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Metrology for spatially resolved chemical analysis at the micro and nanometre scales - Surface analysis working group (SAWG) - Report for 15th meeting (2016/17)

  • CCQM has established a framework of comparisons to demonstrate the international comparability of chemical measurements. The key point is the establishment of comparable measurements, with traceability to internationally or nationally stated references. Originally initiated by Dr Martin P Seah, NPL, the Surface Analysis Working Group (SAWG) has been formally founded in 2003. The following terms of reference were presented to CCQM in April 2002. CCQM ratified the group as a full working group of CCQM in April 2003 with these terms of reference: - to develop pilot studies and carry out key comparisons of national measurement standards for surface and micro/nano-analysis; - to assist in identifying and establishing inter-laboratory work to improve the traceability of surface and micro/nano-analysis; - to establish and update a work plan to be adopted by CCQM; - to discuss and review the scope of the working group and to liase with other working groups related to nanotechnology.CCQM has established a framework of comparisons to demonstrate the international comparability of chemical measurements. The key point is the establishment of comparable measurements, with traceability to internationally or nationally stated references. Originally initiated by Dr Martin P Seah, NPL, the Surface Analysis Working Group (SAWG) has been formally founded in 2003. The following terms of reference were presented to CCQM in April 2002. CCQM ratified the group as a full working group of CCQM in April 2003 with these terms of reference: - to develop pilot studies and carry out key comparisons of national measurement standards for surface and micro/nano-analysis; - to assist in identifying and establishing inter-laboratory work to improve the traceability of surface and micro/nano-analysis; - to establish and update a work plan to be adopted by CCQM; - to discuss and review the scope of the working group and to liase with other working groups related to nanotechnology. Following the 2016 meeting, the Key Comparison K-129 "Measurement of atomic fractions in Cu(In,Ga)Se2 Films" lead by KRISS and the Key Comparison K-136 on "BET specific surface area of nanoporous Al2O3" lead by UNIIM&BAM have been finished in 2016. The 15th meeting of SAWG will focus on - survey on CMC claim submitted with reference to K-129 and K-136. - the overall and SAWG specific aspects of the CCQM Strategy process, - a joint meeting with the Inorganic Working Group addressing number concentrations of nano particles, - discussion of future comparisons.zeige mehrzeige weniger

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  • SAWG 2017 for plenary.pdf
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Metadaten
Autor*innen:Wolfgang UngerORCiD
Dokumenttyp:Vortrag
Veröffentlichungsform:Präsentation
Sprache:Englisch
Jahr der Erstveröffentlichung:2017
DDC-Klassifikation:Naturwissenschaften und Mathematik / Chemie / Analytische Chemie
Freie Schlagwörter:CCQM; Comparisons; Metrology
Veranstaltung:CCQM Plenary Meeting at BIPM 2017
Veranstaltungsort:Paris, France
Beginndatum der Veranstaltung:27.4.17
Enddatum der Veranstaltung:28.4.17
Verfügbarkeit des Dokuments:Datei im Netzwerk der BAM verfügbar ("Closed Access")
Datum der Freischaltung:17.05.2017
Referierte Publikation:Nein
Eingeladener Vortrag:Nein
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