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Time- and lateral-resolved X-ray absorption fine structure spectroscopy

  • X-ray absorption fine structure (XAFS) spectroscopy is a powerful and widely used tool for material characterization. It is non-destructive, element-sensitive and requires no long-range order of the sample, making it suitable for the investigation of amorphous phases. XAFS includes the X-ray absorption near edge structure (XANES) and the extended X-ray absorption fine structure (EXAFS), providing information about the electronical state of the absorbing atom and the spatial order of the neighboring atoms respectively. Our new approach presented here is derived from the classical dispersive XAFS setup. The aim is to have a scanningless, stable and reproducible setup for applications, in which dynamic processes occur in the second time scale. A broad polychromatic beam passes through the sample and is dispersed afterwards by a convexly bent Si (111) crystal. All energies are reflected under different angles and thus spatially separated, allowing a position sensitive detector toX-ray absorption fine structure (XAFS) spectroscopy is a powerful and widely used tool for material characterization. It is non-destructive, element-sensitive and requires no long-range order of the sample, making it suitable for the investigation of amorphous phases. XAFS includes the X-ray absorption near edge structure (XANES) and the extended X-ray absorption fine structure (EXAFS), providing information about the electronical state of the absorbing atom and the spatial order of the neighboring atoms respectively. Our new approach presented here is derived from the classical dispersive XAFS setup. The aim is to have a scanningless, stable and reproducible setup for applications, in which dynamic processes occur in the second time scale. A broad polychromatic beam passes through the sample and is dispersed afterwards by a convexly bent Si (111) crystal. All energies are reflected under different angles and thus spatially separated, allowing a position sensitive detector to record a spectrum over the energy range of the incoming beam in a single shot. Tests of this setup were performed at the BAMline @ BESSY-II (Berlin, Germany) with different metal foils. First in situ measurements comprised the investigation of the early stages of the zinc(II)2-methylimidazolate (ZIF-8) crystallization. This topic of metal-organic-frameworks (MOF) research is of interest for medical applications. Structural changes with a time resolution of 1 s could be followed. The second dimension of the broad beam can be used for a lateral resolution.zeige mehrzeige weniger

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Metadaten
Autoren/innen:Anicó Kulow
Koautoren/innen:S. Witte, S. Beyer, C. Streli, Martin Radtke, Uwe Reinholz, Heinrich Riesemeier, Ana Guilherme Buzanich
Dokumenttyp:Vortrag
Veröffentlichungsform:Präsentation
Sprache:Englisch
Jahr der Erstveröffentlichung:2019
Organisationseinheit der BAM:1 Analytische Chemie; Referenzmaterialien
1 Analytische Chemie; Referenzmaterialien / 1.3 Strukturanalytik
DDC-Klassifikation:Naturwissenschaften und Mathematik / Chemie / Analytische Chemie
Freie Schlagwörter:Synchrotron based methods; X-ray absorption fine structure; X-ray spectroscopy
Themenfelder/Aktivitätsfelder der BAM:Analytical Sciences
Analytical Sciences / Zerstörungsfreie Prüfung und Spektroskopie
Veranstaltung:ANAKON 2019
Veranstaltungsort:Münster, Germany
Beginndatum der Veranstaltung:25.03.2019
Enddatum der Veranstaltung:28.03.2019
Verfügbarkeit des Volltexts:Volltext-PDF im Netzwerk der BAM verfügbar ("Closed Access")
Datum der Freischaltung:29.03.2019
Referierte Publikation:Nein