 377 |
Freie Schlagwörter: | High-power diode lasers; Non-destructive testing; Semiconductor laser; Spectroscopy; Thermography |
DOI: | 10.1007/s00339-012-6799-4 |
ISSN: | 0947-8396 |
Verfügbarkeit des Dokuments: | Physisches Exemplar in der Bibliothek der BAM vorhanden ("Hardcopy Access") |
Bibliotheksstandort: | Sonderstandort: Publica-Schrank |
Datum der Freischaltung: | 19.02.2016 |
Referierte Publikation: | Ja |
Datum der Eintragung als referierte Publikation: | 02.05.2012 |