TY - JOUR A1 - Richter, Maria A1 - Güttler, Arne A1 - Pauli, Jutta A1 - Vogel, K. A1 - Homann, Christian A1 - Würth, Christian A1 - Resch-Genger, Ute T1 - Extending certified spectral fluorescence standards for the calibration and performance validation of fluorescence instruments to the NIR—closing the gap from 750 to 940 nm with two novel NIR dyes N2 - Fluorescence techniques such as fluorescence spectroscopy, microfluorometry, and fluorescence microscopy, providing spectral, intensity, polarization, and lifetime information, are amongst the most broadly utilized analytical methods in the life and materials sciences. However, the measured fluorescence data contain sample- and instrument-specific contributions, which hamper their comparability across instruments and laboratories. Comparable, instrument-independent fluorescence data require the determination of the fluorescence instrument’s wavelength-dependent spectral responsivity, also termed emission correction curve, for the same instrument settings as those used for the fluorescence measurements as a prerequisite for the subsequent correction of the measured instrument-specific data. Such a spectral correction is essential for the performance comparison of different fluorescent labels and reporters, quantitative fluorescence measurements, the determination of the fluorescence quantum yield, and the spectroscopic measure for the fluorescence efficiency of a fluorophore. Simple-to-use tools for obtaining emission correction curves are chromophore-based reference materials (RMs), referred to as fluorescence standards, with precisely known, preferably certified instrument-independent fluorescence spectra. However, for the increasingly used near-infrared (NIR) wavelength region >700 nm, at present, no spectral fluorescence standards are available. To close this gap, we developed two novel spectral fluorescence standards, BAM F007 and BAM-F009, with broad emission bands from about 580 to 940 nm in ethanolic solution. These liquid fluorescence standards currently under certification, which will be released in 2025, will expand the wavelength range of the already available certified Calibration Kit BAM F001b-F005b from about 300–730 to 940 nm. In this research article, we will detail the criteria utilized for dye and matrix selection and the homogeneity and stability tests accompanying dye certification as well as the calculation of the wavelength-dependent uncertainty budgets of the emission spectra BAM F007 and BAM-F009, determined with the traceably calibrated BAM reference spectrofluorometer. These fluorescence standards can provide the basis for comparable fluorescence measurements in the ultraviolet, visible, and NIR for the fluorescence community. KW - Quality assurance KW - Reference material KW - Fluorescence KW - Dye KW - Traceability KW - Metrology KW - Calibration KW - Reference data KW - Reference product KW - Digital certificate KW - NIR KW - Instrument performance validation PY - 2025 UR - https://nbn-resolving.org/urn:nbn:de:kobv:b43-626317 DO - https://doi.org/10.1007/s00216-024-05723-w SN - 1618-2650 SP - 1 EP - 15 PB - Springer AN - OPUS4-62631 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Deumer, J. A1 - Andresen, Elina A1 - Gollwitzer, C. A1 - Schürmann, R. A1 - Resch-Genger, Ute T1 - Adding More Shape to Nanoscale Reference Materials-LiYF4:Yb,Tm Bipyramids as Standards for Sizing Methods and Particle Number Concentration N2 - The increasing industrial use of nanomaterials calls for the reliable characterization of their physicochemical key properties like size, size distribution, shape, and surface chemistry, and test and reference materials (RMs) with sizes and shapes, closely matching real-world nonspheric nano-objects. An efficient strategy to minimize efforts in producing nanoscale RMs (nanoRMs) for establishing, validating, and standardizing methods for characterizing nanomaterials are multimethod nanoRMs. Ideal candidates are lanthanide-based, multicolor luminescent, and chemically inert nanoparticles (NPs) like upconversion nanoparticles (UCNPs), which can be prepared in different sizes, shapes, and chemical composition with various surface coatings. This makes UCNPs interesting candidates as standards not only for sizing methods, but also for element-analytical methods like laser ablation-inductively coupled plasma mass spectrometry (LA-ICP-MS), quantitative bioimaging methods like X-ray fluorescence computed tomography (XFCT), and luminescence methods and correlative measurements. Here, we explore the potential of two monodisperse LiYF4:Yb,Tm bipyramids with peak-to-peak distances of (43 ± 2) nm and (29 ± 2) nm as size standards for small-angle X-ray scattering (SAXS) and tools for establishing and validating the sophisticated simulations required for the analysis of SAXS data derived from dispersions of nonspheric nano-objects. These SAXS studies are supplemented by two-dimensional (2D)-transmission electron microscopy measurements of the UCNP bipyramids. Additionally, the particle number concentration of cyclohexane dispersions of these UCNP bipyramids is determined by absolute SAXS measurements, complemented by gravimetry, thermogravimetric analysis (TGA), and inductively coupled plasma optical emission spectrometry (ICP-OES). This approach enables traceable particle number concentration measurements of ligand-capped nonspheric particles with unknown chemical composition. KW - Fluorescence KW - Upconversion nanoparticles KW - SAXS KW - Particle number concentration KW - Reference material KW - Traceability KW - Quality assurance KW - Quantum yield KW - Spectroscopy KW - Synthesis KW - Quantification KW - NanoRM KW - Nano KW - Particle KW - Bipyramid KW - Reference data KW - Simulation PY - 2024 UR - https://nbn-resolving.org/urn:nbn:de:kobv:b43-617940 DO - https://doi.org/10.1021/acs.analchem.4c03641 SP - 1 EP - 8 PB - ACS Publications AN - OPUS4-61794 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Resch-Genger, Ute T1 - Getting it right with photoluminescence quantum yields of molecular and nanoscale luminophores and luminescent particles N2 - Photophysical and mechanistic studies, the comparison of different emitter classes, and the rational design of the next generation of molecular and nanoscale reporters require quantitative photoluminescence measurements and the reliable determination of the key performance parameter photoluminescence quantum yield (QY), i.e., the number of emitted per absorbed photons. This is of special importance for all photoluminescence applications in the life and material sciences in the UV/vis/NIR/SWIR. To improve the reliability and comparability of photoluminescence and QY measurements across laboratories, pitfalls, achievable uncertainties, and material-specific effects related to certain emitter classes must be explored. Also, suitable protocols and reference materials are needed which have been validated in interlaboratory comparisons for different wavelength regions and transparent and scattering luminophores.[1] Based on absolute and relative photoluminescence measurements of functional dyes and nanomaterials like semiconductor quantum dots and rods, spectrally shifting lanthanide upconversion nanocrystals, perovskites, and YAG:Cer converter materials, reliable methods for determining QY of transparent and scattering luminophores, nonlinear emitters, and solid luminescent nanomaterials have been developed.[2,3] Thereby, material- and method-related uncertainties of relative and absolute QY measurements and achievable uncertainties could be quantified for linear and nonlinear UV/vis/NIR/SWIR emitters and lately for also luminescent and scattering materials and solid phoshors, here in an interlaboratory comparison of three labs utilizing integrating sphere spectroscopy.[4,5] In addition, to provide simple tools for a better comparability of QY measurements, recently, a first set of UV/vis/NIR quantum yield standards has been developed and certified with complete uncertainty budgets.[6] In the following, the outcome of these studies will be presented, thereby addressing common pitfalls and providing recommendations on the performance of reliable QY measurements of linear and non-linear emitters in transparent, scattering, and solid samples. T2 - 29th Lecture Conference on Photochemistry (LCP 2024) GDCh CY - Mainz, Germany DA - 16.09.2024 KW - Nanoparticle KW - Nano KW - Luminescence KW - Quality assurance KW - Synthesis KW - Standardization KW - Reference material KW - Quantum yield KW - Fluorescence KW - Reference data KW - Integrating sphere spectroscopy KW - ILC KW - Converter material KW - YAG:Ce KW - Optoceramic PY - 2024 AN - OPUS4-61075 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - GEN A1 - Resch-Genger, Ute A1 - Richter, Maria A1 - Güttler, Arne A1 - Pauli, Jutta A1 - Vogel, K. A1 - Homann, Christian A1 - Würth, Christian T1 - Extending Certified Spectral Fluorescence Standards for the Calibration and Performance Validation of Fluorescence Instruments to the NIR – Closing the Gap from 750 nm to 940 nm with Two Novel NIR Dyes N2 - Fluorescence methods provide spectral, intensity, polarization, and lifetime information, which contain sample- and instrument-specific contributions. Fluorescence data, comparable across instruments and laboratories, require validated calibration procedures and certified fluorescence standards. KW - Quality assurance KW - Reference material KW - Fluorescence KW - Dye KW - Traceability KW - Metrology KW - Calibration KW - Reference data KW - Reference product KW - Digital certificate KW - NIR KW - Instrument performance validation PY - 2025 SP - 1 EP - 4 PB - Springer Nature CY - London AN - OPUS4-62739 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Fabry, Çağtay T1 - Towards arc welding reference data: Open Science laboratories at BAM N2 - As industries move for ever faster development and adoption cycles of emerging new technologies in the field of welding, the meticulous and longer-winded approach of the scientific research process can feel harder to integrate. To help bridge this gap and increase the speed, quality, and adoption rate of publicly funded research, the Bundesanstalt für Materialforschung und -prüfung (BAM) continues to work towards enabling scientists with direct access to necessary software tools and - in the future – highest quality welding research reference data to further foster collaborations. On the experimental side, the arc welding group at BAM division 9.3 “welding technologies” is continuing to expand and upgrade its capacities of robotic welding systems with integrated state of the art sensor technologies and software solutions. This allows all experiments to be recorded and measured in micro-millimeter accuracy and at sub-millisecond precision, including welding process data, complete spatial geometry and temperature measurements, process video recordings and more. The custom software-based solutions and interfaces allow scaling of the welding systems from large thick plate offshore applications to small additive repair weldments in wind turbine blades to multi-hour continuous weldments in additive manufacturing applications. In addition to the data gathered during the welding process itself, the relevant testing results and materials properties produced at BAM or externally can be integrated seamlessly. This allows detailed traceability of all results back to the actual welding process. Regardless of the scope and application, complete datasets can be made accessible for research or industry partners in the highest resolution based on the open source WelDX (welding data exchange) file format. Figure 1. Welding experiment representation including dynamic process data, cross-section imaging and hardness measurements from a single weldx file. The talk will give an overview of the experimental facilities and workflows as well as current software developments with a focus on research data quality assurance, traceability, and accessibility. Based on the integration into latest research trends and activities of the “welding technologies” division, the path to publishing reference datasets for arc welding process for various applications and materials is outlined and discussed. T2 - 4th Symposium on Materials and Additive Manufacturing - Additive 2024 CY - Berlin, Germany DA - 12.06.2024 KW - Additive Manufacturing KW - Arc welding KW - DED-arc KW - Research data KW - Reference data PY - 2024 AN - OPUS4-60249 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Resch-Genger, Ute T1 - Design and Quantitative Characterization of Functional Molecular Chromophores and Nanomaterials with UV/vis/NIR/IR Emission – An Overview of Research Activities in Division Biophotonics N2 - In the focus of division Biophotonics are the design, preparation, analytical and spectroscopic characterization, and application of molecular and nanoscale functional materials, particularly materials with a photoluminescence in the visible, near infrared (NIR) and short-wave infrared (SWIR). This includes optical reporters for bioimaging and sensing, security and authentication barcodes, and materials for solid state lighting, energy conversion, and photovoltaics. For the identification of optimum particle structures quantitative spectroscopic studies are performed under application-relevant conditions, focusing on the key performance parameter photoluminescence quantum yield. In addition, simple, cost-efficient, and standardizable strategies for quantifying functional groups on the surface of nano- and microparticles are developed, here with a focus on optical assays and electrochemical titration methods, cross-validated by more advanced methods such as quantitative NMR. In addition, reference materials and reference products are developed for optical methods, particularly luminescence techniques, and for analytical methods utilized for the characterization of nanomaterials. T2 - Projekttreffen Nile-Chrome 2.0 CY - Mainz, Germany DA - 11.12.2023 KW - Fluorescence KW - Quantum yield KW - Optical spectroscopy KW - Reference material KW - Reference data KW - Quality assurance KW - Dye KW - Reference product KW - NIR KW - SWIR KW - Nano KW - Particle KW - Silica KW - Polymer KW - Surface group analysis KW - Sensor molecules PY - 2023 AN - OPUS4-59123 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Resch-Genger, Ute T1 - Photoluminescence quantum yields of molecular & nanoscale luminophores in the UV/VIS/NIR/SWIR in dispersion and in the solid state N2 - Photophysical and mechanistic studies, the comparison of different emitter classes, and the rational design of the next generation of molecular and nanoscale reporters require quantitative photoluminescence measurements and the reliable determination of the key performance parameter photoluminescence quantum yield (QY), i.e., the number of emitted per absorbed photons. This is of special importance for all photoluminescence applications in the life and material sciences in the UV/vis/NIR/SWIR. T2 - MAF 2024 Conference CY - Valencia, Spain DA - 08.09.2024 KW - Nanoparticle KW - Nano KW - Luminescence KW - Quality assurance KW - Synthesis KW - Standardization KW - Reference material KW - Quantum yield KW - Fluorescence KW - Reference data KW - Integrating sphere spectroscopy KW - ILC KW - Converter material PY - 2024 AN - OPUS4-61072 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Pauli, J. A1 - Güttler, Arne A1 - Schneider, T. A1 - Würth, Christian A1 - Resch-Genger, Ute T1 - Fluorescence Quantum Yield Standards for the UV/Visible/NIR: Development, Traceable Characterization, and Certification N2 - The rational design of next generation molecular and nanoscale reporters and the comparison of different emitter classes require the determination of the fluorometric key performance parameter fluorescence quantum yield (Φf), i.e., the number of emitted photons per number of absorbed photons. Main prerequisites for reliable Φf measurements, which are for transparent luminophore solutions commonly done relative to a reference, i.e., a fluorescence quantum yield standard of known Φf, are reliable and validated instrument calibration procedures to consider wavelength-, polarization-, and time-dependent instrument specific signal contributions, and sufficiently well characterized fluorescence quantum yield standards. As the standard’s Φf value directly contributes to the calculation of the sample’s Φf, its accuracy presents one of the main sources of uncertainty of relative Φf measurements. To close this gap, we developed a first set of 12 fluorescence quantum yield standards, which absorb and emit in the wavelength region of 330−1000 nm and absolutely determined their Φf values with two independently calibrated integrating sphere setups. Criteria for standard selection and the configuration of these novel fluorescence reference materials are given, and the certification procedure is presented including homogeneity and stability studies and the calculation of complete uncertainty budgets for the certified Φf values. The ultimate goal is to provide the community of fluorescence users with available reference materials as a basis for an improved comparability and reliability of quantum yield data since the measurement of this spectroscopic key property is an essential part of the characterization of any new emitter. KW - Optical spectroscopy KW - Traceability KW - Reference product KW - Dye KW - Fluorescence KW - Quantum yield KW - Reference material KW - Reference data KW - Certification KW - Quality assurance PY - 2023 DO - https://doi.org/10.1021/acs.analchem.2c05530 VL - 95 SP - 5671 EP - 5677 PB - American Chemical Society AN - OPUS4-58151 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Resch-Genger, Ute A1 - Pauli, J. A1 - Güttler, Arne A1 - Richter, Maria A1 - Fiedler, Saskia A1 - Frenzel, Florian A1 - Wegner, Karl David A1 - Würth, Christian T1 - Photoluminescence Quantum Yields of Luminescent Nanocrystals and Particles in the UV/vis/NIR/SWIR N2 - The rational design of functional luminescent materials such as semiconductor quantum dots and lanthanide-based upconversion nanoparticles, all photophysical and mechanistic studies, and the comparison of different emitters require accurate and quantitative photoluminescence measurements. Particularly the reliable determination of the key performance parameter photoluminescence quantum yield (f), the number of emitted per absorbed photons, and the brightness are of special importance for luminescence applications in the life and material sciences and nano(bio)photonics.[1] In this context, examples for absolute measurements of the photoluminescence quantum yields of UV/vis/NIR/SWIR emissive semiconductor quantum dots and rods, made from different materials, and spectrally shifting lanthanide upconversion nanocrystals with different surface chemistries in transparent matrices are presented including excitation wavelength and power density dependent studies utilizing integration sphere spectroscopy.[2,3] In addition, procedures for the absolute determination of the photoluminescence quantum yields of scattering dispersions of larger size quantum rods and differently sized inorganic particles have been developed as well as procedures for the characterization of solid luminescent nanomaterials such as different perovskites and YAG:Cer converter materials.[4] Thereby, challenges and pitfalls of f measurements in different wavelength regions including the SWIR and material-specific effects related to certain emitter classes are addressed, achievable uncertainties are quantified, and relative and absolute measurements of photoluminescence quantum yield measurements are compared to underline limitations of the former approach. Finally, a set of novel UV/vis/NIR quantum yield standards is presented including their certification with a complete uncertainty budget.