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Absolute spectroscopic characterization of the optical properties of semiconductor and upconversion nanocrystals in the vis and IR

  • Nanocrystalline fluorophores like semiconductor quantum dots and rods and recently also lanthanide-based upconversion phosphors with emission in the visible (vis), near-infrared (NIR), and IR (infrared) region are increasingly being used in bioimaging studies and fluorescence assays as well as in photovoltaics and solid state lighting. The assessment and comparison of material performance as well as the development of rational design strategies for improved systems require spectroscopic tools, which enable the determination of the signal-relevant optical properties like photoluminescence quantum yields and brightness values. In the case of nonlinear fluorescence as shown by upconversion materials, such measurements must be also performed as function of excitation power density. In this work, we report on methods for the absolute determination of the photoluminescence quantum yield and brightness of fluorescent particles in dispersion and as powders based on integrating sphereNanocrystalline fluorophores like semiconductor quantum dots and rods and recently also lanthanide-based upconversion phosphors with emission in the visible (vis), near-infrared (NIR), and IR (infrared) region are increasingly being used in bioimaging studies and fluorescence assays as well as in photovoltaics and solid state lighting. The assessment and comparison of material performance as well as the development of rational design strategies for improved systems require spectroscopic tools, which enable the determination of the signal-relevant optical properties like photoluminescence quantum yields and brightness values. In the case of nonlinear fluorescence as shown by upconversion materials, such measurements must be also performed as function of excitation power density. In this work, we report on methods for the absolute determination of the photoluminescence quantum yield and brightness of fluorescent particles in dispersion and as powders based on integrating sphere spectroscopy and underline the importance of such measurements for the understanding of the photophysics of such nanocrystals.zeige mehrzeige weniger

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  • UR_Spectroscopic Characterization of NIR-IR Emissive Particles_0609_2016.pdf
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Metadaten
Autor*innen:Ute Resch-GengerORCiD
Koautor*innen:Christian Würth, Soheil Hatami, S. Leubner, N. Gaponik, A. Eychmüller
Dokumenttyp:Vortrag
Veröffentlichungsform:Präsentation
Sprache:Englisch
Jahr der Erstveröffentlichung:2016
DDC-Klassifikation:Technik, Medizin, angewandte Wissenschaften / Ingenieurwissenschaften / Ingenieurwissenschaften und zugeordnete Tätigkeiten
Freie Schlagwörter:Fluorescence; Fluorescence quantum yield; Integrating sphere spectroscopy; Method; NIR; Nanoparticle; Semiconductor quantum dot; Upconversion nanocrystal
Veranstaltung:International Conference on Fundamental Processes in Semiconductor Nanocrystals (FQDots16)
Veranstaltungsort:Berlin, Germany
Beginndatum der Veranstaltung:05.09.2016
Enddatum der Veranstaltung:06.09.2016
Verfügbarkeit des Dokuments:Datei im Netzwerk der BAM verfügbar ("Closed Access")
Datum der Freischaltung:15.12.2016
Referierte Publikation:Nein
Eingeladener Vortrag:Nein
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