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Scanning-Free Grazing Exit XANES Analysis of Stratified Samples and the Optimization of the Data Collection Process

  • The components that are used in structural and in high temperature applications generally face significant challenges with respect to oxidation behaviours and metalworking processes. In most of the cases, harsh environmental conditions lead materials to degrade due to corrosion. To thoroughly investigate the corrosion processes and to determine oxidation states of metal components within the reaction products, we need special analytical tools. Grazing exit X-ray fluorescence (GEXRF) offers a non-destructive way to collect this information in sub-micrometre depth range. In order to obtain structural information, such as regarding oxidation states or atomic/molecular geometric arrangement, the GEXRF approach can also be combined with the X-ray absorption spectroscopy (XAS) method. The position and energy sensitive detector, with 264x264 pixel detector area, provides information regarding the signal emitted from the sample as a function of the emission angle and thus allowsThe components that are used in structural and in high temperature applications generally face significant challenges with respect to oxidation behaviours and metalworking processes. In most of the cases, harsh environmental conditions lead materials to degrade due to corrosion. To thoroughly investigate the corrosion processes and to determine oxidation states of metal components within the reaction products, we need special analytical tools. Grazing exit X-ray fluorescence (GEXRF) offers a non-destructive way to collect this information in sub-micrometre depth range. In order to obtain structural information, such as regarding oxidation states or atomic/molecular geometric arrangement, the GEXRF approach can also be combined with the X-ray absorption spectroscopy (XAS) method. The position and energy sensitive detector, with 264x264 pixel detector area, provides information regarding the signal emitted from the sample as a function of the emission angle and thus allows depth-sensitive analysis. Furthermore, the data collected from samples of an incidence energy which can be controlled with a resolution of 0.5 eV provides XANES data to determine oxidation states. We address the feasibility of our setup and provide a new optimization procedure (Bayesian Optimization and Gaussian Regression) to decrease measuring time. The results settle on a conceptual study on a reference sample (Cr-Oxide layer (300nm) on Cr layer (500nm) on Si wafer).zeige mehrzeige weniger

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Metadaten
Autor*innen:Cafer Tufan CakirORCiD
Koautor*innen:Ana de Oliveira Guilherme Buzanich, Uwe Reinholz, Franziska Emmerling, Christina Streli, Martin Radtke
Dokumenttyp:Vortrag
Veröffentlichungsform:Präsentation
Sprache:Englisch
Jahr der Erstveröffentlichung:2022
Organisationseinheit der BAM:6 Materialchemie
6 Materialchemie / 6.3 Strukturanalytik
DDC-Klassifikation:Naturwissenschaften und Mathematik / Chemie / Analytische Chemie
Freie Schlagwörter:GEXRF; Grazing exit; High entropy alloys; High entropy materials; Optimization; XANES; XAS
Themenfelder/Aktivitätsfelder der BAM:Chemie und Prozesstechnik
Veranstaltung:Denver X-Ray Conference DXC 2022
Veranstaltungsort:Washington D.C., USA
Beginndatum der Veranstaltung:07.08.2022
Enddatum der Veranstaltung:11.08.2022
Verfügbarkeit des Dokuments:Datei im Netzwerk der BAM verfügbar ("Closed Access")
Datum der Freischaltung:15.11.2022
Referierte Publikation:Nein
Eingeladener Vortrag:Nein
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