[5] T2 - NANAX 10 CY - Klosterneuburg, Austria DA - 03.07.2023 KW - Fluorescence KW - Optical spectroscopy KW - Reference data KW - Traceability KW - NIR KW - Scattering KW - Reference material KW - Certification KW - Quality assurance KW - Dye KW - Reference product KW - SWIR KW - Nano KW - Particle KW - Perovskite KW - Integrating sphere spectroscopy KW - Quantum yield PY - 2023 AN - OPUS4-58238 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Tavernaro, Isabella A1 - Abram, Sarah-Luise A1 - Homann, Christian A1 - Scholtz, Lena A1 - Radnik, Jörg A1 - Resch-Genger, Ute T1 - Validated and standardized measurements and quantification of surface functionalities on nanoparticles N2 - Surface-functionalized organic and inorganic engineered nanomaterials (NMs) are widely applied in the life and materials sciences. NM performance depends on key factors such as particle size and shape, crystal phase, morphology, chemical composition, and surface chemistry, i.e., surface coatings, functional groups (FGs), and ligands.1 The latter controls their processability and interaction with the environment and largely their possible toxicity. Thus, methods for FG quantification are important tools for quality control of NM production processes and can foster the sustainable development of functional and safe(r) NMs. This underlines the importance of validated and standardized analytical methods for surface analysis and reference materials.2 This encouraged us to explore simple and versatile tools for quantifying common bioanalytically relevant FGs such as optical assays, electrochemical titration methods, quantitative nuclear magnetic resonance spectroscopy (qNMR), and X-Ray photoelectron spectroscopy (XPS) and to perform a first interlaboratory comparison (ILC) on surface FG quantification.3,4 In a follow-up ILC, BAM and NRC explored qNMR sample preparation, measurement, and data evaluation protocols for commercial and custom-made aminated SiO2 NPs with sizes of 20-100 nm, different amounts of surface amino FGs, and different porosity.5,6 First, the number of amino FGs accessible for a dye reporter was determined with a cost-efficient, automated optical fluorescamine assay. Then, qNMR workflows and protocols were stepwise fine-tuned. The qNMR ILC was complemented by joint XPS measurements. BAM also examined the applicability of fast and automatable potentiometric titrations to screen the total amount of (de)protonable FGs on aminated SiO2 NPs. Our results underline the need to evaluate protocols for FG quantification in ILCs and the advantages of multi-method characterization strategies for efficient method cross validation. T2 - Surface and Micro/Nano Analysis Working Group CY - Paris, France DA - 08.04.2025 KW - Quality assurance KW - Reference material KW - Fluorescence KW - Nano KW - Particle KW - Surface analysis KW - XPS KW - Traceability KW - Metrology KW - Calibration KW - Reference data KW - Reference product KW - Digital certificate KW - QNMR KW - Potentiometry PY - 2025 AN - OPUS4-62969 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Rehmer, Birgit A1 - Bayram, Faruk A1 - Ávila Calderón, Luis A1 - Mohr, Gunther A1 - Skrotzki, Birgit T1 - Elastic modulus data for additively and conventionally manufactured variants of Ti-6Al-4V, IN718 and AISI 316 L N2 - This article reports temperature-dependent elastic properties (Young’s modulus, shear modulus) of three alloys measured by the dynamic resonance method. The alloys Ti-6Al-4V, Inconel IN718, and AISI 316 L were each investigated in a variant produced by an additive manufacturing processing route and by a conventional manufacturing processing route. The datasets include information on processing routes and parameters, heat treatments, grain size, specimen dimensions, and weight, as well as Young’s and shear modulus along with their measurement uncertainty. The process routes and methods are described in detail. The datasets were generated in an accredited testing lab, audited as BAM reference data, and are hosted in the open data repository Zenodo. Possible data usages include the verification of the correctness of the test setup via Young’s modulus comparison in low-cycle fatigue (LCF) or thermo-mechanical fatigue (TMF) testing campaigns, the design auf VHCF specimens and the use as input data for simulation purposes. KW - Elastic modulus KW - Young's modulus KW - Shear modulus KW - Additive manufacturing KW - AISI 316L KW - IN 718 KW - Ti-6Al-4V KW - Reference data KW - Temperature dependence PY - 2023 UR - https://nbn-resolving.org/urn:nbn:de:kobv:b43-579716 DO - https://doi.org/10.1038/s41597-023-02387-6 VL - 10 IS - 1 SP - 1 EP - 9 PB - Springer Nature AN - OPUS4-57971 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - GEN A1 - Ávila Calderón, Luis A1 - Han, Ying A1 - Matzak, Kathrin A1 - Olbricht, Jürgen A1 - Skrotzki, Birgit T1 - NFDI-MatWerk/IUC02 data schema for elevated temperature tensile data of Ni-based superalloys N2 - Strength characteristics, such as proof strength and tensile strength, of metallic materials are usually measured at room temperature. However, for high-temperature materials, the values at operational temperatures are equally important for analyzing the mechanical behavior of components or for designing purposes. Elevated temperature tensile tests (often referred to as hot tensile tests) generally enable the measurement of the same material parameters as those obtained at room temperature. Typically, tensile and proof strength, elongation after fracture, and reduction of area are analyzed, with the focus often being on proof strength. The attached data schema for elevated temperature tensile tests was developed within the German NFDI-MatWerk initiative (https://nfdi-matwerk.de/). It builds on a previously published creep data schema and follows a reference data methodology that has also been previously outlined. The presented schema constitutes a structured approach for collecting all relevant information on an elevated temperature tensile test experiment. Overall, this development, as defined in the previously published data schema for creep data, aims to provide a comprehensive hierarchical data description that can be implemented in data management platforms (such as electronic laboratory notebooks), facilitate consistent quality assessment across different users and data providers, and promote the alignment of datasets to the FAIR principles by providing easy interoperability and full reusability. The presented schema was initially developed for datasets of Ni-based high-temperature alloys. However, thanks to its modular structure, it can also be applied to tensile tests of various metallic and other materials. Although the focus is on elevated temperature tensile testing, the data schema also offers a solid foundation for documenting room temperature tensile tests. In such cases, an adjustment of the requirement profile might be necessary, and categories or entries specific to mechanical testing at elevated temperatures, such as “temperature-measuring system”, “specified temperature”, or “soaking time”, become irrelevant. Overall, a detailed approach was followed to ensure the collection of all relevant information, including both metadata and test results. This includes, for example, comprehensive descriptions of the material’s manufacturing history and of the laboratory equipment, and basic strength and deformation characteristic values. The resulting data schema aims to support the description and identification of high-quality datasets, which may qualify as reference data of materials. Our current definition of reference data of materials has been published elsewhere. It should be noted, however, that not all research datasets —depending on their origin and purpose— require this full level of detail. Nevertheless, the presented data schema can support data providers in evaluating the completeness and value of their datasets. This version of the data schema covers elevated temperature tensile tests on both single- and polycrystalline specimen materials. The terminology is aligned with DIN EN ISO 6892-1 and DIN EN ISO 6892-2. It is designed to record the use of temperature measurement using thermocouples and the use of contacting extensometer systems. The requirement profile refers to the highest quality class of reference data, taken from calibrated instruments, and which shall enable the following usages: 1. Checking one's own elevated temperature tensile test results on nominally similar material 2. Verification of own testing set-up (e.g., by testing the same or a similar material) 3. Using the data as input data for simulations in the context of design or alloy development KW - NFDI MatWerk KW - Referenzdaten KW - Zugversuch KW - CMSX-6 KW - Datenschema KW - NFDI MatWerk KW - CMSX-6 KW - Data schema KW - Reference data KW - Tensile test PY - 2025 UR - https://doi.org/10.5281/zenodo.17846436 DO - https://doi.org/10.5281/zenodo.17846435 PB - Zenodo CY - Geneva AN - OPUS4-65190 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - GEN A1 - Skrotzki, Birgit A1 - Schriever, Sina T1 - BAM reference data - Results of ASTM E139-11 creep tests on a reference material of Nimonic 75 nickel-base alloy N2 - Results of creep tests on a certified reference material at T = 600°C and a tensile creep load of 160 MPa are provided. The evaluated results include the times to reach 2% and 4% creep strain, respectively, and the creep rate after 400 h. The data were audited and are BAM reference data. KW - Reference data KW - Creep KW - Nickel-base alloy KW - Nimonic 75 KW - Reference material BCR-425 PY - 2021 DO - https://doi.org/10.5281/zenodo.5106606 PB - Zenodo CY - Geneva AN - OPUS4-52970 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Hodoroaba, Vasile-Dan T1 - Competence Center nano@BAM Welcomes ISO/TC 229 Meeting in Berlin N2 - The Competence Center nano@BAM is presented. Examples directly related to the activities of the ISO Technical Committee TC 229 Nanotechnologies as well as BAM projects on nano reference measurement procedures, nano reference materials and nano reference data sets are showed. T2 - The 32nd ISO/TC 229 IEC/TC 113 JWG2 General Meeting CY - Berlin, Germany DA - 06.11.2023 KW - ISO/TC 229 Nanotechnologies KW - Nanoparticles KW - Nano@BAM KW - Reference materials KW - Reference data KW - Reference procedures PY - 2023 AN - OPUS4-58814 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Hodoroaba, Vasile-Dan T1 - Minimum Requirements for Nanomaterial Data - Examples with Electron Microscopy and Energy-Dispersive X-Ray Spectroscopy N2 - In dem Vortrag werden, anhand ausgewählten Beispielen aus der Elektronenmikroskopie und EDX-Elementanalyse, die minimalen Anforderungen an Referenzdaten für zuverlässige und reproduzierbare Ergebnisse (z.B. Partikelgrößenverteilung, Elementzusammensetzung) bei der Charakterisierung von Nanomaterialien vorgestellt und diskutiert. N2 - Based on practical examples of analysis with Electron Microscopy and Energy-Dispersive X-ray Spectroscopy, the minimum information requirements for reliable and reproducible nanomaterial characterization data such as particle size and shape distribution and elemental analysis are presented and discussed. T2 - nano@BAM-Workshop Digitalisierung in der Nanosicherheit CY - Online meeting DA - 04.12.2020 KW - Nanoparticles KW - Electron microscopy KW - EDX KW - Reference data KW - Reproducibility KW - Standardisation PY - 2020 AN - OPUS4-51775 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Ávila Calderón, Luis A1 - Shakeel, Yusra T1 - NFDI-MatWerk PP18 / IUC02 Reference Data: Creep Data of a single crystalline Ni-Base Alloy N2 - Reference datasets in the MSE domain represent specific material properties, e.g., structural, mechanical, … characteristics. A reference dataset must fulfill high-quality standards, not only in precision of measurement but also in a comprehensive documentation of material, processing, and testing history (metadata). This Infrastructure Use Case (IUC) of the consortium Materials Science and Engineering (MatWerk) of National Research Data Infrastructure (NFDI) aims to develop, together with BAM and other Participant Projects (PP), a framework for generating reference material datasets using creep data of a single crystal Ni-based superalloy as a best practice example. In a community-driven process, we aim to encourage the discussion and establish a framework for identifying reference material datasets. In this poster presentation, we highlight our current vision and activities and intend to stimulate the discussion about the topic reference datasets and future collaborations and work. T2 - All-Hands-on-Deck congress from the NFDI-MatWerk CY - Siegburg, Germany DA - 08.03.2023 KW - Referenzdaten KW - Reference data KW - Creep KW - Syngle Crystal alloy KW - Metadata schema PY - 2023 AN - OPUS4-57146 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Skrotzki, Birgit T1 - Preparing and structuring experimental laboratory data for the publication of reference data N2 - Using a practical example, this contribution provides an insight into the procedure for processing and structuring experimental elastic modulus data (Young's modulus, E, shear modulus, G), which were determined using the resonance method for three different metallic materials [1]. The data were internally audited as BAM reference data. By reference data, we mean research data that have been measured (or simulated) to a particularly high standard and are well-documented concerning material processing, testing, and data evaluation. The datasets include information on processing routes and parameters, heat treatments, grain size, specimen dimensions, weight, and Young’s and shear modulus along with their measurement uncertainty. The processing routes and measuring methods are described in detail. The data structure is shown in Fig. 1. The datasets were generated in an accredited testing lab and are hosted in the open data repository Zenodo [2-4]. The comprehensive documentation of the metadata, which is linked to the intended usages of the dataset, and the sharing in a machine-readable structured format in an open repository represents an important step towards fulfilling the FAIR (Findability, Accessibility, Interoperability, Reusable) principles. The publication of a data descriptor article increases the visibility of the dataset in the targeted community. T2 - MSE2024 CY - Darmstadt, Germany DA - 24.09.2024 KW - Reference data KW - Young's modulus PY - 2024 AN - OPUS4-61144 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Ávila Calderón, Luis A1 - Hammerschmidt, T. A1 - Gedsun, A. A1 - Forti, M. A1 - Olbricht, Jürgen A1 - Stotzka, R. A1 - Skrotzki, Birgit T1 - IUC02 Framework for Curation and Distribution of Reference Datasets using Creep Data of Ni-Base Superalloys as an Example N2 - In our current view, reference datasets in the MSE domain represent specific material properties, e.g., structural, mechanical, … characteristics. A reference dataset must fulfill high-quality standards, not only in precision of measurement but also in a comprehensive documentation of material, processing, and testing history (metadata). This Infrastructure Use Case (IUC) aims to develop a framework for generating reference material datasets using creep data of a single crystal Ni-based superalloy as a best practice example. In a community-driven process, we aim to encourage the discussion and establish a framework for the creation and distribution of reference material datasets. In this poster presentation, we highlight our current vision and activities and intend to stimulate the discussion about the topic reference datasets and future collaborations and work. T2 - NFDI-MatWerk Conference CY - Siegburg, Germany DA - 27.06.2023 KW - Referenzdaten KW - Reference data KW - Syngle Crystal alloy KW - Creep KW - Metadata schema PY - 2023 AN - OPUS4-57923 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Radnik, Jörg T1 - Reliable, and reproducible physico-chemical data of nanomaterials for risk assessment N2 - Nanoforms with at least one dimension below 100 nm have an important part to play in more and more areas of our daily life. Therefore, risk assessment of these materials is becoming increasingly important. In this context, the European Chemical Agency (ECHA) considered eleven physico-chemical properties as relevant, of which the following six are essential for the registration: chemical composition, crystallinity, particle size, particle shape, surface chemistry and specific surface area. Four of these priority properties can be obtained with electron microscopy and surface analytics like XPS and ToF-SIMS. The reliability of this data must be ensured, especially for their use for grouping and read across approaches. On the other hand, the “reproducibility” crisis has revealed major shortcomings in the reliability of published data. In a case study, we show how the quality of the data can be ensured by using existing standards and protocols of each step in the workflow of sample characterization. As exemplary samples, two Al-coated TiO2 samples as nanopowders were selected from the JRC repository, capped either with a hydrophilic or a hydrophobic organic ultrathin shell. SEM results provided the size and shape of the nanoparticles, a first overview about the composition was obtained with EDS. XPS and ToF-SIMS supplied the surface chemistry, especially information about the shell and the coating of the particles. Standards and protocols of all steps of the analytical workflow including preparation and data reduction are discussed regarding reliable and reproducible data. Additionally, uncertainties for the different steps are specified. Only such a detailed description of all these factors allows a comprehensive physico-chemical characterization of the nanoparticles with understanding of their potential risk assessment. T2 - ECASIA 2022 CY - Limerick, Ireland DA - 29.05.2022 KW - Reference data KW - Risk assessment KW - Nanomaterials KW - Titania PY - 2022 AN - OPUS4-54961 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Ávila Calderón, Luis A1 - Hammerschmidt, T. A1 - Stotzka, R. T1 - Demonstration of the Infrastructure Use Case 02: Framework for curation and distribution of reference datasets N2 - In our current view, reference datasets in the MSE domain represent specific material properties, e.g., structural, mechanical, … characteristics. A reference dataset must fulfill high-quality standards, not only in precision of measurement but also in a comprehensive documentation of material, processing, and testing history (metadata). This Infrastructure Use Case (IUC) aims to develop a framework for generating reference material datasets using creep data of a single crystal Ni-based superalloy as a best practice example. In a community-driven process, we aim to encourage the discussion and establish a framework for the creation and distribution of reference material datasets. In this poster presentation, we highlight our current vision and activities and intend to stimulate the discussion about the topic reference datasets and future collaborations and work. T2 - NFDI-MatWerk Conference CY - Siegburg, Germany DA - 27.06.2023 KW - Referenzdaten KW - Reference data KW - Creep KW - Metadata schema KW - Syngle Crystal alloy PY - 2023 AN - OPUS4-57924 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER -