TY - JOUR A1 - Fantin, Andrea A1 - Lepore, G. O. A1 - Widom, M. A1 - Kasatikov, S. A1 - Manzoni, Anna Maria T1 - How Atomic Bonding Plays the Hardness Behavior in the Al–Co–Cr–Cu–Fe–Ni High Entropy Family N2 - A systematic study on a face‐centered cubic‐based compositionally complex alloy system Al–Co–Cr–Cu–Fe–Ni in its single‐phase state is carried out, where a mother senary compound Al₈Co₁₇Cr₁₇Cu₈Fe₁₇Ni₃₃ and five of its suballoys, obtained by removing one element at a time, are investigated and exhaustively analyzed determining the contribution of each alloying element in the solid solution. The senary and the quinaries are compared using experimental techniques including X‐ray absorption spectroscopy, X‐ray diffraction, transmission electron microscopy, and first principles hybrid Monte Carlo/molecular dynamics simulations. Chemical short‐range order and bond length distances have been determined both at the experimental and computational level. Electronic structure and local atomic distortions up to 5.2 Å have been correlated to the microhardness values. A linear regression model connecting hardness with local lattice distortions is presented. KW - High entropy alloys KW - EXAFS KW - Short-range order KW - Microhardness KW - Alloy design KW - Transmission electron microscopy KW - Lattice distortion PY - 2023 UR - https://nbn-resolving.org/urn:nbn:de:kobv:b43-593333 DO - https://doi.org/https://doi.org/10.1002/smsc.202300225 SN - 2688-4046 SP - 1 EP - 12 PB - Wiley CY - Weinheim AN - OPUS4-59333 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - WójciaK, K. A1 - Tokarski, T. A1 - Cios, G. A1 - Winkelmann, A. A1 - Chulist, R. A1 - Nolze, G. T1 - Unconventional Applications of Electron Backscattering Diffraction (EBSD) in Metallic Materials N2 - Electron backscattered diffraction is widely used for phase and orientation imaging of crystalline specimens. Despite the inherent complexity of diffraction images, current analysis methodologies typically focus on the position of Kikuchi bands or direct comparisons between experimental and simulated patterns. These approaches require prior knowledge of the phases to be analyzed, limiting their applicability in certain scenarios. This paper introduces an alternative methodology, crystallographic analysis of lattice metric, which extracts phase and orientation information directly from the registered diffraction pattern without requiring predefined standards. The paper outlines the methodology, discusses limitations, and demonstrates possible application in phase analysis, lattice parameter ratio mapping, and qualitative lattice distortion mapping. KW - EBSD KW - Virtual dark-field imaging KW - Lattice distortion PY - 2025 UR - https://nbn-resolving.org/urn:nbn:de:kobv:b43-656014 DO - https://doi.org/10.24425/amm.2025.156241 VL - 70 IS - 4 SP - 1619 EP - 1626 AN - OPUS4-65601 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER -