TY - JOUR A1 - Fritzsche, Sven A1 - Jaenisch, Gerd-Rüdiger A1 - Pavasaryte, Lina A1 - Funk, Alexander T1 - XCT and DLW: Synergies of Two Techniques at Sub-Micrometer Resolution JF - Applied Science N2 - Direct Laser Writing (DLW) and X-ray computed tomography (XCT) both offer unique possibilities in their respective fields. DLW produces full three-dimensional (3D) polymer structures on the microscale with resolutions below 100 nm. The fabricated structures can be analysed by XCT or X-ray microscopy (XRM), which incorporates additional X-ray lenses, in three dimensions down to a minimal basic spatial resolution of about 500 nm or 50 nm, respectively. In this work, two different DLW structures are analysed via XCT. Internal defects are detected and analysed for the purpose of quality control. Defects and structures with sizes down to 1.5 µm are successfully analysed. A 3D reconstruction and internal, hidden features of the fabricated structures are shown and discussed. In a first-of-its-kind study, we demonstrate the detectability of a single-voxel line inside a fabricated structure that would not be detectable with SEM or light microscopy. Furthermore, the direct fabrication on a PET substrate is shown to overcome the high X-ray absorbance of commonly used glass substrates. Attenuation spectra of SZ2080 and glass substrates are compared to a fabrication route direct on a 170 µm PET foil. The practical aspects of XCT measurements for DLW structures on different substrates will be discussed. KW - Non-destructive testing KW - Two-photon polymerization KW - X-ray microscopy KW - XCT KW - 2PP KW - Direct laser writing PY - 2022 UR - https://nbn-resolving.org/urn:nbn:de:kobv:b43-560525 DO - https://doi.org/10.3390/app122010488 VL - 12 IS - 20 SP - 1 EP - 15 PB - MDPI CY - Basel AN - OPUS4-56052 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Léonard, Fabien A1 - Zhang, Zhen A1 - Krebs, Holger A1 - Bruno, Giovanni T1 - Structural and Morphological Quantitative 3D Characterisation of Ammonium Nitrate Prills by X-ray Computed Tomography JF - Materials N2 - The mixture of ammonium nitrate (AN) prills and fuel oil (FO), usually referred to as ANFO, is extensively used in the mining industry as a bulk explosive. One of the major performance predictors of ANFO mixtures is the fuel oil retention, which is itself governed by the complex pore structure of the AN prills. In this study, we present how X-ray computed tomography (XCT), and the associated advanced data processing workflow, can be used to fully characterise the structure and morphology of AN prills. We show that structural parameters such as volume fraction of the different phases and morphological parameters such as specific surface area and shape factor can be reliably extracted from the XCT data, and that there is a good agreement with the measured oil retention values. Importantly, oil retention measurements (qualifying the efficiency of ANFO as explosives) correlate well with the specific surface area determined by XCT. XCT can therefore be employed non-destructively; it can accurately evaluate and characterise porosity in ammonium nitrate prills, and even predict their efficiency. KW - ANFO KW - Explosives KW - Surface area KW - Porosity KW - XCT KW - Data processing PY - 2020 UR - https://nbn-resolving.org/urn:nbn:de:kobv:b43-505395 DO - https://doi.org/10.3390/ma13051230 VL - 13 IS - 5 (Special Issue "Micro Non-Destructive Testing and Evaluation") SP - 1230 PB - MDPI AN - OPUS4-50539 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - GEN A1 - Léonard, Fabien T1 - Overview of XCT data processing workflow for ammonium nitrate prills quantitative analysis N2 - This video presents the data processing workflow that was developed to perform the quantitative structural and morphological analysis of ammonium nitrate prills by x-ray computed tomography. KW - ANFO KW - Data processing KW - Explosives KW - Porosity KW - Surface area KW - XCT PY - 2020 DO - https://doi.org/10.5281/zenodo.3611339 PB - Zenodo CY - Geneva AN - OPUS4-51897 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER -