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Quantitative estimate of fs-laser induced refractive index changes in the bulk of various transparent materials

  • Over the past years, many applications based on laser-induced refractive index changes in the volume of transparent materials have been demonstrated. Ultrashort pulse lasers offer the possibility to process bulky transparent materials in three dimensions, suggesting that direct laser writing will play a decisive role in the development of integrated micro-optics. At the present time, applications such as 3D long term data storage or embedded laser marking are already into the phase of industrial development. However, a quantitative estimate of the laser-induced refractive index change is still very challenging to obtain. On another hand, several microscopy techniques have been recently developed to characterize bulk refractive index changes in-situ. They have been mostly applied to biological purposes. Among those, spatial light interference microscopy (SLIM), offers a very good robustness with minimal post acquisition data processing. In this paper, we report on using SLIM to measureOver the past years, many applications based on laser-induced refractive index changes in the volume of transparent materials have been demonstrated. Ultrashort pulse lasers offer the possibility to process bulky transparent materials in three dimensions, suggesting that direct laser writing will play a decisive role in the development of integrated micro-optics. At the present time, applications such as 3D long term data storage or embedded laser marking are already into the phase of industrial development. However, a quantitative estimate of the laser-induced refractive index change is still very challenging to obtain. On another hand, several microscopy techniques have been recently developed to characterize bulk refractive index changes in-situ. They have been mostly applied to biological purposes. Among those, spatial light interference microscopy (SLIM), offers a very good robustness with minimal post acquisition data processing. In this paper, we report on using SLIM to measure fs-laser induced refractive index changes in different common glassy materials, such as fused silica and borofloat glass (B33). The advantages of SLIM over classical phase-contrast microscopy are discussed.zeige mehrzeige weniger

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Metadaten
Autoren/innen:A. Mermillod-Blondin, T. Seuthe, M. Eberstein, M. Grehn, Jörn Bonse, A. Rosenfeld
Persönliche Herausgeber/innen:C. Gorecki, A. K. Asundi, W. Osten
Dokumenttyp:Beitrag zu einem Tagungsband
Veröffentlichungsform:Graue Literatur
Sprache:Englisch
Titel des übergeordneten Werkes (Englisch):Optical Micro- and Nanometrology V (Proceedings of SPIE)
Jahr der Erstveröffentlichung:2014
Organisationseinheit der BAM:6 Materialschutz und Oberflächentechnik
6 Materialschutz und Oberflächentechnik / 6.4 Technologien mit Nanowerkstoffen
Herausgeber (Institution):The international society for optics and photonics (SPIE)
Jahrgang/Band:9132
Erste Seite:Artikel 91320X, 1
Letzte Seite:6
Freie Schlagwörter:Laser material processing; Nanometrology; Quantitative phase-contrast microscopy; Spatial light interference microscopy
Veranstaltung:Optical Micro- and Nanometrology V
Veranstaltungsort:Brussels, Belgium
Beginndatum der Veranstaltung:14.04.2014
Enddatum der Veranstaltung:14.04.2014
DOI:https://doi.org/10.1117/12.2051590
Verfügbarkeit des Dokuments:Datei im Netzwerk der BAM verfügbar ("Closed Access")
Datum der Freischaltung:20.02.2016
Referierte Publikation:Nein