Nanomechanical properties of polymer thin films measured by force-distance curves
- Forcedisplacement curves have been acquired with a commercial atomic force microscope on thin films of poly(n-butyl methacrylate) on glass substrates. Different film thicknesses, from 10 up to 430 nm, were chosen to examine in detail the so called mechanical double-layer topic, i.e., the influence of the substrate on the determination of the mechanical properties of thin films. Taking advantage of the Hertz theory we calculated for all films the contact radius between tip and sample as a function of the applied load. Further Young's modulus of the samples was derived from the experimental data as a function of the applied load and, alternatively, of the deformation. The results of this analysis for 10 different film thicknesses were fitted with several half empirical equations proposed by several researchers. The focus of this work is to evaluate such existing half empirical theories for mechanical double-layers and to show the need for an alternative consistent approach.
Autor*innen: | Brunero CappellaORCiD, Dorothee SilbernaglORCiD |
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Dokumenttyp: | Zeitschriftenartikel |
Veröffentlichungsform: | Verlagsliteratur |
Sprache: | Englisch |
Titel des übergeordneten Werkes (Englisch): | Thin solid films |
Jahr der Erstveröffentlichung: | 2008 |
Verlag: | Elsevier |
Verlagsort: | Amsterdam |
Jahrgang/Band: | 516 |
Ausgabe/Heft: | 8 |
Erste Seite: | 1952 |
Letzte Seite: | 1960 |
Freie Schlagwörter: | Atomic force microscopy; Indentation; Polymer thin films; Young´s modulus |
DOI: | 10.1016/j.tsf.2007.09.042 |
ISSN: | 0040-6090 |
Verfügbarkeit des Dokuments: | Physisches Exemplar in der Bibliothek der BAM vorhanden ("Hardcopy Access") |
Bibliotheksstandort: | Sonderstandort: Publica-Schrank |
Datum der Freischaltung: | 19.02.2016 |
Referierte Publikation: | Ja |
Datum der Eintragung als referierte Publikation: | 04.09.2008 |