TY - CONF A1 - Hodoroaba, Vasile-Dan A1 - Rühle, Bastian A1 - Bresch, Harald T1 - Competence Center nano@BAM Welcomes ISO/TC 229 Meeting in Berlin N2 - The Competence Center nano@BAM is presented. Examples directly related to the activities of the ISO Technical Committee TC 229 Nanotechnologies as well as BAM projects on nano reference measurement procedures, nano reference materials and nano reference data sets are showed. T2 - The 32nd ISO/TC 229 IEC/TC 113 JWG2 General Meeting CY - Berlin, Germany DA - 06.11.2023 KW - ISO/TC 229 Nanotechnologies KW - Nanoparticles KW - Nano@BAM KW - Reference materials KW - Reference data KW - Reference procedures PY - 2023 AN - OPUS4-58814 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Ávila Calderón, Luis Alexander A1 - Hammerschmidt, T. A1 - Gedsun, A. A1 - Forti, M. A1 - Olbricht, Jürgen A1 - Stotzka, R. A1 - Skrotzki, Birgit A1 - Shakeel, Y. A1 - Hunke, S. A1 - Tsybenko, H. A1 - Aversa, R. A1 - Chmielowski, M. A1 - Hickel, T. T1 - IUC02 Framework for Curation and Distribution of Reference Datasets using Creep Data of Ni-Base Superalloys as an Example N2 - In our current view, reference datasets in the MSE domain represent specific material properties, e.g., structural, mechanical, … characteristics. A reference dataset must fulfill high-quality standards, not only in precision of measurement but also in a comprehensive documentation of material, processing, and testing history (metadata). This Infrastructure Use Case (IUC) aims to develop a framework for generating reference material datasets using creep data of a single crystal Ni-based superalloy as a best practice example. In a community-driven process, we aim to encourage the discussion and establish a framework for the creation and distribution of reference material datasets. In this poster presentation, we highlight our current vision and activities and intend to stimulate the discussion about the topic reference datasets and future collaborations and work. T2 - NFDI-MatWerk Conference CY - Siegburg, Germany DA - 27.06.2023 KW - Referenzdaten KW - Reference data KW - Syngle Crystal alloy KW - Creep KW - Metadata schema PY - 2023 AN - OPUS4-57923 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Ávila Calderón, Luis Alexander A1 - Hammerschmidt, T. A1 - Stotzka, R. A1 - Forti, M. A1 - Olbricht, Jürgen A1 - Skrotzki, Birgit A1 - Lenze, A. A1 - Gedsun, A. A1 - Hickel, Tilmann A1 - Tsybenko, H. A1 - Chmielowski, M. A1 - Hunke, S. A1 - Shakeel, Y. T1 - Demonstration of the Infrastructure Use Case 02: Framework for curation and distribution of reference datasets N2 - In our current view, reference datasets in the MSE domain represent specific material properties, e.g., structural, mechanical, … characteristics. A reference dataset must fulfill high-quality standards, not only in precision of measurement but also in a comprehensive documentation of material, processing, and testing history (metadata). This Infrastructure Use Case (IUC) aims to develop a framework for generating reference material datasets using creep data of a single crystal Ni-based superalloy as a best practice example. In a community-driven process, we aim to encourage the discussion and establish a framework for the creation and distribution of reference material datasets. In this poster presentation, we highlight our current vision and activities and intend to stimulate the discussion about the topic reference datasets and future collaborations and work. T2 - NFDI-MatWerk Conference CY - Siegburg, Germany DA - 27.06.2023 KW - Referenzdaten KW - Reference data KW - Creep KW - Metadata schema KW - Syngle Crystal alloy PY - 2023 AN - OPUS4-57924 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Pauli, J. A1 - Güttler, Arne A1 - Schneider, T. A1 - Würth, Christian A1 - Resch-Genger, Ute T1 - Fluorescence Quantum Yield Standards for the UV/Visible/NIR: Development, Traceable Characterization, and Certification JF - Analytical chemistry N2 - The rational design of next generation molecular and nanoscale reporters and the comparison of different emitter classes require the determination of the fluorometric key performance parameter fluorescence quantum yield (Φf), i.e., the number of emitted photons per number of absorbed photons. Main prerequisites for reliable Φf measurements, which are for transparent luminophore solutions commonly done relative to a reference, i.e., a fluorescence quantum yield standard of known Φf, are reliable and validated instrument calibration procedures to consider wavelength-, polarization-, and time-dependent instrument specific signal contributions, and sufficiently well characterized fluorescence quantum yield standards. As the standard’s Φf value directly contributes to the calculation of the sample’s Φf, its accuracy presents one of the main sources of uncertainty of relative Φf measurements. To close this gap, we developed a first set of 12 fluorescence quantum yield standards, which absorb and emit in the wavelength region of 330−1000 nm and absolutely determined their Φf values with two independently calibrated integrating sphere setups. Criteria for standard selection and the configuration of these novel fluorescence reference materials are given, and the certification procedure is presented including homogeneity and stability studies and the calculation of complete uncertainty budgets for the certified Φf values. The ultimate goal is to provide the community of fluorescence users with available reference materials as a basis for an improved comparability and reliability of quantum yield data since the measurement of this spectroscopic key property is an essential part of the characterization of any new emitter. KW - Optical spectroscopy KW - Traceability KW - Reference product KW - Dye KW - Fluorescence KW - Quantum yield KW - Reference material KW - Reference data KW - Certification KW - Quality assurance PY - 2023 DO - https://doi.org/10.1021/acs.analchem.2c05530 VL - 95 SP - 5671 EP - 5677 PB - American Chemical Society AN - OPUS4-58151 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Ávila Calderón, Luis Alexander A1 - Shakeel, Yusra A1 - Olbricht, Jürgen A1 - Aversa, Rossella A1 - Skrotzki, Birgit T1 - NFDI-MatWerk PP18 / IUC02 Reference Data: Creep Data of a single crystalline Ni-Base Alloy N2 - Reference datasets in the MSE domain represent specific material properties, e.g., structural, mechanical, … characteristics. A reference dataset must fulfill high-quality standards, not only in precision of measurement but also in a comprehensive documentation of material, processing, and testing history (metadata). This Infrastructure Use Case (IUC) of the consortium Materials Science and Engineering (MatWerk) of National Research Data Infrastructure (NFDI) aims to develop, together with BAM and other Participant Projects (PP), a framework for generating reference material datasets using creep data of a single crystal Ni-based superalloy as a best practice example. In a community-driven process, we aim to encourage the discussion and establish a framework for identifying reference material datasets. In this poster presentation, we highlight our current vision and activities and intend to stimulate the discussion about the topic reference datasets and future collaborations and work. T2 - All-Hands-on-Deck congress from the NFDI-MatWerk CY - Siegburg, Germany DA - 08.03.2023 KW - Referenzdaten KW - Reference data KW - Creep KW - Syngle Crystal alloy KW - Metadata schema PY - 2023 AN - OPUS4-57146 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Resch-Genger, Ute T1 - Design and Quantitative Characterization of Functional Molecular Chromophores and Nanomaterials with UV/vis/NIR/IR Emission – An Overview of Research Activities in Division Biophotonics N2 - In the focus of division Biophotonics are the design, preparation, analytical and spectroscopic characterization, and application of molecular and nanoscale functional materials, particularly materials with a photoluminescence in the visible, near infrared (NIR) and short-wave infrared (SWIR). This includes optical reporters for bioimaging and sensing, security and authentication barcodes, and materials for solid state lighting, energy conversion, and photovoltaics. For the identification of optimum particle structures quantitative spectroscopic studies are performed under application-relevant conditions, focusing on the key performance parameter photoluminescence quantum yield. In addition, simple, cost-efficient, and standardizable strategies for quantifying functional groups on the surface of nano- and microparticles are developed, here with a focus on optical assays and electrochemical titration methods, cross-validated by more advanced methods such as quantitative NMR. In addition, reference materials and reference products are developed for optical methods, particularly luminescence techniques, and for analytical methods utilized for the characterization of nanomaterials. T2 - Projekttreffen Nile-Chrome 2.0 CY - Mainz, Germany DA - 11.12.2023 KW - Fluorescence KW - Quantum yield KW - Optical spectroscopy KW - Reference material KW - Reference data KW - Quality assurance KW - Dye KW - Reference product KW - NIR KW - SWIR KW - Nano KW - Particle KW - Silica KW - Polymer KW - Surface group analysis KW - Sensor molecules PY - 2023 AN - OPUS4-59123 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Rehmer, Birgit A1 - Bayram, Faruk A1 - Ávila Calderon, Luis Alexander A1 - Mohr, Gunther A1 - Skrotzki, Birgit T1 - Elastic modulus data for additively and conventionally manufactured variants of Ti-6Al-4V, IN718 and AISI 316 L JF - Scientific Data N2 - This article reports temperature-dependent elastic properties (Young’s modulus, shear modulus) of three alloys measured by the dynamic resonance method. The alloys Ti-6Al-4V, Inconel IN718, and AISI 316 L were each investigated in a variant produced by an additive manufacturing processing route and by a conventional manufacturing processing route. The datasets include information on processing routes and parameters, heat treatments, grain size, specimen dimensions, and weight, as well as Young’s and shear modulus along with their measurement uncertainty. The process routes and methods are described in detail. The datasets were generated in an accredited testing lab, audited as BAM reference data, and are hosted in the open data repository Zenodo. Possible data usages include the verification of the correctness of the test setup via Young’s modulus comparison in low-cycle fatigue (LCF) or thermo-mechanical fatigue (TMF) testing campaigns, the design auf VHCF specimens and the use as input data for simulation purposes. KW - Elastic modulus KW - Young's modulus KW - Shear modulus KW - Additive manufacturing KW - AISI 316L KW - IN 718 KW - Ti-6Al-4V KW - Reference data KW - Temperature dependence PY - 2023 UR - https://nbn-resolving.org/urn:nbn:de:kobv:b43-579716 DO - https://doi.org/10.1038/s41597-023-02387-6 VL - 10 IS - 1 SP - 1 EP - 9 PB - Springer Nature AN - OPUS4-57971 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Resch-Genger, Ute A1 - Pauli, J. A1 - Güttler, Arne A1 - Richter, Maria A1 - Fiedler, Saskia A1 - Frenzel, Florian A1 - Wegner, Karl David A1 - Würth, Christian T1 - Photoluminescence Quantum Yields of Luminescent Nanocrystals and Particles in the UV/vis/NIR/SWIR N2 - The rational design of functional luminescent materials such as semiconductor quantum dots and lanthanide-based upconversion nanoparticles, all photophysical and mechanistic studies, and the comparison of different emitters require accurate and quantitative photoluminescence measurements. Particularly the reliable determination of the key performance parameter photoluminescence quantum yield (f), the number of emitted per absorbed photons, and the brightness are of special importance for luminescence applications in the life and material sciences and nano(bio)photonics.[1] In this context, examples for absolute measurements of the photoluminescence quantum yields of UV/vis/NIR/SWIR emissive semiconductor quantum dots and rods, made from different materials, and spectrally shifting lanthanide upconversion nanocrystals with different surface chemistries in transparent matrices are presented including excitation wavelength and power density dependent studies utilizing integration sphere spectroscopy.[2,3] In addition, procedures for the absolute determination of the photoluminescence quantum yields of scattering dispersions of larger size quantum rods and differently sized inorganic particles have been developed as well as procedures for the characterization of solid luminescent nanomaterials such as different perovskites and YAG:Cer converter materials.[4] Thereby, challenges and pitfalls of f measurements in different wavelength regions including the SWIR and material-specific effects related to certain emitter classes are addressed, achievable uncertainties are quantified, and relative and absolute measurements of photoluminescence quantum yield measurements are compared to underline limitations of the former approach. Finally, a set of novel UV/vis/NIR quantum yield standards is presented including their certification with a complete uncertainty budget.[5] T2 - NANAX 10 CY - Klosterneuburg, Austria DA - 03.07.2023 KW - Fluorescence KW - Optical spectroscopy KW - Reference data KW - Traceability KW - NIR KW - Scattering KW - Reference material KW - Certification KW - Quality assurance KW - Dye KW - Reference product KW - SWIR KW - Nano KW - Particle KW - Perovskite KW - Integrating sphere spectroscopy KW - Quantum yield PY - 2023 AN - OPUS4-58238 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Radnik, Jörg A1 - Ciornii, Dmitri A1 - Kersting, R. A1 - Hagenhoff, B. A1 - Hodoroaba, Vasile-Dan T1 - Reliable, and reproducible physico-chemical data of nanomaterials for risk assessment N2 - Nanoforms with at least one dimension below 100 nm have an important part to play in more and more areas of our daily life. Therefore, risk assessment of these materials is becoming increasingly important. In this context, the European Chemical Agency (ECHA) considered eleven physico-chemical properties as relevant, of which the following six are essential for the registration: chemical composition, crystallinity, particle size, particle shape, surface chemistry and specific surface area. Four of these priority properties can be obtained with electron microscopy and surface analytics like XPS and ToF-SIMS. The reliability of this data must be ensured, especially for their use for grouping and read across approaches. On the other hand, the “reproducibility” crisis has revealed major shortcomings in the reliability of published data. In a case study, we show how the quality of the data can be ensured by using existing standards and protocols of each step in the workflow of sample characterization. As exemplary samples, two Al-coated TiO2 samples as nanopowders were selected from the JRC repository, capped either with a hydrophilic or a hydrophobic organic ultrathin shell. SEM results provided the size and shape of the nanoparticles, a first overview about the composition was obtained with EDS. XPS and ToF-SIMS supplied the surface chemistry, especially information about the shell and the coating of the particles. Standards and protocols of all steps of the analytical workflow including preparation and data reduction are discussed regarding reliable and reproducible data. Additionally, uncertainties for the different steps are specified. Only such a detailed description of all these factors allows a comprehensive physico-chemical characterization of the nanoparticles with understanding of their potential risk assessment. T2 - ECASIA 2022 CY - Limerick, Ireland DA - 29.05.2022 KW - Reference data KW - Risk assessment KW - Nanomaterials KW - Titania PY - 2022 AN - OPUS4-54961 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - GEN A1 - Skrotzki, Birgit A1 - Schriever, Sina T1 - BAM reference data - Results of ASTM E139-11 creep tests on a reference material of Nimonic 75 nickel-base alloy N2 - Results of creep tests on a certified reference material at T = 600°C and a tensile creep load of 160 MPa are provided. The evaluated results include the times to reach 2% and 4% creep strain, respectively, and the creep rate after 400 h. The data were audited and are BAM reference data. KW - Reference data KW - Creep KW - Nickel-base alloy KW - Nimonic 75 KW - Reference material BCR-425 PY - 2021 DO - https://doi.org/10.5281/zenodo.5106606 PB - Zenodo CY - Geneva AN - OPUS4-52970 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Hodoroaba, Vasile-Dan T1 - Minimum Requirements for Nanomaterial Data - Examples with Electron Microscopy and Energy-Dispersive X-Ray Spectroscopy N2 - In dem Vortrag werden, anhand ausgewählten Beispielen aus der Elektronenmikroskopie und EDX-Elementanalyse, die minimalen Anforderungen an Referenzdaten für zuverlässige und reproduzierbare Ergebnisse (z.B. Partikelgrößenverteilung, Elementzusammensetzung) bei der Charakterisierung von Nanomaterialien vorgestellt und diskutiert. N2 - Based on practical examples of analysis with Electron Microscopy and Energy-Dispersive X-ray Spectroscopy, the minimum information requirements for reliable and reproducible nanomaterial characterization data such as particle size and shape distribution and elemental analysis are presented and discussed. T2 - nano@BAM-Workshop Digitalisierung in der Nanosicherheit CY - Online meeting DA - 04.12.2020 KW - Nanoparticles KW - Electron microscopy KW - EDX KW - Reference data KW - Reproducibility KW - Standardisation PY - 2020 AN - OPUS4-51775 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER -