TY - JOUR A1 - Pauli, Jutta A1 - Hoffmann, Katrin A1 - Würth, Christian A1 - Behnke, Thomas A1 - Resch-Genger, Ute T1 - Standardization of fluorescence measurements in the UV/vis/NIR/IR N2 - Photoluminescence techniques are amongst the most widely used Tools in the life sciences, with new and exciting applications in medical diagnostics and molecular Imaging continuously emerging. Advantages include their comparative ease of use, unique sensitivity, non-invasive character, and potential for Multiplexing, remote sensing, and miniaturization. General drawbacks are, however, signals, that contain unwanted wavelength- and polarization contributions from Instrument-dependent effects, which are also time-dependent due to aging of Instrument-components, and difficulties to measure absolute flourescence entensities. Moreover, scattering Systems require Special measurement geometries and the interest in new optical Reporters with Emission > 1000 nm strategies for reliable measurements in the second diagnostic for the comparison of material Performance and the rational designg of new flourophores with improved properties. Here, we present strategies to versatile method-adaptable liquid and solid flourescence Standards for different flourescence paramters including traceable Instrument calibration procedures and the design of integrating spere setups for the absolute measurements of emission spectra and Quantum yields in the wavelength Region of 350 to 1600 nm. Examples are multi-Emitter glasses, spectral flourescence Standards, and quantum yield Standards for the UV/vis/NIR. T2 - Conference on Molecular-Guided Surgery - Molecules, Devices, and Applications III CY - San Francisco, CA, USA DA - 28.01.2017 KW - Fluorescence KW - Reference material KW - Standard KW - Calibration KW - Nanoparticle KW - Absolute flourometry KW - Integrating sphere spectroscopy KW - NIR KW - IR KW - Quantum yield standard KW - Emission standards PY - 2017 SN - 978-1-5106-0539-8 U6 - https://doi.org/10.1117/12.2255728 SN - 0277-786X VL - 10049 SP - 1 PB - Proceedings of SPIE AN - OPUS4-41783 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER -