TY - CONF A1 - Matthews, Lauren A1 - Sahre, Mario A1 - Hesse, R. A1 - Schusterbauer, Robert A1 - Grant, M. A1 - Agudo Jácome, Leonardo A1 - Albrecht, T. A1 - Hodoroaba, Vasile-Dan T1 - Approaches to Surface Analysis of Modified Quartz Nanopipettes N2 - Nanopipettes are a type of solid-state nanopore with needle-like geometry. Their applications range from imaging, sensing, diagnostics, and use as injectors. The response of nanopipette sensors is highly dependent on the size, geometry and chemical properties of the sensing region. As they are increasingly tuned and modified for specific analytes, a better understanding of the surface chemistry and morphology of the inner channel is necessary. With the aim of developing a comprehensive approach for characterisation of such nanopipettes, this research focuses on combining surface-sensitive analysis methods with advanced sample preparation techniques. Quartz substrates were modified by gas phase silanization, a well-utilised technique in the field to enhance performance of nanopipettes, and further functionalised with a metal bis thiolate complex, to aid in chemical analysis. The sample characterisation involved scanning electron microscopy (SEM), low-energy dispersive x-ray spectroscopy (EDX), time-of-flight secondary ion mass spectrometry (ToF-SIMS) and Auger electron spectroscopy (AES). Using focused ion beam (FIB) milling under gentle conditions, the inner surface of quartz nanopipettes was exposed whilst preserving the integrity of the overall structure (see figure). Owing to the challenging analysis conditions, modification and analysis of flat quartz substrates has been performed in parallel for optimisation purposes. The results demonstrate the first steps towards full characterisation of nanopipettes at the nanoscale, notably with access to the inner channel. The methods used here can be applied to gain further understanding of the response of these sensors to complex analytes and allow for the study of different surface functionalisations at the all-important sensing region. T2 - European Conference on Applications of Surface and Interface Analysis (ECASIA 2024) CY - Gothenburg, Sweden DA - 09.06.2024 KW - Quartz nanopipettes KW - Nanopipette modification KW - Silanization KW - Surface analysis KW - Focussed ion beam PY - 2024 AN - OPUS4-60447 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Battig, Alexander A1 - Abdou-Rahaman Fadul, Naïssa A1 - Frasca, Daniele A1 - Schulze, Dietmar A1 - Schartel, Bernhard T1 - Multifunctional Graphene in Flame Retarded Polybutadiene/ Chloroprene/ Carbon Black Composites N2 - Multilayer graphene is investigated as a multifunctional nanofiller to polybutadiene/ chloroprene rubbers (BR/CR) that partially substitutes carbon black (CB) and aluminum trihydroxide (ATH). Loadings of only 3 parts per hundred rubber (phr) MLG replaced 15 phr of CB and/or 3 phr of ATH in BR/CR nanocomposites. Mechanical and fire behavior were investigated, and results point to improved rheological, curing and mechanical properties of MLG-containing rubber composites. T2 - 18th European Meeting on Fire Retardant Polymeric Materials, FRPM21 CY - Budapest, Hungary DA - 29.08.2021 KW - Graphene KW - Rubber KW - Fire Retardant KW - Nanofiller KW - Nanocomposite KW - ATH PY - 2021 AN - OPUS4-53202 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Strommer, Bettina A1 - Böhning, Martin A1 - Schulze, Dietmar A1 - Schartel, Bernhard T1 - Natural Rubber Nanocomposites via Optimized Latex Premixing and Conventional Technical Processing N2 - Creation of highly functional materials and replacement of high amounts of conventional fillers are driving forces for the development of nanocomposites. Besides the type and properties of nanoparticles, their dispersing in the elastomeric matrix and the stability of this dispersion through all processing steps are the main factors for the resulting performance of the produced material. Therefore, a preparation chain via latex premixing to a highly filled masterbatch, followed by conventional technical processing is to be developed. Three types of carbon-based particles are characterized as such (SEM, Raman Spectroscopy, BET specific surface area) and in combination with natural rubber, as nanocomposites (TEM. Hardness, Abrasion resistance, Compression set, Cone calorimetry). All of the studied particles lead to an improvement in the investigated mechanical properties, the extent of reinforcement depends strongly on the specific surface of the particle interacting with the elastomeric matrix in combination with their shape. T2 - DKG Elastomer Symposium CY - Online meeting DA - 28.06.2021 KW - Processing KW - Elastomers KW - Nanocomposites KW - Graphene KW - Nanoparticles KW - Latex KW - Natural rubber PY - 2021 AN - OPUS4-53106 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Schusterbauer, Robert A1 - Sahre, Mario A1 - Mrkwitschka, Paul A1 - John, Elisabeth A1 - Lange, Thorid A1 - Zurutuza, A. A1 - Jones, E. A1 - Donskyi, I. A1 - Radnik, Jörg A1 - Hodoroaba, Vasile-Dan T1 - Correlative chemical imaging to reveal the nature of different commercial graphene materials N2 - Since the original report in 2004 by Novoselov and Geim, Graphene gained incredible attention due to its fascinating properties. In the past 20 years, the synthesis and functionalization of graphene has evolved significantly[3]. Different synthesis techniques were developed which led to other graphenerelated materials such as graphene oxide (GO) or elemental-doped graphene. Further chemical functionalization can enhance but also alter or reduce specific properties of the graphene. To reveal the nature of these materials a proper physico‑chemical characterization with different analytical techniques is crucial. Single-layer GO flakes kindly provided by Graphenea (Spain) were prepared for systematic image analysis. These flakes were disposed on an alignment-marked SiO2 substrate and correlatively imaged by scanning electron microscopy (SEM), atomic force microscopy (AFM), X-ray photoelectron spectroscopy (XPS), time-of-flight secondary ion mass spectrometry (ToF-SIMS) and Raman spectroscopy. The high lateral resolution and/ or extreme surface sensitivity of the mentioned techniques is necessary to explore monolayers. The ToF-SIMS images match well with the SEM and AFM images and provide information about the chemistry. With 2D Raman spectroscopy it is possible to differentiate between the number of stacked single-layer flakes. This is visualized in a 3D image (Figure b). Well-defined GO flakes could be used as a reference material for imaging of graphene-like structures but also of other types of 2D materials. In addition to these monolayer GO flakes, commercial graphene-containing inks (Haydale) with a more complex morphology were also correlatively imaged. ToF-SIMS and SEM images were merged to identify the origin of different chemical fragments. The findings correlate closely with the expectation that the specific functionalizations (with fluorine and nitrogen as marker elements) are present only on the graphene flakes as presumed from the SEM images. Energy-dispersive X-ray spectroscopy (EDX) supports these results, yet with a much lower sensitivity compared to ToF-SIMS. T2 - ECASIA 2024 CY - Gothenburg, Sweden DA - 09.06.2024 KW - Correlative imaging KW - ToF-SIMS KW - SEM KW - Graphene oxide flakes KW - Raman PY - 2024 AN - OPUS4-60680 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Schusterbauer, Robert A1 - Sahre, Mario A1 - Mrkwitschka, Paul A1 - John, Elisabeth A1 - Lange, Thorid A1 - Zurutuza, A. A1 - Jones, E. A1 - Donskyi, I. A1 - Radnik, Jörg A1 - Hodoroaba, Vasile-Dan T1 - Correlative chemical imaging to reveal the nature of different commercial graphene materials N2 - Since the original report in 2004 by Novoselov and Geim, Graphene gained incredible attention due to its fascinating properties. In the past 20 years, the synthesis and functionalization of graphene has evolved significantly[3]. Different synthesis techniques were developed which led to other graphenerelated materials such as graphene oxide (GO) or elemental-doped graphene. Further chemical functionalization can enhance but also alter or reduce specific properties of the graphene. To reveal the nature of these materials a proper physico‑chemical characterization with different analytical techniques is crucial. Single-layer GO flakes kindly provided by Graphenea (Spain) were prepared for systematic image analysis. These flakes were disposed on an alignment-marked SiO2 substrate and correlatively imaged by scanning electron microscopy (SEM), atomic force microscopy (AFM), X-ray photoelectron spectroscopy (XPS), time-of-flight secondary ion mass spectrometry (ToF-SIMS) and Raman spectroscopy. The high lateral resolution and/ or extreme surface sensitivity of the mentioned techniques is necessary to explore monolayers. The ToF-SIMS images match well with the SEM and AFM images and provide information about the chemistry. With 2D Raman spectroscopy it is possible to differentiate between the number of stacked single-layer flakes. This is visualized in a 3D image (Figure b). Well-defined GO flakes could be used as a reference material for imaging of graphene-like structures but also of other types of 2D materials. In addition to these monolayer GO flakes, commercial graphene-containing inks (Haydale) with a more complex morphology were also correlatively imaged. ToF-SIMS and SEM images were merged to identify the origin of different chemical fragments. The findings correlate closely with the expectation that the specific functionalizations (with fluorine and nitrogen as marker elements) are present only on the graphene flakes as presumed from the SEM images. Energy-dispersive X-ray spectroscopy (EDX) supports these results, yet with a much lower sensitivity compared to ToF-SIMS. T2 - MaterialsWeek 2024 CY - Limassol, Cyprus DA - 17.06.2024 KW - Graphene oxide flakes KW - ToF-SIMS KW - SEM KW - Raman KW - Correlative imaging PY - 2024 AN - OPUS4-60681 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER -