TY - CONF A1 - Hodoroaba, Vasile-Dan T1 - Towards Standardised Procedures for Morphology Measurement of 2D-Materials by Imaging N2 - The industry uptake of graphene-related 2D materials (GR2M) material increases, and international standardization is critical to enable commercialization. Reliable, accurate, and reproducible measurements are important due to the multiple production routes and producers of the material to maintain quality in manufacture. Several standards are under development within ISO/TC 229 ‘Nanotechnologies’, i.e. ISO/AWI TS 23879 “Structural characterization of graphene oxide flakes: thickness and lateral size measurement using AFM and SEM” or ISO DTS 23359 “Chemical characterization of graphene in powders and suspensions”, which focus on determining the dimensional and chemical properties of GR2M. Interlaboratory comparisons are required to develop best practice and understand the associated measurement uncertainties. In this contribution challenges and solutions for the accurate measurement of the lateral size of GR2M will be discussed based on the results of a recently completed interlaboratory comparison organized under the pre-standardisation platform of VAMAS (www.vamas.org/twa41/documents/2023_vamas_twa41_project13_GO_SEM.pdf). Aspects related to sample preparation, measurement conditions, and image analysis with different approaches to extract the corresponding size and shape descriptors will be presented. A discussion on the measurement uncertainty budget associated to the final result will be also included. T2 - Graphene Week 2025 CY - Vicenza, Italy DA - 22.09.2025 KW - Graphene-related 2D materials (GR2M) KW - Interlaboratory comparison KW - VAMAS KW - Lateral size KW - ISO/TC 229 Nanotechnologies PY - 2025 AN - OPUS4-64250 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Ávila Calderón, Luis A1 - Shakeel, Yusra T1 - NFDI-MatWerk PP18 / IUC02 Reference Data: Creep Data of a single crystalline Ni-Base Alloy N2 - Reference datasets in the MSE domain represent specific material properties, e.g., structural, mechanical, … characteristics. A reference dataset must fulfill high-quality standards, not only in precision of measurement but also in a comprehensive documentation of material, processing, and testing history (metadata). This Infrastructure Use Case (IUC) of the consortium Materials Science and Engineering (MatWerk) of National Research Data Infrastructure (NFDI) aims to develop, together with BAM and other Participant Projects (PP), a framework for generating reference material datasets using creep data of a single crystal Ni-based superalloy as a best practice example. In a community-driven process, we aim to encourage the discussion and establish a framework for identifying reference material datasets. In this poster presentation, we highlight our current vision and activities and intend to stimulate the discussion about the topic reference datasets and future collaborations and work. T2 - All-Hands-on-Deck congress from the NFDI-MatWerk CY - Siegburg, Germany DA - 08.03.2023 KW - Referenzdaten KW - Reference data KW - Creep KW - Syngle Crystal alloy KW - Metadata schema PY - 2023 AN - OPUS4-57146 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Ávila Calderón, Luis A1 - Hammerschmidt, T. A1 - Gedsun, A. A1 - Forti, M. A1 - Olbricht, Jürgen A1 - Stotzka, R. A1 - Skrotzki, Birgit T1 - IUC02 Framework for Curation and Distribution of Reference Datasets using Creep Data of Ni-Base Superalloys as an Example N2 - In our current view, reference datasets in the MSE domain represent specific material properties, e.g., structural, mechanical, … characteristics. A reference dataset must fulfill high-quality standards, not only in precision of measurement but also in a comprehensive documentation of material, processing, and testing history (metadata). This Infrastructure Use Case (IUC) aims to develop a framework for generating reference material datasets using creep data of a single crystal Ni-based superalloy as a best practice example. In a community-driven process, we aim to encourage the discussion and establish a framework for the creation and distribution of reference material datasets. In this poster presentation, we highlight our current vision and activities and intend to stimulate the discussion about the topic reference datasets and future collaborations and work. T2 - NFDI-MatWerk Conference CY - Siegburg, Germany DA - 27.06.2023 KW - Referenzdaten KW - Reference data KW - Syngle Crystal alloy KW - Creep KW - Metadata schema PY - 2023 AN - OPUS4-57923 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Beckmann, Jörg T1 - THz- and MIR FTIR Spectroscopy on Polyethylene, N2 - THz and mid IR spectroscopy of high-molecular PE (HMW) and ultra high-molecular PE (UHMW) reveals modifications of the molecular structure. Characteristic absorption bands are changed if the two materials are exposed by -Co60 radiation up to 600 kGy and subsequently stored at an annealing temperature of 398 K until for 729 days. UHMW-PE and HMW-PE behave differently during the ageing process because of their molecular weight and inherent structure distinctions. The spectroscopic data offer characteristic absorption bands, which have been used to describe the complete ageing process in more detail. For instance, the integral absorption in the B1u THz-region can be used to describe quantitatively the reduction of crystallinity. The formation of trans vinylene unsaturation and the decay of vinyl during ageing can be observed in detail in the mid IR range. T2 - IRMMW-THz 2018 (43rd) Conference CY - Nagoya, Japan DA - 09.09.2018 KW - Gamma-Co60 radiation KW - THz and mid IR spectroscopy PY - 2018 AN - OPUS4-46442 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Mrkwitschka, Paul T1 - Standardized Chemical Composition Analysis of Graphene Oxide Flakes with SEM/EDS and XPS Works Reliably N2 - Reliable quantification of the chemical composition of graphene-related 2D materials as powders and liquid suspensions is a challenging task. Analytical methods such as XPS, ICP-MS, TGA and FTIR are recommended to be used in ongoing projects at standardization bodies. The specific parameters to be measured are also defined, e.g. the oxygen-to-carbon (O/C) concentration ratio, the trace metal impurities, or the functional groups present [1]. In this contribution, for the first time, the results of a systematic study on the capability of SEM/EDS to reliably quantify the O/C ratio in a well-defined and well-characterized graphene oxide material [2] are presented. It is expected that the quantitative EDS analysis of light elements emitting characteristic X-ray lines below 1 keV to be provided with significantly larger measurement uncertainties than the analysis of elements with an atomic number of 11 (Na) or above [3]. The robustness of the SEM/EDS results obtained at various measurement conditions (various excitation energies) is tested by comparing the results to the established XPS analysis [4], which has been carried out on the same samples. A crucial step in sample preparation from liquid suspension with graphene oxides flakes onto a substrate for analysis with both XPS and EDS. It is demonstrated that if a closed and enough thick drop-cast deposited spot is succeeded to be deposited on a substrate, both surface-sensitive XPS analysis and bulk-characterizing EDS result in very similar elemental composition of oxygen and carbon. Hence, theoretical, expected O/C atomic ratio values for pure graphene oxide of ~0.5 [1] are achieved (with both methods), see Figure 1. Further, the effect of untight deposited material enabling co-analysis of the (silicon) substrate, is evaluated for both methods, XPS and EDS. To note that all the EDS results in this study have been quantified standardless. The effect of the variation of beam voltage on the result of the quantification of the O/C ratio is shown in Figure 2. No clear tendency is visible by varying the kV, which is a confirmation of the quality of the standardless analysis at the used EDS spectrometer. The results of this study demonstrate the reliability of the reference measurement protocol for SEM/EDS to be introduced into ISO/DTS 23359, including the dedicated sample preparation, particularly for the cases when the concentration of the GO flakes in stock liquid suspension is low. Further, also the consideration of this GO material as one of the very few available as a commercial material on the market as the very first GO reference material with regard to its morphology as well as chemical composition. Both the standard measurement procedure and the candidate reference material will immensely contribute to characterise reliably the chemical composition of graphene-related 2D materials with SEM/EDS as one of the most widely used methods in analytical laboratories. T2 - Microscopy and Microanalysis 2025 CY - Salt Lake City, UTAH, USA DA - 27.07.2025 KW - Graphene oxide flakes KW - SEM/EDS KW - XPS KW - O/C ratio KW - Impurities PY - 2025 AN - OPUS4-64085 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Chemello, Giovanni T1 - Towards Reproducible Analysis Workflows for Reliable