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Sputtering of Liquid Surfaces -Emission of Molecular Secondary Ions from Ionic Liquids

  • Static secondary ion mass spectrometry (SIMS) has become a major analytical technique for the analysis of solid surfaces. In the last years it has also been used for the analysis of liquid/frozen surfaces from ionic liquids1-5. However, the mechanism for the emission of secondary ions has not been investigated so far, especially for the state of the art liquid metal ion guns (LMIG), such as the Bi or the BiMn LMIGs. These sources are not only able to provide monoatomic primary ions, but also singly and doubly charged polyatomic primary ion cluster. This new development has led to the investigation of the primary ion particle to specific parameters in order to determine the capabilities of such LMIGs on different target samples. To further the principle understanding of secondary ion emission, a systematic study using Bi1-7+ and Bi1,3,5,7++ primary ions on ionic liquids with considerably different strength of inter-ionic interactions was performed. As model samples the ionic liquidsStatic secondary ion mass spectrometry (SIMS) has become a major analytical technique for the analysis of solid surfaces. In the last years it has also been used for the analysis of liquid/frozen surfaces from ionic liquids1-5. However, the mechanism for the emission of secondary ions has not been investigated so far, especially for the state of the art liquid metal ion guns (LMIG), such as the Bi or the BiMn LMIGs. These sources are not only able to provide monoatomic primary ions, but also singly and doubly charged polyatomic primary ion cluster. This new development has led to the investigation of the primary ion particle to specific parameters in order to determine the capabilities of such LMIGs on different target samples. To further the principle understanding of secondary ion emission, a systematic study using Bi1-7+ and Bi1,3,5,7++ primary ions on ionic liquids with considerably different strength of inter-ionic interactions was performed. As model samples the ionic liquids 1-butyl-3-methylimidazolium acetate and 1-butyl-3-methylimidazolium hexafluorophosphate ([C4C1im][Ac] and [C4C1im][PF6]) were used. To compare spectra or the performance of primary ion particles on substances or substance classes, the SIMS data were evaluated by calculating secondary ion yields, static SIMS limit, disappearing cross section, ion formation efficiency and fragmentation.zeige mehrzeige weniger

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  • 2012-09-09 Sputtering of Liquid Surfaces-Emission of Molecular Secondary Ions from Ionic Liquids.pdf
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Metadaten
Autor*innen:Markus Holzweber
Koautor*innen:Wolfgang Unger, H. Hutter
Dokumenttyp:Vortrag
Veröffentlichungsform:Präsentation
Sprache:Deutsch
Titel des übergeordneten Werkes (Deutsch):SIMS Europe
Jahr der Erstveröffentlichung:2012
Veranstaltung:SIMS Europe
Veranstaltungsort:Münster, Germany
Beginndatum der Veranstaltung:2012-09-09
Enddatum der Veranstaltung:2012-09-12
Verfügbarkeit des Dokuments:Datei im Netzwerk der BAM verfügbar ("Closed Access")
Datum der Freischaltung:20.02.2016
Referierte Publikation:Nein
Eingeladener Vortrag:Nein
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