TY - JOUR A1 - Wollschläger, Nicole A1 - Häusler, Ines A1 - Ortel, Erik A1 - Hodoroaba, Vasile-Dan A1 - Palasse, L. A1 - Dirscherl, K. T1 - Characterization of porous, TiO2 nanoparticle films using on-axis TKD in SEM – a new nano-analysis tool for a large-scale application N2 - A combined methodical approach is tested with respect to the characterization of the inner structure of porous TiO2 layers as typically used in modern dye sensitized solar cells (DSSC). Their performance is directly linked to the surface area of the pore network. The micrometer thick layer employed was manufactured by screen-printing of a starting TiO2 powder constituted of shape-controlled, bipyramidal anatase nanoparticles on FTO/glass substrates. The analytical methods exploited in our study are Focused Ion Beam (FIB) slicing followed by 3D reconstruction as well as the new approach transmission Kikuchi diffraction (TKD) technology in the scanning electron microscope (SEM). Size and shape distribution of the TiO2 NPs within the layer can be extracted. SEM in transmission mode and atomic force microscopy (AFM) have been used to verify the dimensional data obtained by the new combined methodical approach. Its analytical benefits but also the challenges and limitations are highlighted. KW - TiO2 KW - TKD KW - Particle size distribution KW - Nanoparticles KW - Porous film PY - 2017 UR - https://www.cambridge.org/core/services/aop-cambridge-core/content/view/8A8B29335A2F4D0CB6922F6F5A19C5DC/S1431927617003397a.pdf/characterization_of_porous_tio2_nanoparticle_films_using_onaxis_tkd_in_sem_a_new_nanoanalysis_tool_for_a_largescale_application.pdf DO - https://doi.org/10.1017/S1431927617003397 VL - 23 IS - S1 (July) SP - 542 EP - 543 PB - Cambridge University Press CY - New York, NY, U.S.A. AN - OPUS4-41924 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Hodoroaba, Vasile-Dan A1 - Wollschläger, Nicole A1 - Pallase, L. A1 - Häusler, Ines A1 - Ortel, Erik A1 - Dirscherl, K. T1 - Characterization of Porous, TiO2 Nanoparticle Films Using On-Axis TKD in SEM – a New Nano-Analysis Tool for a Large-Scale Application N2 - A combined methodical approach is tested with respect to the characterization of the inner structure of porous TiO2 layers as typically used in modern dye sensitized solar cells (DSSC). Their performance is directly linked to the surface area of the pore network. The micrometer thick layer employed was manufactured by screen-printing of a starting TiO2 powder constituted of shape-controlled, bipyramidal anatase nanoparticles on FTO/glass substrates. The analytical methods exploited in our study are Focused Ion Beam (FIB) slicing followed by 3D reconstruction as well as the new approach transmission Kikuchi diffraction (TKD) technology in the scanning electron microscope (SEM). Size and shape distribution of the TiO2 NPs within the layer can be extracted. SEM in transmission mode and atomic force microscopy (AFM) have been used to verify the dimensional data obtained by the new combined methodical approach. Its analytical benefits but also the challenges and limitations are highlighted. T2 - Microscopy & Microanalysis 2017 Meeting CY - St. Louis, MO, USA DA - 06.08.2017 KW - Porous layers KW - TiO2 KW - Nanoparticles KW - Size and shape distribution KW - TKD KW - SEM PY - 2017 AN - OPUS4-41660 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - GEN ED - Hodoroaba, Vasile-Dan ED - Unger, Wolfgang ED - Shard, A. G. T1 - Characterization of nanoparticles - Measurement processes for nanoparticles N2 - Characterization of Nanoparticles: Measurement Processes for Nanoparticles surveys this fast growing field, including established methods for the physical and chemical characterization of nanoparticles. The book focuses on sample preparation issues (including potential pitfalls), with measurement procedures described in detail. In addition, the book explores data reduction, including the quantitative evaluation of the final result and its uncertainty of measurement. The results of published inter-laboratory comparisons are referred to, along with the availability of reference materials necessary for instrument calibration and method validation. The application of these methods are illustrated with practical examples on what is routine and what remains a challenge. In addition, this book summarizes promising methods still under development and analyzes the need for complementary methods to enhance the quality of nanoparticle characterization with solutions already in operation. KW - Nanoparticles KW - Characterization method KW - Sample preparation KW - Inter-laboratory comparison KW - Standardisation KW - Measurement uncertainty KW - Case studies PY - 2020 SN - 978-0-12-814182-3 DO - https://doi.org/10.1016/C2017-0-00312-9 SP - 1 EP - 566 PB - Elsevier CY - Amsterdam AN - OPUS4-50284 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Sötebier, Carina A1 - Bierkandt, Frank A1 - Bettmer, J. A1 - Rades, Steffi A1 - Jakubowski, Norbert A1 - Panne, Ulrich A1 - Weidner, Steffen T1 - Characterization of Ag nanoparticles: limitation and advantages of field-flow fractionation N2 - Silver nanoparticles (Ag NPs) are widely used in consumer products due to their excellent antibacterial properties. Their broad application has led to a variety of recent regulation on their use and labelling. Thus, a highly specific analytical method for their characterization and quantification is needed. Due to their large separation range, field-flow fractionation (FFF) techniques are repeatedly applied for the analysis of NP. Limitations of FFF include quantification, sample loss and insufficient recovery rates. Another challenge can be non-ideal elution behavior of particles in complex and unknown matrices. The possible sources for sample losses of Ag NP have been studied using an asymmetric flow FFF (AF4) in combination with inductively coupled plasma mass spectrometry (ICP-MS). The influence of different parameters, for example the sample concentration, on the recovery rates and sample loss has been investigated. Using laser ablation ICP-MS, the Ag deposition on the membrane was located and quantified. Our results identified ionic silver as the main sources of sample loss. These results can be useful for further method improvement. However, when a Ag NP sample containing an unknown complex matrix is analyzed, FFF method optimization is challenging as the sample might show a shift in the retention times and lower recovery rates. In this case, ICP-MS experiment in the single particle mode (sp-ICP-MS) can be a useful addition to the FFF measurement. Here, upon assumption of spherical particles, the geometric diameters can be calculated. This fast and easy approach can be helpful in order to interpret the FFF fractograms and advice the FFF method optimization process. T2 - 18th International Symposium on Field- and Flow-Based Separations CY - Dresden, Germany DA - 22.05.2016 KW - Silver KW - Nanoparticles KW - Field-flow fractionation KW - ICP-MS PY - 2016 AN - OPUS4-36352 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Hodoroaba, Vasile-Dan A1 - Mansfeld, Ulrich A1 - Hörenz, Christoph A1 - Pellegrino, F. A1 - Maurino, V. A1 - Marguet, S. A1 - Testard, F. A1 - Tache, O. A1 - Bartczak, D. A1 - Goenaga-Infante, H. T1 - Challenges in Traceable Size Measurement of Non-Spherical, Non-Monodisperse Nanoparticles - nPSize N2 - Size measurement of nanoparticles (NP) becomes a challenging analytical problem when non-spherical shapes must be traceably measured. However, most industrial NPs have irregular shapes and broad size distribution making it often more complex to follow European regulatory to identify a material as a nanomaterial according to which accurate measurement of the smallest dimension and its size Distribution is necessary. The European research project nPSize - Improved traceability chain of nanoparticle size measurements aims to fill this gap by developing potential non-spherical reference nanoparticles, measurement procedures and physical modelling to improve the traceability chain, comparability and compatibility for NP size measurements between different methods. Therefore, new model NP with well-controlled shape has been synthesized and are supposed to be systematically characterized using the traceable methods scanning/transmission electron microscopy, atomic force microscopy and small angle X-ray scattering. Following NP candidates are under investigation with respect to their homogeneity and stability: (i) titania nanoplatelets (10-15 nm thickness x 50-100 nm lateral), (ii) titania bipyramides (~60 nm length x 40 nm width), (iii) titania acicular particles (100 nm length x 15-20 nm width; aspect ratio 5.5/6), (iv) gold nanorods (~10 nm width x 30 nm length), and (v) gold nanocubes (~55 nm x 55 nm x 55 nm). In addition, sample preparation procedures as well as measurement analysis procedures with evaluation of appropriate measurands and descriptors for each material class and method are being developed to support standardization. To underpin the traceability of the size measurement of nonspherical NP, physical modelling of the signals in e.g. electron microscopy techniques will be used and in combination, the implementation of machine learning is aimed to facilitate measurement Analysis procedures, especially regarding the accurate thresholding/segmentation of the NPs.zeige mehr T2 - Nanoparticle Reference Materials - Production and Cerification Training Course CY - London, UK DA - 10.12.2019 KW - Nanoparticles KW - Traceability KW - Particle size distribution KW - Electron microscopy KW - Reference materials KW - Non-spherical shape PY - 2019 AN - OPUS4-50040 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Hodoroaba, Vasile-Dan A1 - Hörenz, Christoph A1 - Durande, B. A1 - Taché, O. A1 - Bartczak, D. A1 - Cuello-Nuñez, S. A1 - Ábad-Alvaro, I. A1 - Goenaga-Infante, H. T1 - Analysis of Particle Size Distribution for Bimodal Model Nanoparticles by Scanning Electron Microscopy N2 - The present study addresses the capability of measurement of relative particle number concentration by scanning electron microscopy for model bimodal silica and gold samples prepared in the frame of the European research project “nPSize - Improved traceability chain of nanoparticle size measurements” as candidate reference nanoparticles. T2 - Microscopy and Microanalysis 2020 CY - Online meeting DA - 03.08.2020 KW - Nanoparticles KW - Silica KW - Gold KW - Electron microscopy KW - Particle size distribution PY - 2020 AN - OPUS4-51112 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Kuchenbecker, Petra A1 - Hodoroaba, Vasile-Dan A1 - Lindemann, Franziska A1 - Gemeinert, Marion A1 - Wohlleben, W. T1 - Advanced screening method using volume-specific surface area (VSSA) for nanomaterial classification of powders N2 - The EU recommendation for a definition of nanomaterial (2011/696/EU) should allow the identification of a particulate nanomaterial based on the number-based metric criterion according to which at least 50% of the constituent particles have the smallest dimension between 1 and 100 nm. Within the European Project NanoDefine (www.nanodefine.eu) a two-tier approach has been developed, whereby firstly a screening method is applied for the rough classification as a nanomaterial or non-nanomaterial, and for borderline cases a confirmatory method (imaging methods or field flow fractionation) must be considered. One of the measurement methods well suited to particulate powder is the determination of volume-specific surface area (VSSA) by means of gas adsorption as well as skeletal density. The value of 60 m2/cm3 corresponding to spherical, monodisperse particles with a diameter of 100 nm constitutes the threshold for decisioning if the material is a nanomaterial or non-nanomaterial. The correct identification of a nanomaterial by VSSA method (positive test) is accepted by the EU recommendation. However, the application of the VSSA method is associated also by some limitations. The threshold of 60 m2/cm3 is dependent on the particle shape. For particles containing micro-pores or having a microporous coating, false positive results will be produced. Furthermore, broad particle size distributions – as typically for ceramic materials – as well as multi-modal size distributions make necessary to adjust the threshold. Based on examples of commercially available ceramic powders, the applicability of the VSSA approach will be tested (in relation with SEM and TEM measurements) in order to expand the actual knowledge and improve the method. T2 - Jahrestagung der Deutschen Keramischen Gesellschaft mit Symposium Hochleistungskeramik CY - München, Germany DA - 10.04.2018 KW - VSSA KW - Nanoparticles PY - 2018 AN - OPUS4-45097 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Hodoroaba, Vasile-Dan T1 - Advanced Characterization of the Surface Morphology and Chemistry within nano@BAM N2 - Both essential aspects of the surface of solid matter, its morphology and chemistry, are studied traditionally at BAM starting in the 60’s with different cyclical research focus areas, mostly related either to applicative research or method development. In the recent years, the focus has shifted almost exclusively to the nano-analytics of advanced materials such as complex nanoparticles, (ultra)thin films/coatings, nanocomposites, 2D materials, energy materials, etc. This is also the reason why BAM has established recently the new Competence Center nano@BAM (www.bam.de/Navigation/DE/Themen/Material/Nanotechnologie/sichere-nanomaterialien.html) with the five sub-fields nanoCharacterisation, nanoMaterial, nanoSafety, nanoData and nanoTechnology. The link to the BAM central guidelines to the safety in technology and chemistry is given by the development of reference products such as reference measurement procedures, reference (nano)materials, and newly reference data sets. Thus, an internationally well-networked group in surface analysis has been established @BAM, with regular contributions to integral analytical characterization with metrological and standardization background. Examples of newly developed methodical approaches will be given with an emphasis on correlative nano-analysis of morphology and chemistry of nanomaterials. Correlative imaging by STEM-in-SEM with high-resolution SEM and EDX, and further with AFM or the new technique TKD (Transmission Kikuchi Diffraction) will be explained on various examples of nanostructures, both as starting materials and embedded/functionalized nanoparticles in products. The unique analytical benefits of the Auger electron probe as a veritable nano-tool for surface chemistry will be highlighted. The panoply of advanced surface characterization methods @BAM is completed by discussing examples of hybrid analysis of the bulk of nanomaterials by X-ray Spectroscopy with the highest surface-sensitive methods X-ray Photoelectron Spectroscopy (XPS) and Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS). Particularly for the analysis of the surface chemistry of nanostructures, such as the completeness of the shells of core-shell nanoparticles or in-depth and lateral gradients of chemistry within mesoporous thin layers, the latter methods are inherent. Other special developments like approaches for the quantitative determination of the roughness of particle surface by electron microscopy or for the quantitative determination of the porosity of thin mesoporous layers by electron probe microanalysis (EPMA) with SEM will be presented. T2 - Seminar of the Academic Centre for Materials and Nanotechnology CY - Online meeting DA - 12.05.2022 KW - Nanoparticles KW - Thin films KW - Nano Characterisation KW - Nanomaterials KW - Surface morphology KW - Surface chemistry PY - 2022 UR - https://www.agh.edu.pl/en/info/article/seminar-advanced-characterization-of-the-surface-morphology-and-chemistry-within-nanobam/ AN - OPUS4-54820 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Hodoroaba, Vasile-Dan T1 - Advanced Characterization of the Surface Morphology and Chemistry within nano@BAM N2 - Both essential aspects of the surface of solid matter, its morphology and chemistry, are studied traditionally at BAM starting in the 60’s with different cyclical research focus areas, mostly related either to applicative research or method development. In the recent years, the focus has shifted almost exclusively to the nano-analytics of advanced materials such as complex nanoparticles, (ultra)thin films/coatings, nanocomposites, 2D materials, energy materials, etc. This is also the reason why BAM has established recently the new Competence Center nano@BAM (www.bam.de/Navigation/DE/Themen/Material/Nanotechnologie/sichere-nanomaterialien.html) with the five sub-fields nanoCharacterisation, nanoMaterial, nanoSafety, nanoData and nanoTechnology. The link to the BAM central guidelines to the safety in technology and chemistry is given by the development of reference products such as reference measurement procedures, reference (nano)materials, and newly reference data sets. Thus, an internationally well-networked group in surface analysis has been established @BAM, with regular contributions to integral analytical characterization with metrological and standardization background. Examples of newly developed methodical approaches will be given with an emphasis on correlative nano-analysis of morphology and chemistry of nanomaterials. Correlative imaging by STEM-in-SEM with high-resolution SEM and EDX, and further with AFM or the new technique TKD (Transmission Kikuchi Diffraction) will be explained on various examples of nanostructures, both as starting materials and embedded/functionalized nanoparticles in products. The unique analytical benefits of the Auger electron probe as a veritable nano-tool for surface chemistry will be highlighted. The panoply of advanced surface characterization methods @BAM is completed by discussing examples of hybrid analysis of the bulk of nanomaterials by X-ray Spectroscopy with the highest surface-sensitive methods X-ray Photoelectron Spectroscopy (XPS) and Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS). Particularly for the analysis of the surface chemistry of nanostructures, such as the completeness of the shells of core-shell nanoparticles or in-depth and lateral gradients of chemistry within mesoporous thin layers, the latter methods are inherent. Other special developments like approaches for the quantitative determination of the roughness of particle surface by electron microscopy or for the quantitative determination of the porosity of thin mesoporous layers by electron probe microanalysis (EPMA) with SEM will be presented in conjunction with the corresponding advanced materials studied. Current research projects, promising ideas, including ongoing (pre-)standardization activities in the field of the challenging nano/surface analysis will be touched systematically, with the open goal of identifying future bilateral cooperation possibilities between EMPA and BAM. T2 - EMPA-Kolloquium CY - Online meeting DA - 01.12.2021 KW - Nanoparticles KW - Nano@BAM KW - Nanomaterials KW - Surface morphology and chemistry KW - Correlative analysis PY - 2021 AN - OPUS4-54039 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Hörenz, Christoph A1 - Tache, O. A1 - Bartczak, D. A1 - Nunez, S. A1 - Abad Alvaro, I. A1 - Goenaga-Infante, H. A1 - Hodoroaba, Vasile-Dan T1 - A Study on the Analysis of Particle Size Distribution for Bimodal Model Nanoparticles by Electron Microscopy N2 - The present study addresses the capability of measurement of relative particle number concentration by scanning electron microscopy for model bimodal silica and gold samples prepared in the frame of the European research project “nPSize - Improved traceability chain of nanoparticle size measurements” as candidate reference nanoparticles. KW - Nanoparticles KW - Particle size distribution KW - Bimodal size distribution KW - Traceability PY - 2020 DO - https://doi.org/10.1017/S1431927620021054 VL - 26 IS - S2 SP - 2282 EP - 2283 PB - Cambridge University Press CY - Cambridge, UK AN - OPUS4-51771 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER -