TY - CONF A1 - Klingelhöffer, Hellmuth T1 - Demands for improvement of temperature stability of extensometers N2 - Thermal fluctuations do exist at extensometers but they remain quite often unknown because the temperature of the extensometer is not measured, recorded and assessed in strain controlled tests. The temperature fluctuation leads to thermal expansion of the gauge length of the extensometer resulting in force fluctuations as a materials response of the material tested in a strain controlled test. The thermal expansion leads to an error of the strain range applied. A case study was conducted to calculate the strain range error when the strain range was varied as well as the thermal fluctuation of the extensometer. The most important outcome of the study is that the strain range error can exceed the allowed limits if the thermal fluctuation of the extensometer is too high. Sources of thermal fluctuation of the extensometer were analyzed and identified. Suggestions are given to reduce the thermal fluctuation of the extensometer. T2 - LCF8 CY - Dresden, Germany DA - 27.06.2017 KW - Accuracy KW - Strain error KW - Temperature fluctuation KW - Extensometer PY - 2017 SN - 978-3-9814516-5-8 SP - 227 EP - 232 PB - DVM CY - Berlin AN - OPUS4-40888 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Pauw, Brian Richard A1 - Smith, A. J. A1 - Snow, T. A1 - Terril, N. J. A1 - Thünemann, Andreas T1 - The modular small-angle X-ray scattering data correction sequence N2 - Data correction is probably the least favourite activity amongst users experimenting with small-angle X-ray scattering: if it is not done sufficiently well, this may become evident only during the data analysis stage, necessitating the repetition of the data corrections from scratch. A recommended comprehensive sequence of elementary data correction steps is presented here to alleviate the difficulties associated with data correction, both in the laboratory and at the synchrotron. When applied in the proposed order to the raw signals, the resulting absolute scattering cross section will provide a high degree of accuracy for a very wide range of samples, with its values accompanied by uncertainty estimates. The method can be applied without modification to any pinhole-collimated instruments with photon-counting direct-detection area detectors. KW - Small-angle X-ray scattering KW - SAXS KW - Accuracy KW - Methodology KW - Data correction PY - 2017 UR - https://nbn-resolving.org/urn:nbn:de:kobv:b43-432114 DO - https://doi.org/10.1107/S1600576717015096 SN - 1600-5767 VL - 50 IS - 6 SP - 1800 EP - 1811 PB - International Union of Crystallography AN - OPUS4-43211 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER -