TY - CONF A1 - Winkelmann, Aimo A1 - Nolze, Gert T1 - Orientation analysis of non-centrosymmetric crystal structures using electron backscatter diffraction T2 - Zeitschrift für Kristallographie N2 - Crystal structures that show a broken symmetry in their cubic and hexagonal modifications are of great relevance for optoelectronic and photonic applications. This is why methods which are sensitive to non-centrosymmetric structures are important for analysis of these materials in technological applications. T2 - 24th Annual Conference of the german Crystallographic Society CY - Stuttgart, Germany DA - 14.03.2016 KW - Electron backscatter diffraction KW - Non-centrosymmetry KW - Friedel's rule KW - Pattern matching KW - GaN KW - GaP PY - 2016 VL - 36 Supplement SP - 22 PB - Walter de Gruyter GmbH & Co KG AN - OPUS4-37743 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Winkelmann, Aimo A1 - Nolze, Gert T1 - Channeling-enhanced EDX for polarity resolved crystal orientation determination JF - Crystal Research and Technology N2 - Using channeling-enhanced energy-dispersive X-ray spectroscopy (EDX), we demonstrate polarity sensitive orientation determination of a non-centrosymmetric crystal in the scanning electron microscope. The authors observe a characteristic asymmetry in the channeling-enhanced, angle-dependent EDX data of a GaAs sample, which is in good agreement to simulations using the dynamical theory of diffraction for the incident electron beam. This allows us to assign the orientation of the GaAs crystal according to the non-centrosymmetric point group. The method shown here overcomes the limitation of a reduced point-group sensitivity of electron backscatter diffraction Patterns and electron channeling patterns for crystalline phases that contain atoms of approximately equal electron scattering cross sections. KW - Channeling KW - EDX KW - EDS KW - Composition KW - GaAs KW - GaP PY - 2016 DO - https://doi.org/10.1002/crat.201600258 SN - 0232-1300 SN - 0023-4753 VL - 51 IS - 12 SP - 752 EP - 756 AN - OPUS4-38098 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER -