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Progress survey of X-Ray refraction imaging techniques

  • The most substantial innovations in radiographic imaging techniques of the last two decades aim at enhanced image contrast of weakly absorbing micro and nano structures by taking advantage of X-ray refraction effects occurring at outer and inner surfaces. The applications range from fibre reinforced plastics to biological tissues. These techniques comprise, among others, X-ray refraction topography, diffraction enhanced imaging, phase contrast imaging, Talbot-Lau grating interferometry, and refraction enhanced imaging. They all make use of selective beam deflections up to a few minutes of arc: the X-ray refraction effect. In contrast to diffraction, this type of interaction has a 100 % scattering cross section, as shown experimentally. Since X-ray refraction is very sensitive to the orientation of interfaces, it is additionally a tool to detect, e.g., fibre or pore orientation. If the detector resolution exceeds the size of (small) individual features, one detects the integralThe most substantial innovations in radiographic imaging techniques of the last two decades aim at enhanced image contrast of weakly absorbing micro and nano structures by taking advantage of X-ray refraction effects occurring at outer and inner surfaces. The applications range from fibre reinforced plastics to biological tissues. These techniques comprise, among others, X-ray refraction topography, diffraction enhanced imaging, phase contrast imaging, Talbot-Lau grating interferometry, and refraction enhanced imaging. They all make use of selective beam deflections up to a few minutes of arc: the X-ray refraction effect. In contrast to diffraction, this type of interaction has a 100 % scattering cross section, as shown experimentally. Since X-ray refraction is very sensitive to the orientation of interfaces, it is additionally a tool to detect, e.g., fibre or pore orientation. If the detector resolution exceeds the size of (small) individual features, one detects the integral information (of inner surfaces) within the gauge volume. We describe the above-mentioned techniques, and show their experimental implementation in the lab and at a synchrotron source. We also show strategies for data processing and quantitative analysis.zeige mehrzeige weniger

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Metadaten
Autoren/innen:Andreas Kupsch, Bernd R. Müller, M. P. Hentschel, A. Lange, Volker Trappe, René Laquai, Yury Shashev, Sergei Evsevleev, Giovanni Bruno
Dokumenttyp:Beitrag zu einem Tagungsband
Veröffentlichungsform:Graue Literatur
Sprache:Englisch
Titel des übergeordneten Werkes (Englisch):DGZfP-Proceedings
Jahr der Erstveröffentlichung:2016
Organisationseinheit der BAM:8 Zerstörungsfreie Prüfung
8 Zerstörungsfreie Prüfung / 8.5 Mikro-ZfP
Veröffentlichende Institution:Bundesanstalt für Materialforschung und -prüfung (BAM)
Jahrgang/Band:2016/158
Erste Seite:We.3.B.2, 1
Letzte Seite:9
DDC-Klassifikation:Technik, Medizin, angewandte Wissenschaften / Ingenieurwissenschaften / Ingenieurwissenschaften und zugeordnete Tätigkeiten
Freie Schlagwörter:X-ray; grating; refraction; topography
Themenfelder/Aktivitätsfelder der BAM:Material
Veranstaltung:19th World Conference on Non-Destructive Testing
Veranstaltungsort:Munich, Germany
Beginndatum der Veranstaltung:13.06.2016
Enddatum der Veranstaltung:17.06.2016
URN:urn:nbn:de:kobv:b43-366194
ISBN:978-3-940283-78-8
Verfügbarkeit des Volltexts:Volltext-PDF für die Öffentlichkeit verfügbar ("Open Access")
Lizenz (Deutsch):License LogoCreative Commons - Namensnennung-Keine Bearbeitung
Datum der Freischaltung:23.06.2016
Referierte Publikation:Nein
Schriftenreihen ohne Nummerierung:Wissenschaftliche Artikel der BAM