Impurities in multicrystalline silicon wafers for solar cells detected by synchrotron micro-beam X-ray fluorescence analysis
- We report on the trace analysis of copper and iron impurities in multicrystalline silicon wafers with the microbeam X-ray fluorescence (µ-XRF) technique. The efficiency of solar cells, which are based on multicrystalline silicon wafers, is strongly influenced by minor contamination with metals such as copper and iron. Application of compound refractive lenses (CRLs) in µ-XRF allows versatile two-dimensional mapping of relevant contaminations and localization of their sites of deposition. In this context, the measured bulk average limit of detection (LOD) was one picogram of iron and copper per gram of silicon. We suggest that µ-XRF is a valuable tool for non-destructive spatial (3D) quantification of metal impurities in a wide range of materials and devices whose functioning could be critically affected by impurities.
Autor*innen: | Günter Buzanich, Martin RadtkeORCiD, Uwe Reinholz, Heinrich Riesemeier, Andreas ThünemannORCiD, C. Streli |
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Dokumenttyp: | Zeitschriftenartikel |
Veröffentlichungsform: | Verlagsliteratur |
Sprache: | Englisch |
Titel des übergeordneten Werkes (Englisch): | Journal of analytical atomic spectrometry |
Jahr der Erstveröffentlichung: | 2012 |
Verlag: | Royal Society of Chemistry |
Verlagsort: | London |
Jahrgang/Band: | 27 |
Ausgabe/Heft: | 11 |
Erste Seite: | 1875 |
Letzte Seite: | 1881 |
Freie Schlagwörter: | Compound refractive lens; Silicon impurities; Solar cell; X-ray micro beam |
DOI: | 10.1039/c2ja30188a |
ISSN: | 0267-9477 |
ISSN: | 1364-5544 |
Verfügbarkeit des Dokuments: | Physisches Exemplar in der Bibliothek der BAM vorhanden ("Hardcopy Access") |
Bibliotheksstandort: | Sonderstandort: Publica-Schrank |
Datum der Freischaltung: | 19.02.2016 |
Referierte Publikation: | Ja |
Datum der Eintragung als referierte Publikation: | 25.10.2012 |