TY - CONF A1 - Winkelmann, Aimo A1 - Lühr, T. A1 - Westphal, C. A1 - Nolze, Gert T1 - Improved analysis of EBSD patterns N2 - The presentation demonstrates how crystal structures can be derived from EBSD patterns. T2 - EBSD Meeting CY - London, UK DA - 31.03.2014 KW - Electron backscatter diffraction KW - Kikuchi pattern KW - Crystal structure analysis PY - 2014 AN - OPUS4-37893 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Nolze, Gert T1 - Computational Advances N2 - The EBSD signal provides more information than the used Kikuchi pattern. The presentation discusses several parts of the detected signal and how they can be interpreted. T2 - EBSD 2014 CY - Pittsburgh, Pennsylvania, USA DA - 17.06.2014 KW - Electron backscatter diffraction KW - Simulation KW - Kikuchi pattern KW - Magnetite KW - Maghemite KW - Hematite PY - 2014 AN - OPUS4-37899 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Payton, E. A1 - Nolze, Gert T1 - The BSE signal as an additional tool for phase assignment in EBSD N2 - The presentation demonstrates how the background signal of EBSD patterns can be used for a rough assignment of phases which cannot distinguished by the diffraction signal. T2 - EBSD 2012 CY - Pittsburgh, Pennsylvania, USA DA - 19.06.2012 KW - Electron backscatter diffraction KW - Backscattered electrons KW - Kikuchi pattern KW - Phase distribution KW - Phase separation KW - Phase recognition PY - 2012 AN - OPUS4-37901 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Vos, M. A1 - Winkelmann, Aimo A1 - Nolze, Gert T1 - Element-specific Kikuchi patterns of Rutile N2 - The kinetic energy of keV electrons backscattered from a rutile (TiO2) surface depends measurably on the mass of the scattering atom. This makes it possible to determine separately the angular distribution of electrons backscattered elastically from either Ti or O. Diffraction effects of these backscattered electrons inside the rutile crystal lead to the formation of Kikuchi patterns. The element-resolved Kikuchi patterns of Ti and O differ characteristically, but each can be described fairly well in terms of the dynamical theory of diffraction. Qualitatively, much of the differences can be understood by considering the relative arrangement of the Ti and O atoms with respect to planes defined by the crystal lattice. KW - Electron Rutherford backscattering KW - TiO2 KW - Kikuchi pattern KW - EBSD pattern KW - Simulation PY - 2015 U6 - https://doi.org/10.1016/j.ultramic.2015.04.018 SN - 0304-3991 VL - 156 SP - 50 EP - 58 AN - OPUS4-37787 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - GEN A1 - Winkelmann, A. A1 - Britton, T. B. A1 - Nolze, Gert T1 - EBSD Kikuchi Pattern Analysis, Silicon 15kV N2 - Supplementary data and images for Si EBSD pattern analysis as presented in: A. Winkelmann, T.B. Britton, G. Nolze "Constraints on the effective electron energy spectrum in backscatter Kikuchi diffraction", Physical Review B (2019). KW - EBSD KW - Electron energy KW - Energy distribution KW - Kikuchi pattern KW - Simulation PY - 2019 U6 - https://doi.org/10.5281/zenodo.2565061 PB - Zenodo CY - Geneva AN - OPUS4-51907 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Nolze, Gert A1 - Winkelmann, A. A1 - Britton, T. B. T1 - Constraints on the effective electron energy spectrum in backscatter Kikuchi diffraction N2 - Electron backscatter diffraction (EBSD) is a technique to obtain microcrystallographic information from materials by collecting large-angle Kikuchi patterns in the scanning electron microscope (SEM). An important fundamental question concerns the scattering-angle dependent electron energy distribution, which is relevant for the formation of the Kikuchi diffraction patterns. Here we review the existing experimental data and explore the effective energy spectrum that is operative in the generation of backscatter Kikuchi patterns from silicon. We use a full pattern comparison of experimental data with dynamical electron diffraction simulations. Our energy-dependent cross-correlation based pattern matching approach establishes improved constraints on the effective Kikuchi pattern energy spectrum, which is relevant for high-resolution EBSD pattern simulations and their applications. KW - EBSD KW - Kikuchi pattern KW - Simulation KW - Energy distribution KW - Electron energy PY - 2019 SN - 2469-9950 SN - 2469-9969 VL - 99 IS - 6 SP - 064115-1 EP - 064115-13 PB - AIP AN - OPUS4-47635 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER -