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Straightforward correction of X-ray detector backlighting

  • A novel approach to strongly suppress artifacts in radiography and computed tomography caused by the effect of diffuse background signals ('backlighting') of 2D X-ray detectors is suggested. Depending on the detector geometry the mechanism may be different, either based on the optical scattering of the fluorescent screen materials into optical detection devices or Compton or X-ray fluorescence scattering by the detector components. Consequently, these erroneous intensity portions result in locally different violations of Lambert Beer’s law in single projections (radiographs) as function of the detector area coverage and the magnitude of the attenuation. The absorption of multiple metal sheets is investigated by monochromatic synchrotron radiation, thus excluding beam hardening. The proposed correction procedure simply requires the individual subtraction of one and the same fraction of the primary and transmitted mean intensity, as a constant (non-local) scattering mechanismA novel approach to strongly suppress artifacts in radiography and computed tomography caused by the effect of diffuse background signals ('backlighting') of 2D X-ray detectors is suggested. Depending on the detector geometry the mechanism may be different, either based on the optical scattering of the fluorescent screen materials into optical detection devices or Compton or X-ray fluorescence scattering by the detector components. Consequently, these erroneous intensity portions result in locally different violations of Lambert Beer’s law in single projections (radiographs) as function of the detector area coverage and the magnitude of the attenuation. The absorption of multiple metal sheets is investigated by monochromatic synchrotron radiation, thus excluding beam hardening. The proposed correction procedure simply requires the individual subtraction of one and the same fraction of the primary and transmitted mean intensity, as a constant (non-local) scattering mechanism is assumed.zeige mehrzeige weniger

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Metadaten
Autor*innen:Axel Lange, Andreas KupschORCiD, Manfred P. Hentschel, Bernd R. MüllerORCiD
Dokumenttyp:Beitrag zu einem Tagungsband
Veröffentlichungsform:Verlagsliteratur
Sprache:Englisch
Titel des übergeordneten Werkes (Englisch):18th WCNDT - World conference on nondestructive testing (Proceedings)
Jahr der Erstveröffentlichung:2012
Erste Seite:1
Letzte Seite:8(?)
Freie Schlagwörter:Computed tomography; Diffuse background; Fluorescent screen; Radiography; X-ray detector backlighting
Veranstaltung:18th WCNDT - World conference on nondestructive testing
Veranstaltungsort:Durban, South Africa
Beginndatum der Veranstaltung:2012-04-16
Enddatum der Veranstaltung:2012-04-20
URL:http://www.ndt.net/article/wcndt2012/papers/205_wcndtfinal00205.pdf
ISBN:978-0-620-52872-6
Verfügbarkeit des Dokuments:Physisches Exemplar in der Bibliothek der BAM vorhanden ("Hardcopy Access")
Bibliotheksstandort:Sonderstandort: Publica-Schrank
Datum der Freischaltung:19.02.2016
Referierte Publikation:Nein
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