TY - CONF A1 - Knigge, Xenia A1 - Guo, Z. A1 - Valsami-Jones, E. A1 - Radnik, Jörg T1 - Characterization of sterilized nanoparticles by lab-based XPS and HAXPES N2 - The novel lab-based HAXPES spectrometer (ULVAC-PHI Quantes) gives us the possibility to measure XPS at 1486.6 eV (monochromatic Al Kα source) and HAXPES at 5414.9 eV (monochromatic Cr Kα source) on a sample at the same position. The surface analysis with this spectrometer leads to an information depth of about 10 nm for XPS and in comparison, to an analysis of deeper regions of about 30 nm for HAXPES measurements. This method provides a nondestructive way to distinguish between the near-surface region of the nanoparticles and the whole nanoparticle. Additionally, HAXPES gives access to deeper core levels at higher energy. An application of this technique is presented using nanoparticles. The results shown were obtained with nanoparticles, that were treated differently by means of sterilization for nanosafety (i.e., before studying their toxicity it is important to establish whether nanomaterials are sterile and, if not, to be treated either via microwave or autoclave sterilisation). As a complementary method, the data is compared with SEM and EDX measurements. All methods demonstrate the influence of sterilization. More specifically, these results show that the sterilization step must be considered in the physical-chemical description of the particles for establishing reliable (quantitative structure-activity) relationships. T2 - ECASIA 2022 CY - Limerick, Ireland DA - 29.05.2022 KW - XPS KW - HAXPES KW - Nanoparticles PY - 2022 AN - OPUS4-54968 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Chemello, Giovanni A1 - Radnik, Jörg A1 - Hodoroaba, Vasile-Dan T1 - Characterization of industrial graphene using HAXPES N2 - A comparative analysis is performed by XPS, HAXPES and SEM of industrial functionalised graphene powder of different morphology. The chemical analysis carried out by XPS, which probing depth is around 10nm, and HAXPES, which can reach up to 30nm probing depth. By combining these two techniques is possible to get a rough, non-destructive depth profiling of the sample's surface. The results show a higher concentration of the functionlisation elements on the surface of the sample and the influence of the morphology on the functionalisation process and the C/O ratio. T2 - SALSA Make and Measure 2022 CY - Berlin, Germany DA - 15.09.2022 KW - Graphene KW - XPS KW - HAXPES KW - SEM KW - Graphene funcionalisation PY - 2022 AN - OPUS4-55971 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Knigge, Xenia T1 - First Experiences with the new HAXPES@BAM N2 - This talk was part of the inauguration event for the new x-ray photoelectron spectrometer with the possibility to measure HAXPES (hard energy x-ray photoelectron spectroscopy). With HAXPES detailed chemical information can now be gained not only from the first outermost nanometres of the sample surface, but also from deeper regions. In this talk first results and experiences handling the spectrometer are shown. T2 - Inauguration of the HAXPES@BAM - A new Hard-X-Ray Photoelectron Spectrometer CY - Online meeting DA - 25.01.2022 KW - HAXPES KW - Nano@BAM KW - Surface Analysis KW - XPS PY - 2022 UR - https://www.bam.de/Content/EN/Events/2022/2022-01-25-hapex.html AN - OPUS4-54434 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Hodoroaba, Vasile-Dan A1 - Radnik, Jörg T1 - Surface Analysis and Context of the New HAXPES@BAM N2 - The Competence Centre nano@BAM is presenting a new X-ray Photoelectron Spectrometer – the HAXPES (XPS at hard energy) – for researching advanced materials at the nanoscale. With HAXPES detailed chemical information can now be gained not only from the first outermost nanometres of the sample surface, but also from deeper regions. Top international experts will share their knowledge and key findings on how to utilise HAXPES for exploring the surface of various advanced materials. Following the lectures, we will show you a short demo of the new instrument and answer your questions. T2 - Inauguration of the HAXPES@BAM - A new Hard-X-Ray Photoelectron Spectrometer CY - Online meeting DA - 25.01.2022 KW - XPS KW - HAXPES KW - Nano@BAM KW - Surface Analysis PY - 2022 UR - https://www.bam.de/Content/EN/Events/2022/2022-01-25-hapex.html AN - OPUS4-54377 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Knigge, Xenia A1 - Radnik, Jörg T1 - 1-Propyl-3-methyl-imidazolium bis(trifluoromethylsulfonyl)imide (Solarpur®) analyzed by hard x-ray photoelectron spectroscopy N2 - 1-Propyl-3-methyl-imidazolium bis(trifluoromethylsulfonyl)imide (Solarpur®), an ionic liquid was purchased from Merck (formerly Sigma Aldrich), was analyzed using hard x-ray photoelectron spectroscopy (HAXPES). The liquid is UHV stable, vertically and laterally homogeneous, and is easy to clean; thus, it can be used as a reference material. The HAXPES spectra of Solarpur® obtained using monochromatic Cr Kα radiation at 5414.8 eV include a survey scan, high-resolution spectra of C 1s, O 1s, N 1s, S 2p, S 1s, S 2s, F 1s, and S KLL. KW - HAXPES KW - Hard x-ray photoelectron spectroscopy KW - Ionic liquid KW - Solarpur PY - 2021 U6 - https://doi.org/10.1116/6.0001414 VL - 28 IS - 2 SP - 1 EP - 8 PB - AVS: Science & Technology of Materials, Interfaces, and Processing AN - OPUS4-54113 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Chemello, Giovanni A1 - Radnik, Jörg A1 - Hodoroaba, Vasile-Dan T1 - Analysis of Industrial Graphene-Based Flakes – First Results on Morphological Characterization, Sample Preparation and Chemical Composition N2 - In order to bridge the gap between lab-scale and industrial-scale production of graphene it is necessary to develop processes, equipment and measurement procedures to control the material features. One of the crucial reasons of graphene’s limited commercialization is the lack of standard procedures to properly characterize and define the material chemical and structural properties down to the nanometer level. This leads to many issues regarding material synthesis repeatability, inappropriateness choice of measurands and measurement reproducibility which heavily affect the consistency of the material performance. In our study, a comparative analysis is performed on two different series (G5 and G6) of industrial graphene powders, each series produced with four types of functionalization: raw graphene, oxygen-functionalized, nitrogen-functionalized and fluorine-functionalized. All the 8 sample variants were analyzed from a chemical and morphological point of view in the form of powders prepared as slightly pressed in metallic sample holders. The results of the comparative chemical analyses XPS and EDS show a good agreement in the concentration values for all the elements present in the samples, despite the different analysis volumes addressed by the two techniques. For this reason, the samples can be considered homogeneous in both lateral and vertical direction. A clear influence of the morphology on the composition is evident. Therefore, such correlative measurements of morphology and composition are necessary for a comprehensive characterization of industrial graphene flakes. KW - Graphene powder KW - XPS KW - HAXPES KW - SEM KW - EDS KW - Functionalized graphene PY - 2022 U6 - https://doi.org/10.1017/S1431927622004342 SN - 1435-8115 VL - 28 IS - Suppl 1 SP - 1006 EP - 1008 PB - Cambridge University Press CY - New York, NY AN - OPUS4-55512 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Knigge, Xenia A1 - Guo, Z. A1 - Valsami-Jones, E. A1 - Hodoroaba, Vasile-Dan A1 - Radnik, Jörg T1 - Influence of Sterilization on the Surface of Nanoparticles Studied with XPS / HAXPES in Comparison to SEM / EDS N2 - Nanosafety is becoming increasingly important as nanomaterials are widely used in industrial processes and consumer products. For nanotoxicity measurements prior sterilization of the samples is necessary, but as structure activity relationships are made with properties of pristine particles, the question arises, if the sterilization process has an impact on the physico-chemical properties of nanoparticles and thus on the biological behavior. This question will be addressed in this talk. For this purpose, results from SEM and EDS measurements are combined with those of a novel lab-based HAXPES spectrometer in order to obtain a more complete picture. At the end, an influence of sterilization will be evident, which indicates a restructuring of the nanoparticles owing to sterilization. T2 - Microscopy & Microanalysis 2022 CY - Portland, USA DA - 31.07.2022 KW - XPS KW - HAXPES KW - SEM KW - EDS KW - Nanoparticles PY - 2022 U6 - https://doi.org/10.1017/S1431927622004287 VL - 28 SP - 986 EP - 988 PB - Cambridge University Press AN - OPUS4-55352 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Knigge, Xenia A1 - Guo, Zhiling A1 - Valsami-Jones, Eugenia A1 - Hodoroaba, Vasile-Dan A1 - Radnik, Jörg T1 - Influence of Sterilization on the Surface of Nanoparticles Studied with XPS / HAXPES in Comparison to SEM / EDS N2 - Nanosafety is becoming increasingly important as nanomaterials are widely used in industrial processes and consumer products. For nanotoxicity measurements prior sterilization of the samples is necessary, but as structure activity relationships are made with properties of pristine particles, the question arises, if the sterilization process has an impact on the physico-chemical properties of nanoparticles and thus on the biological behavior. This question will be addressed in this talk. For this purpose, results from SEM and EDS measurements are combined with those of a novel lab-based HAXPES spectrometer in order to obtain a more complete picture. At the end, an influence of sterilization will be evident, which indicates a restructuring of the nanoparticles owing to sterilization. T2 - Microscopy & Microanalysis 2022 CY - Online meeting DA - 31.07.2022 KW - XPS KW - HAXPES KW - SEM KW - EDS KW - Nanoparticles PY - 2022 AN - OPUS4-55353 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Knigge, Xenia A1 - Radnik, Jörg T1 - 1,3-Dimethyl-imidazolium dimethyl phosphate ([MMIM]+[DMP]−) analyzed by XPS and HAXPES N2 - The ionic liquid 1,3-dimethyl-imidazolium-dimethylphosphate ([MMIM]+[DMP]−) was analyzed using (hard) x-ray photoelectron spectroscopy. Here, XPS and HAXPES spectra are shown in comparison. For the acquisition of the XPS spectra, monochromatic Al Kα radiation at 1486.6 eV was used, while for the acquisition of the HAXPES spectra, monochromatic Cr Kα radiation at 5414.8 eV was applied. Here, survey scans and high-resolution spectra of P 2p, P 2s, C 1s, O 1s, and N 1s for both methods and P 1s, P KL2,3L2,3, and P KL1L2,3 for HAXPES are shown. KW - C7H15N2O4P KW - [MMIM]+[DMP]− KW - Lonic liquid KW - Hard x-ray photoelectron spectroscopy KW - HAXPES KW - XPS PY - 2023 U6 - http://nbn-resolving.de/urn/resolver.pl?urn:nbn:de:kobv:b43-571604 VL - 30 IS - 1 SP - 1 EP - 20 PB - AIP Publishing AN - OPUS4-57160 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - GEN A1 - Knigge, Xenia A1 - Radnik, Jörg T1 - Physico-chemical characterization of sterile citrated stabilized Au nanoparticles by XPS / HAXPES / SEM N2 - Here a dataset of XPS, HAXPES and SEM measurements for the physico-chemical characterization of Au nanoparticles is presented. The measurements are part of the H2020 project “NanoSolveIT”. KW - HAXPES KW - XPS KW - SEM KW - Au Nanoparticles KW - NanoSolveIT PY - 2023 U6 - https://doi.org/10.5281/zenodo.7990250 PB - Zenodo CY - Geneva AN - OPUS4-57763 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER -