TY - CONF A1 - Resch-Genger, Ute T1 - Reliable Photoluminescence Quantum Yields – New Reference Materials and Interlaboratory Comparisons N2 - The rational design and choice of molecular and nanoscale reporters, the comparison of different emitter classes, and photophysical and mechanistic studies require quantitative photoluminescence measurements and the reliable determination of the key performance parameter photoluminescence quantum yield (QY), i.e., the number of emitted per absorbed photons. This is of special importance for all photoluminescence applications in the life and material sciences in the UV/vis/NIR/SWIR. To improve the reliability and comparability of photoluminescence and QY measurements across laboratories, pitfalls, achievable uncertainties, and material-specific effects related to certain emitter classes must be explored. Also, suitable protocols and reference materials are needed which have been validated in interlaboratory comparisons for different wavelength regions and transparent and scattering luminophores.[1] Based on absolute and relative photoluminescence measurements of functional dyes and luminescent nanomaterials, reliable methods for determining QY of transparent and scattering luminophores, nonlinear emitters, and solid luminescent nanomaterials have been developed.[1-4] Thereby, material- and method-related uncertainties of relative and absolute QY measurements and achievable uncertainties could be quantified for linear and nonlinear UV/vis/NIR/SWIR emitters and lately for also luminescent and scattering materials and solid phoshors. In this context, we present the development and certification of a first set of UV/vis/NIR quantum yield standards with a complete uncertainty budget,[5] which present simple tools for a better comparability of QY measurements. In addition, a first interlaboratory comparison of absolute QY measurements of solid and scattering LED converter materials with integrating sphere spectroscopy has been performed.[5] The outcome of this study is presented, thereby addressing common pitfalls and measurement uncertainties and providing recommendations for the performance of reliable QY measurements of linear and non-linear emitters in transparent, scattering, and solid samples. T2 - Anakon 2025 CY - Leipzig, Germany DA - 10.03.2025 KW - Quality assurance KW - Reference material KW - Method KW - Fluorescence KW - Quantum yield KW - Absolute KW - Integrating sphere spectroscopy KW - Interlaboratory comparison KW - Dye KW - Film KW - Nano KW - Particle KW - Scattering KW - Uncertainty KW - LED converter PY - 2025 AN - OPUS4-62792 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Resch-Genger, Ute A1 - Fallisch, A. A1 - Petrov, E. P. A1 - Salhany, R. A1 - Forthman, C. A1 - Guttenberg, Z. A1 - Nitschke, R. T1 - Spectral fluorescence standards for the calibration and performance validation of fluorescence microscopes N2 - The standardization and calibration of fluorescence microscopy have become increasingly vital due to the wide-spread use of in life and materials sciences. As the demand for reliable and user-friendly methods to assess micro-scope performance grows, universal calibration tools accessible to both researchers and vendors are needed. To support the standardization of characterization methods in microscopy, it is crucial to provide calibration tools together with standardized operating procedures for their effective implementation. The public-funded project "FluMiKal"* develops calibration tools in the shape of typical microscopic slides to assess key parameters such as spatial resolution, point spread function, spectral sensitivity, linearity and sensitivity of the detection system. The focus is on creating calibration tools that are user-friendly, robust, and versatile in their application. This work addresses the critical parameter of wavelength-dependent spectral sensitivity, which affects the meas-ured signals from the instrument side, yielding instrument-specific data and instrument aging-induced changes over time. For this purpose, μ-slides from ibidi with six channels are used, allowing them to be filled with different solutions containing molecular or nanoscale fluorophores with well-characterized absorption and fluorescence properties. The certified spectral fluorescence standards BAM-F003, F004, F005, and F007 assessed provided as ethanolic solutions by the Federal Institute for Materials Research and Testing (BAM), cover a broad spectral range from the blue to the near-infrared [1], [2]. Dye-based slide prototypes have been used to determine the spectral sensitivity of confocal microscopes from different vendors with various detector types by acquiring the spectral data of the BAM dyes under standardized measurement conditions, demonstrating the applicability of this concept. Proof-of-concept experiments could demonstrate the proper sealing of the slides. Further experiments will explore long-term stability and their potential as standards for relative intensity calibrations. * FluMiKal is funded by the Federal Ministry for Economic Affairs and Climate Action, Germany (WIPANO FKZ 03TN0047B) [1] doi: 10.1007/4243_2008_028. [2] doi: 10.1007/s00216-024-05723-w. T2 - European Light Microscopy Initiative - ELMI 2025 CY - Heidelberg, Germany DA - 03.06.2025 KW - Fluorescence KW - Advanced material KW - Validation KW - Calibration KW - Method comparison KW - Reference material KW - Dye KW - Fluorescence standard KW - Microscopy KW - CLSM KW - Imaging PY - 2025 AN - OPUS4-64206 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Tavernaro, Isabella A1 - Sander, P. A1 - Andresen, Elina A1 - Schedler, U. A1 - Resch-Genger, Ute T1 - Potentiometric and Optical Titration for Cost- Efficient Quantification of Surface Functional Groups on Silica Nanoparticles N2 - Surface chemistry of engineered nanomaterials (NMs) plays a critical role not only in determining their interactions with the environment but also in their stability, safety, and functionality across diverse applications ranging from catalysis to biomedicine. Accurate quantification of surface functional groups (FGs) is therefore essential for quality control, risk assessment, and performance optimization.[1] However, many existing analytical techniques are either cost-intensive, require specialized instrumentation, or lack scalability for routine use. In this study, we present a comparative evaluation of potentiometric and optical titration as two simple, cost-efficient, and automatable methods for quantifying surface functional groups on a variety of surface-modified silica nanoparticles (SiO₂ NPs). These NPs were chosen as they are among the most frequently utilized engineered NMs in the life and material sciences. Potentiometric titration, based on pH monitoring during acid-base neutralization, offers a direct and label-free approach to determine the total amount of FGs. Optical titration provides a complementary method with potential for high-throughput screening. To examine the accuracy and robustness of our stepwise-optimized workflows and the achievable relative standard deviations (RSDs), measurements were performed by multiple operators in two laboratories. Method validation was conducted through cross-comparison with traceable, chemo-selective quantitative nuclear magnetic resonance spectroscopy (qNMR) and thermogravimetric analysis (TGA). A comparison with optical assays highlights the importance of measuring both quantities for comprehensive characterization of surface-modified NMs.[2] A combined NM surface analysis using optical assays and pH titration will simplify quality control of NM production processes and stability studies, and can yield large datasets for NM grouping in sustainable and safe(r)-by-design studies. T2 - eMRS Fall Meeting 2025 CY - Warsaw, Poland DA - 15.09.2025 KW - Fluorescence KW - Advanced material KW - Synthesis KW - Characterization KW - Nano KW - Particle KW - Silica KW - Surface analysis KW - Validation KW - qNMR KW - Fluram assay KW - Functional group KW - Quantification KW - Potentiometry KW - Amino groups KW - Fluorescamine KW - Calibration KW - Method comparison PY - 2025 AN - OPUS4-64205 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Güttler, Arne A1 - Richter, Maria A1 - Würth, Christian A1 - Resch-Genger, Ute T1 - New Reference Materials for the Quantification and Standardization of Fluorescence-based Measurements N2 - Luminescence techniques are amongst the most commonly used analytical methods in the life and material sciences due to their high sensitivity and non-destructive and multiparametric character. Photoluminescence signals are, however, affected by wavelength-, polarization-, and time-dependent instrument specific effect and the compound-specific photoluminescence quantum yield. The former hamper the comparability of fluorescence measurements, while the relative determination of the latter requires suitable quantum yield standards with well-known photoluminescence quantum yields (QY). For the simple correction of instrument specific effects in the wavelength region of 300 nm to 950 nm, the set of the five certified spectral fluorescence standards BAM-F001 – BAM-F005, has been extended to the NIR range by including two new fluorescence standards currently under certification. For the reliable and accurate determination of QY which is the key performance parameter for the comparison of different luminophores, we certified a set of 12 quantum yield standards, which absorb and emit in the wavelength range from 300 nm to 1000 nm. T2 - Methods and Applications in Fluorescence CY - Gothenburg, Sweden DA - 11.09.2022 KW - Luminescence KW - Photoluminescence KW - Fluorescence KW - Quantum yield KW - Certified reference material KW - Standard PY - 2022 AN - OPUS4-55914 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Resch-Genger, Ute T1 - Measurements of Photoluminescence Quantum Yields of Scattering LED Converter Materials N2 - How to Get it Right with the Absolute Measurement of Photoluminescence Quantum Yields of Scattering LED Converter Materials Saskia Fiedler+,a, Florian Frenzel+,a, Christian Würth a, Isabella Tavernaro a, Michelle Grüne c, Stefan Schweizer c,d, Axel Engel e, and Ute Resch-Genger a* a Division Biophotonics, Federal Institute for Materials Research and Testing (BAM), Richard-Willstaetter-Strasse 11, D-12489 Berlin, Germany; email: ute.resch@bam.de b Present address: Photonic Materials, NWO-Institute AMOLF, Science Park 104, 1098 XG Amsterdam, The Netherlands c Faculty of Electrical Engineering, South Westphalia University of Applied Sciences, Lübecker Ring 2, 59494, Soest, Germany d Fraunhofer Application Center for Inorganic Phosphors, Branch Lab of Fraunhofer Institute for Microstructure of Materials and Systems IMWS, Lübecker Ring 2, 59494, Soest, Germany e Schott AG Technical Services, Hattenbergstrasse 10, D-55122 Mainz, Germany Optical measurements of scattering materials such as luminescent nano- and microparticles and phosphors dispersed in liquid and solid matrices play an important role in energy conversion, solid-state lighting, medical diagnostics, and security barcoding. A key performance parameter is the photoluminescence quantum yield QY, i.e., the number of emitted per number of absorbed photons. QY of transparent luminophore solutions can be obtained relative to a fluorescence QY standard of known QY, meanwhile available as certified reference materials.[1] The determination of QY of scattering liquid and solid samples like nanoparticle dispersions, phosphors, and optoceramics requires, however, absolute measurements with an integrating sphere setup. Despite the need for reliable absolute QY measurements, no interlaboratory comparison (ILCs) on measurement uncertainties has been performed and scattering standards with known QY are not available. We present the results of an ILC of 3 labs from academia and industry on measurements of transparent and scattering dye solutions and solid phosphors and converter materials like YAG:Ce optoceramics with commercial stand-alone integrating sphere setups of different illumination and detection geometries. Special emphasis was dedicated to the influence of measurement geometry, optical properties of the blank for determining the number of incident photons absorbed by the sample, and sample-specific surface roughness. Matching QY values could be obtained for transparent dye solutions and scattering dispersions with a blank with scattering properties closely matching those of the sample, QY measurements of optoceramic samples with different blanks revealed substantial differences of more than 20 %. Based on our data, we recommend non-absorbing blank materials with a high reflectivity (>95 %) such as a 2 mm-thick PTFE target placed on the sample holder as blanks. T2 - eMRS CY - Strasbourg, France DA - 26.05.2025 KW - Quality assurance KW - Fluorescence KW - Nano KW - Particle KW - Quantum yield KW - NIR KW - Characterization KW - Electron microscopy KW - Film KW - Integrating sphere spectroscopy KW - Calibration KW - Lifetime KW - Advanced materials KW - LED converter KW - YAG:Ce KW - ILC KW - Measurement uncertainty KW - Absolute quantum yield PY - 2025 AN - OPUS4-63327 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Resch-Genger, Ute A1 - Pauli, J. A1 - Güttler, Arne A1 - Richter, Maria A1 - Fiedler, Saskia A1 - Frenzel, Florian A1 - Wegner, Karl David A1 - Würth, Christian T1 - Photoluminescence Quantum Yields of Luminescent Nanocrystals and Particles in the UV/vis/NIR/SWIR N2 - The rational design of functional luminescent materials such as semiconductor quantum dots and lanthanide-based upconversion nanoparticles, all photophysical and mechanistic studies, and the comparison of different emitters require accurate and quantitative photoluminescence measurements. Particularly the reliable determination of the key performance parameter photoluminescence quantum yield (f), the number of emitted per absorbed photons, and the brightness are of special importance for luminescence applications in the life and material sciences and nano(bio)photonics.[1] In this context, examples for absolute measurements of the photoluminescence quantum yields of UV/vis/NIR/SWIR emissive semiconductor quantum dots and rods, made from different materials, and spectrally shifting lanthanide upconversion nanocrystals with different surface chemistries in transparent matrices are presented including excitation wavelength and power density dependent studies utilizing integration sphere spectroscopy.[2,3] In addition, procedures for the absolute determination of the photoluminescence quantum yields of scattering dispersions of larger size quantum rods and differently sized inorganic particles have been developed as well as procedures for the characterization of solid luminescent nanomaterials such as different perovskites and YAG:Cer converter materials.[4] Thereby, challenges and pitfalls of f measurements in different wavelength regions including the SWIR and material-specific effects related to certain emitter classes are addressed, achievable uncertainties are quantified, and relative and absolute measurements of photoluminescence quantum yield measurements are compared to underline limitations of the former approach. Finally, a set of novel UV/vis/NIR quantum yield standards is presented including their certification with a complete uncertainty budget.[5] T2 - NANAX 10 CY - Klosterneuburg, Austria DA - 03.07.2023 KW - Fluorescence KW - Optical spectroscopy KW - Reference data KW - Traceability KW - NIR KW - Scattering KW - Reference material KW - Certification KW - Quality assurance KW - Dye KW - Reference product KW - SWIR KW - Nano KW - Particle KW - Perovskite KW - Integrating sphere spectroscopy KW - Quantum yield PY - 2023 AN - OPUS4-58238 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Resch-Genger, Ute T1 - Standardised Measurements of Surface Functionalities on Nanoparticles N2 - Engineered nanoparticles (NPs) with various chemical compositions and surface functionalities are routinely fabricated for industrial applications such as medical diagnostics, drug delivery, sensing, catalysis, energy conversion and storage, opto-electronics, and information storage which improve the quality of life and European prosperity. NP function, performance, interaction with biological species, and environmental fate are largely determined by their surface functionalities. Standardized repeatable surface characterization methods are therefore vital for quality control of NPs, and to meet increasing concerns regarding their safety. Therefore, industry, regulatory agencies, and policymakers need validated traceable measurement methods and reference materials. This calls for fit-for-purpose, validated, and standardized methods, and reference data and materials on the surface chemistry of engineered NPs. Here, we present a concept for the development of such standardized measurement protocols utilizing method cross-validation and interlaboratory comparisons (ILCs) with emphasis on both advanced measurement methods such as quantitative Nuclear Magnetic Resonance (qNMR), X-ray photoelectron spectroscopy (XPS) and secondary ion mass spectrometry (SIMS) and cost-efficient, non-surface specific methods like optical assays and electrochemical titration methods. T2 - European Partnership on Metrology 2023 Review Conference CY - Amsterdam, Netherlands DA - 07.11.2023 KW - Surface chemistry KW - Quality assurance KW - Traceability PY - 2023 AN - OPUS4-59142 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Resch-Genger, Ute T1 - Standardized Measurements of Surface - Functionalities on Nanoparticles N2 - Engineered nanoparticles (NPs) with various chemical compositions and surface functionalities are routinely fabricated for industrial applications such as medical diagnostics, drug delivery, sensing, catalysis, energy conversion and storage, optoelectronics, and information storage. NP function, interaction with biological species, and environmental fate are largely determined by surface functionalities. Reliable, reproducible, and standardized surface characterization methods are therefore vital for quality control of NPs, and mandatory to meet increasing concerns regarding their safety. Also, industry, international standardization organizations, regulatory agencies, and policymakers need validated and standardized measurement methods and reference materials. However, methodologies for determining NP surface properties, including the amount, chemical composition, and homogeneity of surface functionalities and coatings are largely non-standardized. Suitable methods for determining surface functionalities on ligand-stabilized core and core/shell NPs include advanced techniques such as traceable quantitative nuclear magnetic resonance (qNMR) as well as X-ray electron spectroscopy (XPS) and time of flight secondary ion mass spectrometry (ToF-SIMS), and simpler optical and electrochemical methods. The latter less costly methods are often used by SMEs, e.g., for quality control. To validate methods, establish measurement uncertainties, test reference materials, and produce reference data, international interlaboratory comparisons (ILC) on NP surface functionalization measurements are required and well characterized test and reference nanomaterials providing benchmark values.[1] These needs are addressed by the recently started European metrology project SMURFnano involving 12 partners from different National Metrology Institutes, designated institutes, and research institutes, two university groups as well as one large company and one SME producing NPs. This project as well as first results derived from the development of test and reference materials with a well characterized surface chemistry and ongoing interlaboratory comparisons will be presented. T2 - eMRS CY - Strasbourg, France DA - 27.05.2025 KW - Quality assurance KW - Fluorescence KW - Nano KW - Particle KW - Synthesis KW - Silica KW - Upconversion nanoparticles KW - Optical assay KW - qNMR KW - Surface analysis KW - Ligand KW - Quantification KW - Functional group KW - XPS KW - ToF-SIMS KW - Polymer particle KW - Surface modification KW - Potentiometry KW - Metrology KW - Method KW - Validation KW - ILC PY - 2025 AN - OPUS4-63339 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Resch-Genger, Ute T1 - Standardized Measurements of Surface Functionalities on Nanoparticles - F. Synthesis and characterization of functional nanocomposite materials N2 - Engineered nanoparticles (NPs) with various chemical compositions and surface functionalities are routinely and commonly fabricated for industrial applications such as medical diagnostics, drug delivery, sensing, catalysis, energy conversion and storage, opto-electronics, and information storage. NP function, their interaction with biological species, and also their environmental fate are largely determined by the surface functionalities of the particles. Reliable, reproducible, and standardized surface characterization methods are therefore vital for quality control of NPs, determination of their applicability, and mandatory to meet increasing concerns regarding their safety. In addition, industry as well as international standardization organizations, regulatory agencies, and policymakers need validated and standardized measurement methods and reference materials. However, methodologies for determining NP surface properties, including the amount, chemical composition, and homogeneity of surface functionalities and coatings are largely non-standardized up until now. Suitable methods for determining surface functionalities on ligand-stabilized core and core/shell NPs include advanced techniques such as traceable quantitative nuclear magnetic resonance (qNMR), as well as X-ray electron spectroscopy (XPS) and time of flight secondary ion mass spectrometry (ToF-SIMS), and simpler optical and electrochemical methods. The latter, typically less costly methods are often used by SMEs, e.g., for quality control. To validate methods, establish measurement uncertainties, test reference materials, and produce reference data, international interlaboratory comparisons (ILC) on NP surface functionalization measurements are required to provide well characterized test and reference nanomaterials including benchmark values.[1] These needs are addressed by the current European metrology project SMURFnano, involving 12 partners from different National Metrology Institutes, designated and research institutes, two university groups as well as one large company and one SME producing NPs. This project, as well as first results derived from the development of test and reference materials with a well characterized surface chemistry, and ongoing interlaboratory comparisons, will be presented. T2 - Shift 2025 CY - La Laguna, Tenerife DA - 13.10.2025 KW - Nano KW - Particle KW - Silica KW - Iron oxide KW - Lanthanide KW - Metrology KW - Quality assurance KW - Reference material KW - Surface chemistry KW - Size KW - Shape KW - Particle number concentration KW - Method KW - Optical assay KW - qNMR KW - Validation KW - Potentiometry KW - XPS KW - ILC KW - Standardization PY - 2025 AN - OPUS4-64370 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER -