Auger electron spectroscopy
- An introduction in the application of Auger Electron Spectroscopy to surface chemical analysis of nanoparticles is given. Auger Electron Spectroscopy is a mature method in the field of surface chemical analysis. The chapter addresses the physical basis of the method, the principal design of recent instruments together with modes of operation and options for the presentation of spectra, as well as different approaches for qualitative (including identification of chemical species) and quantitative surface analysis of elements. An application paragraph on surface chemical analysis of nanoparticles by AES or SAM introduces the different measurement approaches and sample preparation strategies applied by analysts. The analysis of nanoparticle ensembles, the so-called selected point analysis where a narrow primary electron beam is centered on an individual nanoparticle, and chemical mapping of individual nanoparticles (or a line scan across) are addressed. Existing literature is reviewed andAn introduction in the application of Auger Electron Spectroscopy to surface chemical analysis of nanoparticles is given. Auger Electron Spectroscopy is a mature method in the field of surface chemical analysis. The chapter addresses the physical basis of the method, the principal design of recent instruments together with modes of operation and options for the presentation of spectra, as well as different approaches for qualitative (including identification of chemical species) and quantitative surface analysis of elements. An application paragraph on surface chemical analysis of nanoparticles by AES or SAM introduces the different measurement approaches and sample preparation strategies applied by analysts. The analysis of nanoparticle ensembles, the so-called selected point analysis where a narrow primary electron beam is centered on an individual nanoparticle, and chemical mapping of individual nanoparticles (or a line scan across) are addressed. Existing literature is reviewed and informative case studies presented. Limitations and pitfalls in the application of AES in surface chemical analysis of nanoparticles are also addressed.…
Autor*innen: | Wolfgang UngerORCiD, Thomas Wirth, Vasile-Dan HodoroabaORCiD |
---|---|
Persönliche Herausgeber*innen: | Vasile-Dan HodoroabaORCiD, Wolfgang UngerORCiD, A. G. Shard |
Dokumenttyp: | Beitrag zu einem Sammelband |
Veröffentlichungsform: | Verlagsliteratur |
Sprache: | Englisch |
Titel des übergeordneten Werkes (Englisch): | Characterization of nanoparticles - Measurement processes for nanoparticles |
Jahr der Erstveröffentlichung: | 2020 |
Organisationseinheit der BAM: | 6 Materialchemie |
6 Materialchemie / 6.1 Oberflächen- und Dünnschichtanalyse | |
Verlag: | Elsevier |
Verlagsort: | Amsterdam |
Erste Seite: | 373 |
Letzte Seite: | 395 |
DDC-Klassifikation: | Naturwissenschaften und Mathematik / Chemie / Analytische Chemie |
Technik, Medizin, angewandte Wissenschaften / Ingenieurwissenschaften / Ingenieurwissenschaften und zugeordnete Tätigkeiten | |
Freie Schlagwörter: | Auger Electron Spectroscopy; Imaging surface chemical analysis; Nanoparticles; Nanotechnology; Surface chemical analysis |
Themenfelder/Aktivitätsfelder der BAM: | Chemie und Prozesstechnik |
Material | |
Material / Nano | |
DOI: | 10.1016/B978-0-12-814182-3.00020-1 |
ISBN: | 978-0-12-814182-3 |
Zugehöriger Identifikator: | https://opus4.kobv.de/opus4-bam/frontdoor/index/index/docId/50284 |
Verfügbarkeit des Dokuments: | Datei im Netzwerk der BAM verfügbar ("Closed Access") |
Datum der Freischaltung: | 15.01.2020 |
Referierte Publikation: | Ja |
Datum der Eintragung als referierte Publikation: | 18.06.2020 |