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Digital radiology with photon counting detectors
- The progress in X-ray detector electronics (sensitivity and speed) allows meanwhile fast single photon detection by a matrix detector. Combined photon counting and energy discrimination is implemented in the electronic circuit of each detector pixel. The company XCounter developed detectors based on CdTe single crystals, which can be tiled to larger areas and have a pixel size of 100ìm. The largest area available in beginning of 2014 is 50x75 mm². These detectors have very promising properties, which make them very suitable for NDT applications: 1. A CdTe attenuation layer of 750 µm thickness allows efficient X-ray detection up to ca. 300 keV. In counting mode only photon noise is important; no other detector noise sources need to be considered. There is no Offset signal without radiation. 2. Each of the detector pixels has two energy thresholds. These can be used for dual energy imaging for materials separation. Also the suppression of scattered radiation by energy thresholding willThe progress in X-ray detector electronics (sensitivity and speed) allows meanwhile fast single photon detection by a matrix detector. Combined photon counting and energy discrimination is implemented in the electronic circuit of each detector pixel. The company XCounter developed detectors based on CdTe single crystals, which can be tiled to larger areas and have a pixel size of 100ìm. The largest area available in beginning of 2014 is 50x75 mm². These detectors have very promising properties, which make them very suitable for NDT applications: 1. A CdTe attenuation layer of 750 µm thickness allows efficient X-ray detection up to ca. 300 keV. In counting mode only photon noise is important; no other detector noise sources need to be considered. There is no Offset signal without radiation. 2. Each of the detector pixels has two energy thresholds. These can be used for dual energy imaging for materials separation. Also the suppression of scattered radiation by energy thresholding will improve the image contrast sensitivity. First experiments will be presented which demonstrate the advantages of this new detector technology over the conventional charge integrating detectors. A challenge is the development of a modified detector calibration procedure, which becomes critical at longer exposure times.…
Autor*innen: | Uwe ZscherpelORCiD, David Schumacher, Bernhard Redmer, Uwe Ewert, C. Ullberg, N. Weber, T. Pantsar |
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Dokumenttyp: | Zeitschriftenartikel |
Veröffentlichungsform: | Graue Literatur |
Sprache: | Englisch |
Titel des übergeordneten Werkes (Englisch): | The e-journal of nondestructive testing & ultrasonics |
Jahr der Erstveröffentlichung: | 2014 |
Veröffentlichende Institution: | Bundesanstalt für Materialforschung und -prüfung (BAM) |
Verlag: | NDT.net |
Verlagsort: | Kirchwald |
Jahrgang/Band: | 19 |
Ausgabe/Heft: | 12 |
Aufsatznummer: | 16709 |
Erste Seite: | 1 |
Letzte Seite: | 8 |
DDC-Klassifikation: | Naturwissenschaften und Mathematik / Chemie / Analytische Chemie |
Freie Schlagwörter: | Calibration; Detectors; Digital detector array; Digital radiology; Dual-energy; Energy discrimination; Image quality; Materials characterization; Photo counting; Radiographic testing (RT) |
Veranstaltung: | ECNDT 2014 - 11th European conference on non-destructive testing |
Veranstaltungsort: | Prague, Czech Republic |
Beginndatum der Veranstaltung: | 06.10.2014 |
Enddatum der Veranstaltung: | 10.10.2014 |
URN: | urn:nbn:de:kobv:b43-323063 |
URL: | https://www.ndt.net/?id=16709 |
ISSN: | 1435-4934 |
Bemerkung: | Geburtsname von Schumacher, David: Walter, D. - Birth name of Schumacher, David: Walter, D. |
Verfügbarkeit des Dokuments: | Datei für die Öffentlichkeit verfügbar ("Open Access") |
Lizenz (Deutsch): | Creative Commons - Namensnennung-Keine Bearbeitung |
Datum der Freischaltung: | 20.02.2016 |
Referierte Publikation: | Ja |
Datum der Eintragung als referierte Publikation: | 18.12.2014 |
Schriftenreihen ohne Nummerierung: | Wissenschaftliche Artikel der BAM |