TY - CONF A1 - Bruno, Giovanni A1 - Kupsch, Andreas A1 - Mueller, Bernd R. A1 - Lange, Axel T1 - X-ray refraction 2D and 3D techniques N2 - X-ray refraction techniques represent a very promising, yet not so wide-spread, set of X-ray techniques based on refraction effects. They allow determining internal specific surface (surface per unit volume) in a non-destructive fashion, position and orientation sensitive, and with nanometric detectability. While they are limited by the X-ray absorption of the material under investigation, we demonstrate showcases of ceramics and composite materials, where understanding of microstructural features could be achieved in a way unrivalled even by high-resolution techniques such as electron microscopy or computed tomography. T2 - ICTMS 2017 CY - Lund, Sweden DA - 26.06.2017 KW - X-ray refraction KW - Composites KW - Damage KW - Cracks KW - Cearmics PY - 2017 AN - OPUS4-41042 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER -