TY - CONF A1 - Güttler, Arne A1 - Richter, Maria A1 - Würth, Christian A1 - Resch-Genger, Ute T1 - New Reference Materials for the Quantification and Standardization of Fluorescence-based Measurements N2 - Luminescence techniques are amongst the most commonly used analytical methods in the life and material sciences due to their high sensitivity and non-destructive and multiparametric character. Photoluminescence signals are, however, affected by wavelength-, polarization-, and time-dependent instrument specific effect and the compound-specific photoluminescence quantum yield. The former hamper the comparability of fluorescence measurements, while the relative determination of the latter requires suitable quantum yield standards with well-known photoluminescence quantum yields (QY). For the simple correction of instrument specific effects in the wavelength region of 300 nm to 950 nm, the set of the five certified spectral fluorescence standards BAM-F001 – BAM-F005, has been extended to the NIR range by including two new fluorescence standards currently under certification. For the reliable and accurate determination of QY which is the key performance parameter for the comparison of different luminophores, we certified a set of 12 quantum yield standards, which absorb and emit in the wavelength range from 300 nm to 1000 nm. T2 - Methods and Applications in Fluorescence CY - Gothenburg, Sweden DA - 11.09.2022 KW - Luminescence KW - Photoluminescence KW - Fluorescence KW - Quantum yield KW - Certified reference material KW - Standard PY - 2022 AN - OPUS4-55914 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Resch-Genger, Ute A1 - Pauli, J. A1 - Güttler, Arne A1 - Richter, Maria A1 - Fiedler, Saskia A1 - Frenzel, Florian A1 - Wegner, Karl David A1 - Würth, Christian T1 - Photoluminescence Quantum Yields of Luminescent Nanocrystals and Particles in the UV/vis/NIR/SWIR N2 - The rational design of functional luminescent materials such as semiconductor quantum dots and lanthanide-based upconversion nanoparticles, all photophysical and mechanistic studies, and the comparison of different emitters require accurate and quantitative photoluminescence measurements. Particularly the reliable determination of the key performance parameter photoluminescence quantum yield (f), the number of emitted per absorbed photons, and the brightness are of special importance for luminescence applications in the life and material sciences and nano(bio)photonics.[1] In this context, examples for absolute measurements of the photoluminescence quantum yields of UV/vis/NIR/SWIR emissive semiconductor quantum dots and rods, made from different materials, and spectrally shifting lanthanide upconversion nanocrystals with different surface chemistries in transparent matrices are presented including excitation wavelength and power density dependent studies utilizing integration sphere spectroscopy.[2,3] In addition, procedures for the absolute determination of the photoluminescence quantum yields of scattering dispersions of larger size quantum rods and differently sized inorganic particles have been developed as well as procedures for the characterization of solid luminescent nanomaterials such as different perovskites and YAG:Cer converter materials.[4] Thereby, challenges and pitfalls of f measurements in different wavelength regions including the SWIR and material-specific effects related to certain emitter classes are addressed, achievable uncertainties are quantified, and relative and absolute measurements of photoluminescence quantum yield measurements are compared to underline limitations of the former approach. Finally, a set of novel UV/vis/NIR quantum yield standards is presented including their certification with a complete uncertainty budget.[5] T2 - NANAX 10 CY - Klosterneuburg, Austria DA - 03.07.2023 KW - Fluorescence KW - Optical spectroscopy KW - Reference data KW - Traceability KW - NIR KW - Scattering KW - Reference material KW - Certification KW - Quality assurance KW - Dye KW - Reference product KW - SWIR KW - Nano KW - Particle KW - Perovskite KW - Integrating sphere spectroscopy KW - Quantum yield PY - 2023 AN - OPUS4-58238 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Resch-Genger, Ute A1 - Giovannozzi, A. A1 - Rossi, A. A1 - Kovac, J. A1 - Ekar, J. A1 - Goenaga-Infante, H. A1 - Clarkson, C. A1 - Clifford, C. A1 - Cant, D. A1 - Minelli, C. A1 - Reithofer, M. A1 - Lindner, G. A1 - Venzago, C. A1 - Bohmer, N. A1 - Drexler, C.-P. A1 - Schedler, U. A1 - Thiele, T. A1 - Lechart, F. A1 - Kästner, B. A1 - Sjövall, P. A1 - Johnston, L. A1 - Tan, Gunnar A1 - Radnik, Jörg T1 - Standardised Measurements of Surface Functionalities on Nanoparticles N2 - Engineered nanoparticles (NPs) with various chemical compositions and surface functionalities are routinely fabricated for industrial applications such as medical diagnostics, drug delivery, sensing, catalysis, energy conversion and storage, opto-electronics, and information storage which improve the quality of life and European prosperity. NP function, performance, interaction with biological species, and environmental fate are largely determined by their surface functionalities. Standardized repeatable surface characterization methods are therefore vital for quality control of NPs, and to meet increasing concerns regarding their safety. Therefore, industry, regulatory agencies, and policymakers need validated traceable measurement methods and reference materials. This calls for fit-for-purpose, validated, and standardized methods, and reference data and materials on the surface chemistry of engineered NPs. Here, we present a concept for the development of such standardized measurement protocols utilizing method cross-validation and interlaboratory comparisons (ILCs) with emphasis on both advanced measurement methods such as quantitative Nuclear Magnetic Resonance (qNMR), X-ray photoelectron spectroscopy (XPS) and secondary ion mass spectrometry (SIMS) and cost-efficient, non-surface specific methods like optical assays and electrochemical titration methods. T2 - European Partnership on Metrology 2023 Review Conference CY - Amsterdam, Netherlands DA - 07.11.2023 KW - Surface chemistry KW - Quality assurance KW - Traceability PY - 2023 AN - OPUS4-59142 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER -