TY - CONF A1 - Güttler, Arne T1 - Certified Reference Materials for the Quantification and Standardization of Fluorescence-based Measurements N2 - The size and shape of photoluminescence signals is affected by wavelength-, polarization-, and time-dependent instrumentspecific contributions and the compound- and environment-specific photoluminescence quantum yield. The former hamper the comparability of fluorescence measurements performed on different measuring devices. The commonly relatively done determination of the performance parameter requires suitable quantum yield standards with well-known. The performance of such measurements is, e.g., described in the written standard IEC 62607 currently revised. T2 - Colloquium für Optische Spektrometrie 2025 CY - Jena, Germany DA - 24.09.2025 KW - Quality assurance KW - Fluorescence KW - Nano KW - Particle KW - Advanced material KW - Calibration KW - Characterization KW - Fluorescence quantum yield KW - Phosphor KW - Absolute KW - Integrating sphere spectroscopy KW - Dye KW - Standardization KW - Reference material KW - Interlaboratory comparison KW - Uncertainty PY - 2025 AN - OPUS4-64213 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Brinkmann, A. T1 - A qNMR Method for Quantification of Surface Functional Groups on Silica Nanoparticles: Bilateral Comparisons N2 - Nanomaterials (NM) of different size, shape, morphology, composition, and surface chemistry are used in a wide range of applications, including medical diagnostics, and imaging and consumer products. The importance of an adequate and reliable characterization is crucial for quality control during NM production, for ensuring an optimum function for the desired application, and for risk assessment studies. Currently there is a lack of reliable and validated methods and reference materials for quantifying NM surface functional groups, despite the importance of surface chemistry for the production of colloidally stable materials, further processing steps, and the interaction with the environment and biological species. Following our initial study on the use of qNMR for quantifying the amount of amino groups on surface modified silica (1), we have carried out two bilateral comparisons between NRC and BAM to further develop and optimize a reliable protocol for these measurements (2,3), using aminated silica nanoparticles prepared by multiple methods, both commercial and in-house synthesized, and with varying amine content. Solution qNMR is based on dissolving aminated silica nanoparticles in strong base to release the surface grafted amino silane molecules, followed by the quantification of these molecules by solution qNMR using an internal standard. This method provides the amount of total amino groups present in the sample, which can differ from probe accessible or surface-sensitive measurements performed with X-Ray photoelectron spectroscopy (XPS). Complementary measurements using optical assays, involving a labeling step with a dye reporter, and XPS are employed to assess the probe accessible and surface amine content for representative samples. These measurements, which illustrate the advantages and potential limitations of the different characterization methods, will contribute to establish a basis for testing the protocol in an international inter-laboratory comparison and for standardization at ISO Technical Committee 229 – Nanotechnologies. T2 - BERM CY - Halifax, Canada DA - 01.06.2025 KW - Quality assurance KW - Nano KW - Particle KW - Synthesis KW - Advanced materials KW - Characterization KW - Electron microscopy KW - Silica KW - Surface KW - qNMR KW - Optical assay KW - Interlaboratory comparison KW - Metrology KW - Standardization PY - 2025 AN - OPUS4-63527 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Resch-Genger, Ute T1 - Standardized Measurements of Surface Functionalities on Nanoparticles - F. Synthesis and characterization of functional nanocomposite materials N2 - Engineered nanoparticles (NPs) with various chemical compositions and surface functionalities are routinely and commonly fabricated for industrial applications such as medical diagnostics, drug delivery, sensing, catalysis, energy conversion and storage, opto-electronics, and information storage. NP function, their interaction with biological species, and also their environmental fate are largely determined by the surface functionalities of the particles. Reliable, reproducible, and standardized surface characterization methods are therefore vital for quality control of NPs, determination of their applicability, and mandatory to meet increasing concerns regarding their safety. In addition, industry as well as international standardization organizations, regulatory agencies, and policymakers need validated and standardized measurement methods and reference materials. However, methodologies for determining NP surface properties, including the amount, chemical composition, and homogeneity of surface functionalities and coatings are largely non-standardized up until now. Suitable methods for determining surface functionalities on ligand-stabilized core and core/shell NPs include advanced techniques such as traceable quantitative nuclear magnetic resonance (qNMR), as well as X-ray electron spectroscopy (XPS) and time of flight secondary ion mass spectrometry (ToF-SIMS), and simpler optical and electrochemical methods. The latter, typically less costly methods are often used by SMEs, e.g., for quality control. To validate methods, establish measurement uncertainties, test reference materials, and produce reference data, international interlaboratory comparisons (ILC) on NP surface functionalization measurements are required to provide well characterized test and reference nanomaterials including benchmark values.[1] These needs are addressed by the current European metrology project SMURFnano, involving 12 partners from different National Metrology Institutes, designated and research institutes, two university groups as well as one large company and one SME producing NPs. This project, as well as first results derived from the development of test and reference materials with a well characterized surface chemistry, and ongoing interlaboratory comparisons, will be presented. T2 - Shift 2025 CY - La Laguna, Tenerife DA - 13.10.2025 KW - Nano KW - Particle KW - Silica KW - Iron oxide KW - Lanthanide KW - Metrology KW - Quality assurance KW - Reference material KW - Surface chemistry KW - Size KW - Shape KW - Particle number concentration KW - Method KW - Optical assay KW - qNMR KW - Validation KW - Potentiometry KW - XPS KW - ILC KW - Standardization PY - 2025 AN - OPUS4-64370 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Hertwig, Andreas T1 - Calibration samples and the GUM-compliant determination of uncertainties in ellipsometry N2 - Ellipsometry is well known as a highly sensitive and reproducible surface analysis technique. However, in a context of metrological applications, the most important property of a measurement process is accuracy, relying on statistical precision, (reproducibility) and trueness (in an absolute sense versus a given standard). The latter is much more difficult to achieve. In this presentation, we discuss the possibility of establishing ellipsometry in a diverse metrological landscape by means of defining standard procedures and best practice methodologies for the measurement and for calibration purposes. The most important task of this approach is to determine the model-inherent uncertainty, originating from parameter coupling. We achieve this by means of sensitivity analysis of the parameters resulting from the fit process. We discuss the definition of reference materials by which accuracy can be made available for ellipsometry, passed along between ellipsometry laboratories and for other measurement techniques. The determination of uncertainty is presented in this work for a number of examples involving difficult analysis models employed for samples from different production environments. We present a standardization initiative with the goal to disseminate this work into an international standard alongside an inter-laboratory study comparing the results for complex samples gained by laboratories with different instrumentation. We also present the results gained within EURAMET projects focused on the metrology of materials with strong non-idealities used in photovoltaics and other energy technology. T2 - Workshop Ellipsometry 2018 CY - Chemnitz, Germany DA - 19.03.2018 KW - Ellipsometric metrology KW - Reference samples KW - Reference procedures KW - Standardization PY - 2018 AN - OPUS4-44674 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER -