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Quantification of sulphur in copper metals by isotope dilution LA-ICP-MS using polyethylene frits

  • Sulphur is one of the relevant impurities in copper and its alloys affecting their material properties. To ensure the quality of copper products, fast direct solid sampling techniques are very attractive. However, for the calibration suitable matrix reference materials are required. For the certification of such reference materials appropriate, SI-traceable analytical methods are essential. Therefore, a procedure was developed to quantify total sulphur in copper by combining the classical isotope dilution (ID) technique and laser ablation inductively coupled plasma mass spectrometry (LA-ICP-MS). Here, for the first time, polyethylene (PE) frits were used to prepare appropriate solid samples for the sulphur quantification in copper metals (alloyed/unalloyed) by isotope dilution LA-ICP-MS. The properties of the PE frit meet the requirements as porous material with high absorption efficiency, thermal and chemical resistance as well as low sulphur blank. Different copper referenceSulphur is one of the relevant impurities in copper and its alloys affecting their material properties. To ensure the quality of copper products, fast direct solid sampling techniques are very attractive. However, for the calibration suitable matrix reference materials are required. For the certification of such reference materials appropriate, SI-traceable analytical methods are essential. Therefore, a procedure was developed to quantify total sulphur in copper by combining the classical isotope dilution (ID) technique and laser ablation inductively coupled plasma mass spectrometry (LA-ICP-MS). Here, for the first time, polyethylene (PE) frits were used to prepare appropriate solid samples for the sulphur quantification in copper metals (alloyed/unalloyed) by isotope dilution LA-ICP-MS. The properties of the PE frit meet the requirements as porous material with high absorption efficiency, thermal and chemical resistance as well as low sulphur blank. Different copper reference materials were used to develop and validate the procedure. The copper samples were spiked with 34S, digested with nitric acid and then the digests were absorbed on PE frits. After drying, the frits were analysed by LA-ICP-IDMS using a Nd:YAG laser at 213 nm coupled to an ICP sector field mass spectrometer. It could be demonstrated, that the sample solution dispersed on the frits did not influence the 32S/34S ratio significantly even though the sulphur intensities were fluctuating along the scanned lines. Relative standard deviations of the isotope ratios were below 5 % in average between three line scans (except for the pure spike solution and procedure blank). The measurement results were validated by comparing them with the results obtained by conventional ICP-IDMS after analyte-matrix separation. Plotting the mass fraction of sulphur in copper obtained by LA-ICP-IDMS versus those obtained by ICP-IDMS yields a linear curve with a correlation coefficient of 0.9999 showing a strong agreement between both techniques. The metrological traceability to the SI from the kg down to the sulphur mass fraction in copper is established by an unbroken chain of comparisons, each accompanied by an uncertainty budget. Thus, the measurement results are considered reliable, acceptable and comparable within the stated measurement uncertainty.zeige mehrzeige weniger

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Metadaten
Autor*innen:Heike Traub, Pranee Phukphatthanachai
Koautor*innen:Jochen Vogl, Norbert Jakubowski, Ulrich Panne
Dokumenttyp:Posterpräsentation
Veröffentlichungsform:Präsentation
Sprache:Englisch
Jahr der Erstveröffentlichung:2018
Organisationseinheit der BAM:1 Analytische Chemie; Referenzmaterialien
1 Analytische Chemie; Referenzmaterialien / 1.1 Anorganische Spurenanalytik
P Präsident
P Präsident / P.0 Präsident und andere
DDC-Klassifikation:Naturwissenschaften und Mathematik / Chemie / Analytische Chemie
Freie Schlagwörter:Copper; ICP-MS; Isotope dilution; Laser ablation
Themenfelder/Aktivitätsfelder der BAM:Chemie und Prozesstechnik
Chemie und Prozesstechnik / Chemische Charakterisierung und Spurenanalytik
Veranstaltung:14th European Workshop on Laser Ablation (EWLA)
Veranstaltungsort:Pau, France
Beginndatum der Veranstaltung:26.06.2018
Enddatum der Veranstaltung:29.06.2018
Verfügbarkeit des Dokuments:Datei im Netzwerk der BAM verfügbar ("Closed Access")
Datum der Freischaltung:25.07.2018
Referierte Publikation:Nein
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