TY - GEN A1 - Zaghdoudi, M. A1 - Kömmling, Anja A1 - Jaunich, Matthias A1 - Wolff, Dietmar ED - Altenbach, H. ED - Hitzler, L. ED - Johlitz, M. ED - Merkel, M. ED - Öchsner, A. T1 - Analysis of Heterogeneous Ageing of HNBR O-Rings N2 - Abstract Hydrogenated nitrile butadiene rubber (HNBR) elastomer was thermo-oxidatively aged at different temperatures up to 150 °C. Fourier transform infrared spectroscopy (FTIR), compression stress relaxation (CSR) and international rubber hardness degree (IRHD) microhardness were used to characterise the chemo-mechanical changes of HNBR O-rings during thermo-oxidative ageing. FTIR shows the development of carbonyl, methyl and ester groups but the nitrile content was not affected by ageing. The effect of sample geometry during CSR was investigated. CSR data were converted through integrated kinetic laws. The conversion has proven its sensibility to detect heterogeneous ageing. This was confirmed by the IRHD measure-ments across the section of O-rings. The influence of compression during ageing was assessed through IRHD measurements across the section of compressed and uncom-pressed aged O-rings. The DLO effect was more pronounced in compressed O-rings. By applying the model of Wise et al., theoretical IRHD and oxidation profiles were determined on the basis of IRHD experimental data of compressed O-rings. Good agreements between the experimental and the theoretical IRHD profiles in the core region were obtained. However, near the edge, the theoretical IRHD values were overestimated. KW - Ageing KW - Rubber seals KW - Stress relaxation KW - Modelling PY - 2024 SN - 978-3-031-49042-2 U6 - https://doi.org/10.1007/978-3-031-49043-9 SN - 1869-8433 SP - 331 EP - 348 PB - Springer Nature CY - Cham, Switzerland AN - OPUS4-59769 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - GEN A1 - Vladár, A. E. A1 - Hodoroaba, Vasile-Dan ED - Hodoroaba, Vasile-Dan ED - Unger, Wolfgang ED - Shard, A. G. T1 - Characterization of nanoparticles by scanning electron microscopy N2 - In this chapter sample preparation, image acquisition, and nanoparticle size and shape characterization methods using the scanning electron microscope (SEM) in reflective and transmitted working modes are described. These help in obtaining reliable, highly repeatable results. The best solutions vary case-by-case and depend on the raw (powdered or suspension) nanoparticle material, the required measurement uncertainty and on the performance of the SEM. KW - Nanoparticles KW - Sample preparation KW - Electron microscopy KW - SEM KW - Size measurement KW - Shape KW - Threshold PY - 2020 SN - 978-0-12-814182-3 U6 - https://doi.org/10.1016/B978-0-12-814182-3.00002-X SP - 7 EP - 27 PB - Elsevier CY - Amsterdam AN - OPUS4-50120 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - GEN A1 - Unger, Wolfgang A1 - Wirth, Thomas A1 - Hodoroaba, Vasile-Dan ED - Hodoroaba, Vasile-Dan ED - Unger, Wolfgang ED - Shard, A. G. T1 - Auger electron spectroscopy N2 - An introduction in the application of Auger Electron Spectroscopy to surface chemical analysis of nanoparticles is given. Auger Electron Spectroscopy is a mature method in the field of surface chemical analysis. The chapter addresses the physical basis of the method, the principal design of recent instruments together with modes of operation and options for the presentation of spectra, as well as different approaches for qualitative (including identification of chemical species) and quantitative surface analysis of elements. An application paragraph on surface chemical analysis of nanoparticles by AES or SAM introduces the different measurement approaches and sample preparation strategies applied by analysts. The analysis of nanoparticle ensembles, the so-called selected point analysis where a narrow primary electron beam is centered on an individual nanoparticle, and chemical mapping of individual nanoparticles (or a line scan across) are addressed. Existing literature is reviewed and informative case studies presented. Limitations and pitfalls in the application of AES in surface chemical analysis of nanoparticles are also addressed. KW - Auger Electron Spectroscopy KW - Surface chemical analysis KW - Imaging surface chemical analysis KW - Nanoparticles KW - Nanotechnology PY - 2020 SN - 978-0-12-814182-3 U6 - https://doi.org/10.1016/B978-0-12-814182-3.00020-1 SP - 373 EP - 395 PB - Elsevier CY - Amsterdam AN - OPUS4-50119 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - GEN A1 - Thuy, Maximilian A1 - Brauch, N. A1 - Niebergall, Ute A1 - Alig, I. A1 - Oehler, H. A1 - Böhning, Martin T1 - Environmental Stress Cracking of PE-HD Induced by Liquid Test Media Representing Crop Protection Formulations N2 - Packaging containers for dangerous goods that include aggressive liquids require that any packaging material that is based on high-density polyethylene has a high degree of stability and durability. This work is focused on testing the environmental stress cracking of the high-density polyethylenes used for such containers in contact with crop protection formulations, in particular, two model liquids established in Germany as standardized test media representatives for crop protection formulations containing the various admixtures typical for such products. One of the liquids is water-based and contains mostly surface-active ingredients, while the other is solvent-based and includes some emulsifiers. Originally established for pin impression tests, these model liquids and their individual components were here used for the first time as environmental media in the Full Notch Creep Test, which addresses the resistance against environmental stress cracking. The Full Notch Creep Test was carried out on five high-density polyethylene types with both model liquids, and also on one selected material with its components. The evaluation was focused on the fracture surface structures, which were visualized by a scanning electron microscope and by optical in situ imaging of the notch opening. While the water-based model liquid and its surface-active individual components induced environmental stress cracking with the characteristic pattern for a craze-crack mechanism and so-called brittle fracture on the surface, the solvent-based model liquid and its soluble ingredients exhibited rather ductile failure behavior, caused by the plasticizing effect on the polymer that reduced the yield stress of the high-density polyethylene. For both cases, fracture surface analysis, together with side views of the crack opening, showed a clear relation between surface pattern, notch deformation (e.g., by blunting), or crack opening due to crack growth with time to failure and the solubility of the liquids in high-density polyethylene. KW - Environmental stress cracking KW - Fracture surface KW - Full Notch Creep Test KW - Crop protection formulations KW - High-density polyethylene PY - 2023 U6 - https://doi.org/10.1520/STP164320210095 SP - 317 EP - 341 PB - ASTM International CY - West Conshohocken, PA (USA) AN - OPUS4-57459 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - GEN A1 - Shard, A. G. A1 - Hodoroaba, Vasile-Dan A1 - Unger, Wolfgang ED - Hodoroaba, Vasile-Dan ED - Unger, Wolfgang ED - Shard, A. G. T1 - Introduction N2 - The purpose of this book is to provide a comprehensive collection of analytical methods that are commonly used to measure nanoparticles, providing information on one, or more, property of importance. The chapters provide up-to-date information and guidance on the use of these techniques, detailing the manner in which they may be reliably employed. Within this chapter, we detail the rationale and context of the whole book, which is driven by the observation of a low level of reproducibility in nanoparticle research. The aim of the book is to encourage awareness of both the strengths and weaknesses of the various methods used to measure nanoparticles and raise awareness of the range of methods that are available. The editors of the book have, for many years, been engaged in European projects and standardization activities concerned with nanoparticle analysis and have identified authors who are experts in the various methods included within the book. This has produced a book that can be used as a definitive guide to current best practice in nanoparticle measurement. KW - Nanoparticles KW - Size distribution KW - Shape KW - Chemistry KW - Coating KW - Concentration KW - Standards KW - Charge KW - Characterisation PY - 2020 SN - 978-0-12-814182-3 U6 - https://doi.org/10.1016/B978-0-12-814182-3.00001-8 SP - 1 EP - 6 PB - Elsevier CY - Amsterdam AN - OPUS4-50166 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - GEN A1 - Schaepe, Kaija A1 - Jungnickel, H. A1 - Heinrich, Thomas A1 - Tentschert, J. A1 - Luch, A. A1 - Unger, Wolfgang ED - Hodoroaba, Vasile-Dan ED - Unger, Wolfgang ED - Shard, A. G. T1 - Secondary ion mass spectrometry N2 - This chapter provides an introduction in secondary ion mass spectrometry as one of the leading surface chemical analysis and imaging techniques with molecular specificity in the field of material sciences. The physical basics of the technique are explained along with a description of the typical instrumental setups and their modes of operation. The application paragraph specifically focuses on nanoparticle analysis by SIMS in terms of surface spectrometry, imaging, analysis in organic and complex media, and depth profiling. A review of the existing literature is provided, and selected studies are showcased. Limitations and pitfalls as well as current technical developments of SIMS application in nanoparticle surface chemical analysis are equally discussed. KW - Time-of-flight secondary ion mass spectrometry KW - Surface chemical analysis KW - Imaging KW - Nanomaterials KW - Nanoparticles KW - Core-shell PY - 2020 SN - 978-0-12-814182-3 U6 - https://doi.org/10.1016/B978-0-12-814182-3.00025-0 SP - 481 EP - 509 PB - Elsevier CY - Amsterdam AN - OPUS4-50187 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - GEN A1 - Recknagel, Christoph A1 - Alte-Teigeler, R. A1 - Bergmann, F.-J. A1 - Gebhards, G. A1 - Grabe, W. A1 - Guse, J. A1 - Hartel, S. A1 - Huth, P. A1 - Jannicke, B. A1 - Lobach, T. A1 - Schneider, T. A1 - Sondermann, E. A1 - Vengels, D. A1 - Voß, M. A1 - Willand, E. ED - Roßbach, W. T1 - Zusätzliche Technische Vertragsbedingungen und Richtlinien für Fugen in Verkehrsflächen ZTV Fug-StB 15 N2 - Unter Berücksichtigung praktischer und wissenschaftlich-technischer Erkenntnisse der letzten 15 Jahre - insbesondere auch auf der Basis verschiedener BAM-Forschungsergebnisse und Zulassungsverfahren - erfolgte eine Überarbeitung der Grundlagen, Bauprinzipien, Ausführungs- und Einbaukriterien sowie der Zulassungs- und Gütesicherungsmaßnahmen für insgesamt 4 Bauarten von Fugenfüllsystemen für hochbeanspruchte Verkehrsflächen. In diesem - für den Bundesfernstraßenbereich verbindlichen bautechnischen Regelwerk - finden insbesondere auch die Ergebnisse mehrerer wissenschaftlicher Vorhaben der BAM bezüglich labortechnischer Untersuchungen und Felduntersuchungen zum Funktionsverhalten und zur Dauerhaftigkeit erste baurechtliche Konsequenzen. Auf der Basis von Untersuchungen u.a. im Brückenbau wurden Regelungen für die Fugenausbildung in Asphalt und bei Befestigungskombinationen erarbeitet und umgesetzt. Damit konnten umfassende Regelungen für die maßgebenden Fahrbahnbeläge im Bundesfernstraßenbereich der Straßenbauverwaltung und ausführenden Industrieunternehmungen zur Verfügung gestellt werden. Die Neufassung dieser Regelungen dient darüber hinaus dem Ziel, den von der BAM vertretenen Wechsel hin zu einer performance-bezogenen Bewertungsmethodik, vorzubereiten. KW - Baustoffe KW - Fugen KW - Betonstraßen PY - 2015 SN - 978-3-86446-162-0 SP - 1 EP - 50 PB - FGSV Verlag GmbH CY - Köln AN - OPUS4-37220 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - GEN A1 - Recknagel, Christoph A1 - Alte-Teigeler, R. A1 - Bergmann, F.-J. A1 - Gebhards, G. A1 - Grabe, W. A1 - Guse, J. A1 - Hartel, S. A1 - Huth, P. A1 - Jannicke, B. A1 - Lobach, T. A1 - Schneider, T. A1 - Sondermann, E. A1 - Vengels, D. A1 - Voß, M. A1 - Willand, E. ED - Roßbach, W. T1 - Technische Lieferbedingungen für Fugenfüllstoffe in Verkehrsflächen TL Fug-StB 15 N2 - Nach mehr als 15-jähriger Anwendung und mit der zwischenzeitlichen Einführung europäisch harmonisierter Normen für Fugenmaterialien war eine Anpassung Qualitäts- und Gütesicherungsanforderungen für Fugenfüllungen im Bundesfernstraßenbereich erforderlich. Hierbei ging es insbesondere darum, Maßnahmen und Verfahren zu entwickeln, um das nationale Qualitäts- und Gütesicherungsniveau weiter zu entwickeln und weiterhin sicher stellen zu können. Nach den Untersuchungserfahrungen im Labor und im Feld ging darum, neuartige Material- und Stoffkombinationen qualitätssicher dem Bauprozess zur Verfügung stellen zu können. Erforderliche Anforderungskriterien und zulässige Toleranzen der Lieferqualität wurden neu gefasst. Es wurde ein Verfahren entwickelt, europäische Bauprodukte qualitätsgesichert in den Bauprozess im Bundesfernstraßenbericht zu überführen. KW - Baustoffe KW - Fugenfüllsysteme KW - Anforderungs- und Leistungsrichtlinien PY - 2015 SN - 978-3-86446-163-7 SP - 1 EP - 39 PB - FGSV Verlag GmbH CY - Köln AN - OPUS4-37221 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - GEN A1 - Rabin, Ira ED - Raggetti, L. T1 - Material Studies of Historic Inks: Transition from Carbon to Iron-Gall Inks N2 - This chapter offers observations and considerations concerning black writing inks encountered in writing supports transmitting documentary and literary texts of the late Antiquity and early Middle Ages. It discusses different types of inks, the Methods of their detection and their use in different times and geographical areas. KW - Material analysis KW - Writing inks KW - Ink fingerprint PY - 2021 U6 - http://nbn-resolving.de/urn/resolver.pl?urn:nbn:de:kobv:b43-528057 SP - 70 EP - 78 PB - Brill CY - Leiden AN - OPUS4-52805 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - GEN A1 - Nolze, Gert ED - Sen Gupta, S. P. ED - Chatterjee, P. T1 - PowderCell : a mixture between crystal structure visualizer, simulation and refinement tool N2 - The program PowderCell is a crystallographic tool for visualization of Crystal structures. However, it offers also non-conventional features like the fulautomatical generation of subgroups or the consideration of non-standard settings of space-group types. On the one Hand the program is very useful for non-crystallographers who like to get an impression of the atomic arrangement within the unit cell. But also for crystallographers it is recommendable because it contains a lot of additional information which can be extracted and used like data given in the International Tables for Crystallography, Vol. A. However, the most important advantage of the program is the simultaneous calculation of the X-ray or neutron diffraction powder patterns for a mixture of up to 10 crystalline phases. Between more than 7 different characteristic radiations can be chosen and their influence on the resulting powder pattern can be studied. Furthermore, experimental diffractograms can be analysed using a refinement procedure. The implemented LeBail-algorithm allows the investigation of unknown phases. In combination with the refinement algorithm an interface to Shelx offers the possibility for a step by step ab initio structure analysis. Certainly, the user-friendly shell is one reason that especially users who are not so familar with space-group symmetry, crystal structure data or diffractometry use this powerful tool for the solution of scientific or analytical problems as well as in teaching. KW - XRD KW - Simulation KW - Crystal structure KW - Neutron diffraction PY - 2002 SN - 8177642626 SN - 9788177642629 SP - 146 EP - 155 PB - Allied Publishers CY - Kolkata, India AN - OPUS4-38035 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER -