TY - JOUR A1 - Nolze, Gert A1 - Tokarski, T. A1 - Rychlowski, L. T1 - Use of electron backscatter diffraction patterns to determine the crystal lattice. Part 2. Offset corrections N2 - A band width determination using the first derivative of the band profile systematically underestimates the true Bragg angle. Corrections are proposed to compensate for the resulting offset Δa/a of the mean lattice parameters derived from as many Kikuchi band widths as possible. For dynamically simulated Kikuchi patterns, Δa/a can reach up to 8% for phases with a high mean atomic number Z, whereas for much more common low-Z materials the offset decreases linearly. A predicted offset Δa/a = f(Z) is therefore proposed, which also includes the unit-cell volume and thus takes into account the packing density of the scatterers in the material. Since Z is not always available for unknown phases, its substitution by Zmax, i.e. the atomic number of the heaviest element in the compound, is still acceptable for an approximate correction. For simulated Kikuchi patterns the offset-corrected lattice parameter deviation is Δa/a < 1.5%. The lattice parameter ratios, and the angles α, β and γ between the basis vectors, are not affected at all.1.5%. The lattice parameter ratios, and the angles � , � and � between the basis vectors, are not affected at all. KW - Mean atomic number KW - Kikuchi patterns KW - Lattice parameters KW - Automated Bragg angle determination KW - Lattice parameter determination PY - 2023 U6 - http://nbn-resolving.de/urn/resolver.pl?urn:nbn:de:kobv:b43-573153 SN - 0021-8898 VL - 56 IS - Pt. 2 SP - 361 EP - 366 AN - OPUS4-57315 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER -