TY - CONF A1 - Serrano Munoz, Itziar A1 - Laquai, René A1 - Müller, Bernd R. A1 - Mishurova, Tatiana A1 - Thiede, Tobias A1 - Bruno, Giovanni T1 - Microstructural characterization of the influence of SLM scan parameters by means of X ray and neutrons sources N2 - An overview of the main Non-Destructive activities conducted at BAM for the microstructural characterization of Additive Manufacturing (AM) materials will be presented. Focus is made on the study of the influence of Selective Laser Melted (SLM) scan strategies on the defect population of a Ti-6Al-4V alloy using the Analyzer Based Imaging (ABI) technique available at the BAMline (BESSY II synchrotron facility). ABI technique takes advantage of X Ray refraction at interfaces to enable the determination of porosity features (orientation, homogeneity, etc.) within large volumes, otherwise not possible to image by means X ray micro Computed Tomography. Additionally, for a SLM IN718 material, Energy Dispersive X Ray Diffraction (subsurface measurements at 100 µm depth) and neutrons diffraction (internal measurements at 3 mm depth) are combined with distortion measurements to produce a 3D description of the Residual Stress distribution throughout the entire sample. T2 - TMS (The Minerals, Metals & Materials Society) CY - Gaithersburg, Maryland, USA DA - 18.06.2018 KW - X-Ray refraction KW - Selective laser melted materials KW - Energy dispersive X Ray diffraction KW - Neutrons diffraction PY - 2018 AN - OPUS4-45435 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER -