TY - GEN A1 - Vladár, A. E. A1 - Hodoroaba, Vasile-Dan ED - Hodoroaba, Vasile-Dan ED - Unger, Wolfgang ED - Shard, A. G. T1 - Characterization of nanoparticles by scanning electron microscopy N2 - In this chapter sample preparation, image acquisition, and nanoparticle size and shape characterization methods using the scanning electron microscope (SEM) in reflective and transmitted working modes are described. These help in obtaining reliable, highly repeatable results. The best solutions vary case-by-case and depend on the raw (powdered or suspension) nanoparticle material, the required measurement uncertainty and on the performance of the SEM. KW - Nanoparticles KW - Sample preparation KW - Electron microscopy KW - SEM KW - Size measurement KW - Shape KW - Threshold PY - 2020 SN - 978-0-12-814182-3 DO - https://doi.org/10.1016/B978-0-12-814182-3.00002-X SP - 7 EP - 27 PB - Elsevier CY - Amsterdam AN - OPUS4-50120 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - GEN A1 - Unger, Wolfgang A1 - Wirth, Thomas A1 - Hodoroaba, Vasile-Dan ED - Hodoroaba, Vasile-Dan ED - Unger, Wolfgang ED - Shard, A. G. T1 - Auger electron spectroscopy N2 - An introduction in the application of Auger Electron Spectroscopy to surface chemical analysis of nanoparticles is given. Auger Electron Spectroscopy is a mature method in the field of surface chemical analysis. The chapter addresses the physical basis of the method, the principal design of recent instruments together with modes of operation and options for the presentation of spectra, as well as different approaches for qualitative (including identification of chemical species) and quantitative surface analysis of elements. An application paragraph on surface chemical analysis of nanoparticles by AES or SAM introduces the different measurement approaches and sample preparation strategies applied by analysts. The analysis of nanoparticle ensembles, the so-called selected point analysis where a narrow primary electron beam is centered on an individual nanoparticle, and chemical mapping of individual nanoparticles (or a line scan across) are addressed. Existing literature is reviewed and informative case studies presented. Limitations and pitfalls in the application of AES in surface chemical analysis of nanoparticles are also addressed. KW - Auger Electron Spectroscopy KW - Surface chemical analysis KW - Imaging surface chemical analysis KW - Nanoparticles KW - Nanotechnology PY - 2020 SN - 978-0-12-814182-3 DO - https://doi.org/10.1016/B978-0-12-814182-3.00020-1 SP - 373 EP - 395 PB - Elsevier CY - Amsterdam AN - OPUS4-50119 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - GEN A1 - Shard, A. G. A1 - Hodoroaba, Vasile-Dan A1 - Unger, Wolfgang ED - Hodoroaba, Vasile-Dan ED - Unger, Wolfgang ED - Shard, A. G. T1 - Introduction N2 - The purpose of this book is to provide a comprehensive collection of analytical methods that are commonly used to measure nanoparticles, providing information on one, or more, property of importance. The chapters provide up-to-date information and guidance on the use of these techniques, detailing the manner in which they may be reliably employed. Within this chapter, we detail the rationale and context of the whole book, which is driven by the observation of a low level of reproducibility in nanoparticle research. The aim of the book is to encourage awareness of both the strengths and weaknesses of the various methods used to measure nanoparticles and raise awareness of the range of methods that are available. The editors of the book have, for many years, been engaged in European projects and standardization activities concerned with nanoparticle analysis and have identified authors who are experts in the various methods included within the book. This has produced a book that can be used as a definitive guide to current best practice in nanoparticle measurement. KW - Nanoparticles KW - Size distribution KW - Shape KW - Chemistry KW - Coating KW - Concentration KW - Standards KW - Charge KW - Characterisation PY - 2020 SN - 978-0-12-814182-3 DO - https://doi.org/10.1016/B978-0-12-814182-3.00001-8 SP - 1 EP - 6 PB - Elsevier CY - Amsterdam AN - OPUS4-50166 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - GEN A1 - Schaepe, Kaija A1 - Jungnickel, H. A1 - Heinrich, Thomas A1 - Tentschert, J. A1 - Luch, A. A1 - Unger, Wolfgang ED - Hodoroaba, Vasile-Dan ED - Unger, Wolfgang ED - Shard, A. G. T1 - Secondary ion mass spectrometry N2 - This chapter provides an introduction in secondary ion mass spectrometry as one of the leading surface chemical analysis and imaging techniques with molecular specificity in the field of material sciences. The physical basics of the technique are explained along with a description of the typical instrumental setups and their modes of operation. The application paragraph specifically focuses on nanoparticle analysis by SIMS in terms of surface spectrometry, imaging, analysis in organic and complex media, and depth profiling. A review of the existing literature is provided, and selected studies are showcased. Limitations and pitfalls as well as current technical developments of SIMS application in nanoparticle surface chemical analysis are equally discussed. KW - Time-of-flight secondary ion mass spectrometry KW - Surface chemical analysis KW - Imaging KW - Nanomaterials KW - Nanoparticles KW - Core-shell PY - 2020 SN - 978-0-12-814182-3 DO - https://doi.org/10.1016/B978-0-12-814182-3.00025-0 SP - 481 EP - 509 PB - Elsevier CY - Amsterdam AN - OPUS4-50187 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - GEN A1 - Mast, J. A1 - Verleysen, E. A1 - Hodoroaba, Vasile-Dan A1 - Kaegi, R. ED - Hodoroaba, Vasile-Dan ED - Unger, Wolfgang ED - Shard, A. G. T1 - Characterization of nanomaterials by transmission electron microscopy - Measurement procedures N2 - In this chapter, approaches are proposed for the descriptive and quantitative characterization of nano-objects with nanometer resolution. Measurements are based on the analysis of the characteristics of 2D projections of individual particles visualized on transmission electron micrographs. Incorporation of spectroscopic methods (EDS and EELS) for elemental analysis of nano-objects is recommended to identify subpopulations of nano-objects in mixtures based on their chemical composition. The focus lies on the determination of physicochemical properties which are essential in a legislatory and regulatory context to define the material as a nanomaterial (NM), and to assess its safety and toxicological potential, using widely accessible equipment. KW - Nanoparticles KW - Sample preparation KW - Image analysis KW - Transmission electron microscopy PY - 2020 SN - 978-0-12-814182-3 DO - https://doi.org/10.1016/B978-0-12-814182-3.00004-3 SP - 29 EP - 48 PB - Elsevier CY - Amsterdam AN - OPUS4-50121 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - GEN A1 - Hodoroaba, Vasile-Dan A1 - Unger, Wolfgang A1 - Shard, A. G. ED - Hodoroaba, Vasile-Dan ED - Unger, Wolfgang ED - Shard, A. G. T1 - Conclusions and perspectives N2 - This chapter briefly summarizes the methods selected within this book for the characterization of nanoparticles with regard to commonly accessible properties: nanoparticle size and size distribution, shape, surface area, surface charge, aggregation state, structure, chemical composition, surface chemistry, and nanoparticle number concentration. Current progress of measurement and analysis, as far as possible according to standard operation procedures, has been the focus of this work. A number of new and less commonly used methods have not been covered, and we outline some of these in this chapter. Future challenges such as automated measurement and analysis, read-across approaches for the prediction of properties, knowledge of measurement uncertainties, the need for certified reference materials, and the necessity to complement measurements methods to obtain more reliable results are covered, and the unmet measurement requirements for real-world nanoparticles are described. KW - Physicochemical characterization KW - Standard operation procedures KW - Data correlation KW - Method development KW - Trends PY - 2020 SN - 978-0-12-814182-3 DO - https://doi.org/10.1016/B978-0-12-814182-3.00006-7 SP - 527 EP - 534 PB - Elsevier CY - Amsterdam AN - OPUS4-50167 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - GEN A1 - Hodoroaba, Vasile-Dan ED - Hodoroaba, Vasile-Dan ED - Unger, Wolfgang ED - Shard, A. G. T1 - Energy-dispersive X-ray spectroscopy (EDS) N2 - As one of the widely used analytical methods for the analysis of elemental composition of solid matter, energy dispersive X-ray spectroscopy (EDS) has recently gained significant importance regarding its application to the chemical analysis of nanoparticles, especially in conjunction with the use of a scanning electron microscope (SEM) and the use of the transmission operation mode of SEM (STEM-in-SEM). This development was mainly driven by the technological progress with highly sensitive EDS detectors, such that individual nanoparticles can be quickly inspected with EDS at a SEM. Qualitative information on elemental composition with about 10 nm spatial resolution can be achieved complementary to the high-resolution information of the sample surface morphology within the same scanned area as provided by the electron microscope. Representative examples with successful EDS analysis on nanoparticles are presented, but also limitations of the method are described. KW - EDS KW - EPMA KW - X-rays KW - SEM/EDS PY - 2020 SN - 978-0-12-814182-3 DO - https://doi.org/10.1016/B978-0-12-814182-3.00021-3 SP - 397 EP - 417 PB - Elsevier CY - Amsterdam AN - OPUS4-49991 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - GEN A1 - Gibson, N. A1 - Kuchenbecker, Petra A1 - Rasmussen, K. A1 - Hodoroaba, Vasile-Dan A1 - Rauscher, H. ED - Hodoroaba, Vasile-Dan ED - Unger, Wolfgang ED - Shard, A.G. T1 - Volume-specific surface area by gas adsorption analysis with the BET method N2 - This chapter first gives an introduction to the concepts of SSA and volume-specific surface area (VSSA) and an outline of the BET method. It continues with a discussion of the relationship between particle size, shape, and the VSSA, followed by an overview of instrumentation, experimental methods, and standards. Finally, sections on the use of the VSSA as a tool to identify nanomaterials and non-nanomaterials and its role in a regulatory context provide some insight on the importance of VSSA in the current Regulation of nanomaterials. KW - Nanomaterials KW - Volume specific surface area PY - 2020 SN - 978-0-12-814182-3 DO - https://doi.org/10.1016/B978-0-12-814182-3.00017-1 SP - 265 EP - 293 PB - Elsevier CY - Amsterdam AN - OPUS4-49572 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - GEN A1 - George, Janine ED - Bastian, P. ED - Dranzlmüller, D. ED - Brüchle, H. ED - Mathias, G. T1 - Accelerated Materials Discovery with Automation and Machine­Learned Chemical Knowledge N2 - This project aims to accelerate the search for new materials (e.g., for thermoelectric applications, battery materials, magnets, and other materials classes) based on ab initio high­throughput studies. High­throughput searches are typically restricted to known materials. This project explores strategies (data­driven chemical heuristics in subproject 1 and machine­learned interatomic potentials in subproject 2) to go beyond current database entries and include such computationally demanding properties in high­throughput searches. To accomplish each subproject, we develop automated workflows for high­throughput computations and provide large open databases of computed materials properties to the research community. KW - Automation KW - Chemically Complex Materials KW - Machine Learning KW - Machine-Learned Interatomic Potentials KW - Workflows PY - 2024 UR - https://doku.lrz.de/files/10745976/1136429625/1/1731329162337/2024_SuperMUC-Results-Reports.pdf SN - 978-3-9816675-6-1 SP - 72 EP - 75 AN - OPUS4-61618 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - GEN A1 - George, Janine T1 - Materialinformatik N2 - Die Materialinformatik ermöglicht es, vorhandenes/etabliertes chemisches Wissen zu überprüfen, aber auch neues Wissen zu generieren. Zu diesem Zweck wurden automatisierte Methoden entwickelt, die es ermöglichen, große Datenbanken mit Materialeigenschaften zu berechnen. Diese Datenbanken mit berechneten Eigenschaften können nun mit Datenanalysetechniken und maschinellem Lernen ausgewertet werden. Unsere Entwicklungen ermöglichen es insbesondere, die Analyse der chemischen Bindung mit anderen Materialeigenschaften in großem Maßstab zu kombinieren. Auf der Grundlage von Deskriptoren für chemische Bindungen haben wir die ersten Schritte zur Entwicklung neuer chemischer Regeln unternommen. Daneben entwickeln wir weitere Programmcodes, die die Tätigkeiten in der Materialinformatik deutlich erleichtern KW - Materialdesign KW - Maschinelles Lernen KW - Automatisierung KW - Hochdurchsatz KW - Workflows KW - Materialeigenschaften PY - 2024 SN - 978-3-8007-6472-3 SP - 14 EP - 32 CY - Berlin AN - OPUS4-62256 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER -