TY - GEN A1 - Nolze, Gert ED - Sen Gupta, S. P. ED - Chatterjee, P. T1 - The determination of residual stress N2 - X-ray stress analysis on crystalline materials is based on the determination of elastic lattice strains. The strains described by the shift of peak positions are converted to stresses by the means of theory of elasticity. The development of the sin2ψ-method of X-ray stress analysis introduced an enormous progress in X-ray stress analysis during the last decades. This report outlines some important elements of X-ray physics and fundamentals of theory of elasticity. The Standard measuring procedure are described and special experimental differences to the common powder diffractometry are outlined. KW - XRD KW - Residual stress PY - 2002 SN - 81-7764-262-6 SN - 9788177642629 SP - 77 EP - 83 PB - Allied Publishers CY - Kolkata, India AN - OPUS4-38036 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER -