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VDI/VDE Standardization Activities of DIC Measurement Techniques

  • With more than 180.000 engineers and scientists VDI Association of German Engineers and VDE Association for Electrical, Electronic & Information Technologies are belonging to the major technical and scientific associations in Europe. Both organizations promote the advancement of technology and among other things by developing recognized technical regulations as national and international standards. Since 2011 Technical Committee 2.15 Optical Measuring Methods for Structure Analysis and Monitoring as a common committee of both organizations is working among other things on the development of standards for optical measuring and testing methods. The committee consists of 27 members representing industrial users, system manufacturers, research institutes and universities. Currently the committee is drafting the new standard VDI/VDE 2626 Part 1 - Optical measuring procedures – Image correlation methods – Basics and equipment, which will be introduced in this presentation. Draft VDI/VDEWith more than 180.000 engineers and scientists VDI Association of German Engineers and VDE Association for Electrical, Electronic & Information Technologies are belonging to the major technical and scientific associations in Europe. Both organizations promote the advancement of technology and among other things by developing recognized technical regulations as national and international standards. Since 2011 Technical Committee 2.15 Optical Measuring Methods for Structure Analysis and Monitoring as a common committee of both organizations is working among other things on the development of standards for optical measuring and testing methods. The committee consists of 27 members representing industrial users, system manufacturers, research institutes and universities. Currently the committee is drafting the new standard VDI/VDE 2626 Part 1 - Optical measuring procedures – Image correlation methods – Basics and equipment, which will be introduced in this presentation. Draft VDI/VDE 2626 Part 1 describes practical acceptance and reverification procedures for the evaluation of the accuracy of optical measuring systems based on digital image correlation (DIC) methods. The document applies to DIC measurement systems used a) for full-field determination of two- or three-dimensional displacement of surfaces, and b) for full-field determination of the elongation or strain of surfaces. The standard describes quality parameters as well as methods and reference objects for their determination. The quality parameters serve to specify DIC systems, and to compare different systems. They are equally suitable a) for acceptance tests as well as b) for reverification of DIC systems within the framework of a quality management system. The acceptance test is used to determine whether the DIC system complies with the quality parameter limits specified by the manufacturer, or with contractually agreed limits by the manufacturer and user, respectively. For this test the quality parameters zero-displacement error, zero-strain error, and displacement error are defined and used. Zero-displacement error and zero-strain error describe minimum measurement uncertainties of the DIC system a user has to reckon with. They are influenced by different uncertainty contributions. The quality parameter displacement error is used to check the ability of the DIC system to determine absolute displacements within the measurement volume and to confirm the traceability of this measurement to the SI system. Reverification of DIC systems serves to ensure long-term compliance with specified limits for the quality parameters. By comparing the results of successive reverification measurements of the quality parameters used for the acceptance test, it is possible to analyze trends with respect to changes in DIC system characteristics.zeige mehrzeige weniger

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Metadaten
Autoren/innen:Werner Daum
Koautoren/innen:Klaus-Peter Gründer
Dokumenttyp:Vortrag
Veröffentlichungsform:Präsentation
Sprache:Englisch
Jahr der Erstveröffentlichung:2017
Organisationseinheit der BAM:8 Zerstörungsfreie Prüfung
8 Zerstörungsfreie Prüfung / 8.1 Sensorik, mess- und prüftechnische Verfahren
DDC-Klassifikation:Naturwissenschaften und Mathematik / Chemie / Analytische Chemie
Freie Schlagwörter:Digital image correlation; Standardization
Themenfelder/Aktivitätsfelder der BAM:Analytical Sciences
Analytical Sciences / Sensorik
Veranstaltung:Annual International DIC Society Conference 2017
Veranstaltungsort:Barcelona, Spain
Beginndatum der Veranstaltung:06.11.2017
Enddatum der Veranstaltung:09.11.2017
Verfügbarkeit des Dokuments:Datei im Netzwerk der BAM verfügbar ("Closed Access")
Datum der Freischaltung:11.12.2017
Referierte Publikation:Nein