TY - CONF A1 - Müller, Bernd R. A1 - Kupsch, Andreas A1 - Laquai, René A1 - Nellesen, J. A1 - Tillmann, W. A1 - Kasperovich, G. A1 - Requena, G. A1 - Bruno, Giovanni T1 - Microstructure characterisation of advanced materials via 2D and 3D X-ray refraction techniques N2 - 3D imaging techniques have an enormous potential to understand the microstructure, its evolution, and its link to mechanical, thermal, and transport properties. In this conference paper we report the use of a powerful, yet not so wide-spread, set of X-ray techniques based on refraction effects. X-ray refraction allows determining internal specific surface (surface per unit volume) in a non-destructive fashion, position and orientation sensitive, and with a nanometric detectability. We demonstrate showcases of ceramics and composite materials, where microstructural parameters could be achieved in a way unrivalled even by high-resolution techniques such as electron microscopy or computed tomography. We present in situ analysis of the damage evolution in an Al/Al2O3 metal matrix composite during tensile load and the identification of void formation (different kinds of defects, particularly unsintered powder hidden in pores, and small inhomogeneity’s like cracks) in Ti64 parts produced by selective laser melting using synchrotron X-ray refraction radiography and tomography. T2 - THERMEC'2018 CY - Paris, France DA - 09.07.2018 KW - X-ray-refraction KW - Damage evolution KW - Additive manufacturing KW - Composites KW - Creep PY - 2018 AN - OPUS4-45572 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Laquai, René A1 - Müller, Bernd R. A1 - Schneider, J. A1 - Kupsch, Andreas A1 - Bruno, Giovanni T1 - Using SXRR to Probe the Nature of Discontinuities in SLM Additive Manufactured Inconel 718 Specimens JF - Metallurgical and Materials Transactions A N2 - The utilization of additive manufacturing (AM) to fabricate robust structural components relies on understanding the nature of internal anomalies or discontinuities, which can compromise the structural integrity. While some discontinuities in AM microstructures stem from similar mechanisms as observed in more traditional processes such as casting, others are unique to the AM process. Discontinuities in AM are challenging to detect, due to their submicron size and orientation dependency. Toward the goal of improving structural integrity, minimizing discontinuities in an AM build requires an understanding of the mechanisms of formation to mitigate their occurrence. This study utilizes various techniques to evaluate the shape, size, nature and distribution of discontinuities in AM Inconel 718, in a non-hot isostatic pressed (HIPed) as-built, non-HIPed and direct age, and HIPed with two step age samples. Non-destructive synchrotron radiation refraction and transmission radiography (SXRR) provides additional information beyond that obtained with destructive optical microscopy. SXRR was able to distinguish between voids, cracks and lack of melt in, due to its sensitivity to the orientation of the discontinuity. KW - Additive manufacturing KW - X-ray refraction radiography KW - INCONEL 718 KW - Selective laser melting PY - 2020 UR - https://nbn-resolving.org/urn:nbn:de:kobv:b43-509836 DO - https://doi.org/10.1007/s11661-020-05847-5 SN - 1543-1940 VL - 51 IS - 8 SP - 4146 EP - 4157 PB - Springer AN - OPUS4-50983 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Laquai, René A1 - Müller, Bernd R. A1 - Kasperovich, G. A1 - Requena, G. A1 - Haubrich, J. A1 - Bruno, Giovanni T1 - Classification of defect types in SLM Ti-6Al-V4 by X-ray refraction topography JF - Materials Performance and Characterization N2 - Porosity in additively manufactured materials, such as laser powder bed fusion Ti-Al6-V4, can play an important role in their mechanical performance. Not only the total porosity but also the shape/morphology of the individual pores need to be considered. Therefore, it is necessary to determine the distributions of different defect types (especially fusing defects and keyhole pores) and their dependence on process parameters. We show that synchrotron X-ray refraction radiography allows analysis of large samples (up to several millimeters) without compromising the detectability of submicrometer defects. Correspondingly, a classification tool is introduced that is able to quantitatively distinguish defects such as keyhole pores and binding defects with a confidence level of 94 %, even when the shape cannot be discerned because of limited spatial resolution. KW - Additive manufacturing KW - Selective laser melting KW - X-ray refraction KW - Microscopy KW - Porosity KW - X-ray computed tomography KW - BAMline KW - Synchrotron Radiation PY - 2020 DO - https://doi.org/10.1520/MPC20190080 SN - 2379-1365 VL - 9 IS - 1 SP - 82 EP - 93 PB - ASTM International CY - West Conshohocken, PA AN - OPUS4-50470 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER -