Das Suchergebnis hat sich seit Ihrer Suchanfrage verändert. Eventuell werden Dokumente in anderer Reihenfolge angezeigt.
  • Treffer 4 von 5
Zurück zur Trefferliste

Integrated topographic SEM imaging for software assisted fractography

  • The aim of a fractographic investigation is the evaluation of macroscopic and microscopic fracture surface characteristics and, as a result, the determination of the fracture mechanism of a component from a failure case. The basis for such evaluations of fracture characteristics comes from actual comparative mechanical testing and from the literature. A fractographic analysis can be very complex and, in any case, requires considerable experience. Machine learning methods enables the quantitative determination of fracture characteristics and fracture mechanisms utilizing digitized expert knowledge [1]. Although the application of SE images provides promising results, additional information is required to obtain reliable solutions. As expected, BSE and 3D information helps to improve the classification (Fig. 1). But only a fast, widely integrated, and automated topography measurement can provide the required amount of referenced surface data for the application of machine learningThe aim of a fractographic investigation is the evaluation of macroscopic and microscopic fracture surface characteristics and, as a result, the determination of the fracture mechanism of a component from a failure case. The basis for such evaluations of fracture characteristics comes from actual comparative mechanical testing and from the literature. A fractographic analysis can be very complex and, in any case, requires considerable experience. Machine learning methods enables the quantitative determination of fracture characteristics and fracture mechanisms utilizing digitized expert knowledge [1]. Although the application of SE images provides promising results, additional information is required to obtain reliable solutions. As expected, BSE and 3D information helps to improve the classification (Fig. 1). But only a fast, widely integrated, and automated topography measurement can provide the required amount of referenced surface data for the application of machine learning methods. To fulfil these requirements, topographical data are obtained from a BSE detector with four symmetric segments (4Q-BSE) using shape-from-shading technology [2]. Surface height calculation is performed live during image acquisition and provides immediate feedback in three dimensions. All available signals (SE, BSE and more if applicable) are recorded simultaneously together with the surface topography and stored in a multichannel data file. This guaranties the same geometrical reference for all data, which is required for further analysis (Fig. 2). When applying machine learning methods to topographic data together with SEM images, topographic information must be provided as depth image. Consequently, a unique height scale is required for all applied data with different magnifications. This requires a calibrated height measurement, which is ensured with the integrated 3D calibration of the topographic acquisition and a dedicated calibration sample. Thus, a large number of data sets from different fracture samples was generated and used as training data for machine learning.zeige mehrzeige weniger

Volltext Dateien herunterladen

  • MCM16_Hemmleb_IM1-O-2679.pdf
    eng

Metadaten exportieren

Weitere Dienste

Teilen auf Twitter Suche bei Google Scholar Anzahl der Zugriffe auf dieses Dokument
Metadaten
Autor*innen:M. Hemmleb
Koautor*innen:Dirk Bettge, Lennart Schmies, U. Sonntag, B. Botsch
Dokumenttyp:Vortrag
Veröffentlichungsform:Präsentation
Sprache:Englisch
Jahr der Erstveröffentlichung:2022
Organisationseinheit der BAM:5 Werkstofftechnik
5 Werkstofftechnik / 5.1 Mikrostruktur Design und Degradation
DDC-Klassifikation:Technik, Medizin, angewandte Wissenschaften / Ingenieurwissenschaften / Ingenieurwissenschaften und zugeordnete Tätigkeiten
Freie Schlagwörter:Fractography; Machine Learning; Topography
Themenfelder/Aktivitätsfelder der BAM:Material
Veranstaltung:16th Multinational Congress on Microscopy
Veranstaltungsort:Brno, Czech Republic
Beginndatum der Veranstaltung:04.09.2022
Verfügbarkeit des Dokuments:Datei im Netzwerk der BAM verfügbar ("Closed Access")
Datum der Freischaltung:10.10.2022
Referierte Publikation:Nein
Eingeladener Vortrag:Nein
Einverstanden
Diese Webseite verwendet technisch erforderliche Session-Cookies. Durch die weitere Nutzung der Webseite stimmen Sie diesem zu. Unsere Datenschutzerklärung finden Sie hier.