Structural and Chemical Composition of Industrial Graphene N2 - The scientific and technological interest in graphene has been growing more and more in the late years due to its outstanding properties and diverse promising applications. However, graphene implementation into the industrial market is still limited and many challenges are yet to be addressed before this material can become suitable for the large-scale production. One of the most crucial challenge to overcome is to develop reliable and reproducible ways to characterize the material properties which can heavily affect the product performance. In our study the chemical composition of nine different samples of industrial graphene, graphene oxide and functionalized graphene were investigated. The samples were analysed both in form of powder and pellets. A comparative characterisation of the chemical composition was performed through X-ray Photoelectron Spectroscopy (XPS) and Energy Dispersive X-ray Spectroscopy (EDX). XPS depth resolution is in the order of 10 nm, while for EDX the analysis was performed at two different energy levels, i.e. 5 keV and 15 keV, and thus varying the analysis depth from 200 nm to 2000 nm. The XPS measurement area is 300x700 µm² while the EDX measurement was performed by analysing a grid of 25 locations (5x5) of 150 x 150 ?m2 area, covering the whole pellet surface of 5 mm diameter and then calculating the mean of the elemental concentration. The results of the elemental concentration values from XPS and EDX analyses show a good agreement for all the elements presents in the samples, despite the different spatial resolutions of the two techniques. Therefore, the samples appear homogeneous both in the lateral and vertical directions. The results relative to powder and pellets samples do not differ in a significant way except for a slight increase in the carbon content regarding the pellet samples, probably due to a minor contamination effect introduced through pressing. Nevertheless, pellets samples appear to be quite representative for the material while being much more convenient in terms of handling and safety compared to nano-powders and providing a regular flat surface for EDX analysis. Finally, this approach correlating XPS and EDS represents a simple, fast and reliable way for characterizing the chemical composition and the homogeneity of industrial graphene. This study is part of the project Standardisation of structural and chemical properties of graphene (ISO-G-SCoPe) which has received funding from the EMPIR programme co-financed by the Participating States and from the European Union?s Horizon 2020 research and innovation programme under Grant agreement No. 19NRM04. T2 - SALSA Make and Measure... and Machines CY - Online meeting DA - 16.09.2021 KW - Graphene KW - XPS KW - EDX KW - Graphene functionalisation PY - 2021 UR - https://fakultaeten.hu-berlin.de/en/mnf/forschung_internationales/grs/salsa/SALSA_MM AN - OPUS4-53463 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Chatzigiannakis, Emmanouil T1 - Influence of composition on the thermal ageing behaviour of EPDM N2 - Ethylene-propylenene-diene copolymer rubbers (EPDM) are used in a wide range of sealing applications e.g. in automotive industry or in containers for dangerous goods. Investigations with regard to the ageing behavior and lifetime prediction of commercial EPDM rubber seals consisting of 48 % polypropylene (PP) and 4.1 % of 5-ethylidene-2-norbornene (ENB) were conducted [1]. However, structural parameters (monomer ratio, diene type, curing agent etc.) and additives (filler, plasticizer etc.) are known to affect the ageing behavior of rubber compounds [2, 3]. The aim of the current study was to elucidate the influence of each component on the overall deterioration of material properties after thermal ageing. Therefore, different EPDM mixtures were prepared at BAM, the reference being an EPDM with 48 % PP and 4.1 % ENB reinforced with Sillitin. Five more formulations were prepared in order to assess the effect of (i) filler type (carbon black or sillitin), (ii) curing agent (sulfur or peroxide), (iii) plasticizer, (iv) ethylene-propylene ratio and (v) ENB content. Initially, the properties of the unaged materials were investigated by tensile testing, hardness and density measurements, TGA, DSC and DMA. Sulfur vulcanization resulted in higher elongation at break due to the flexibility of the sulfidic crosslinks. Carbon black resulted in better reinforcement compared to Sillitin. A higher ethylene and ENB content lead to higher hardness due to higher crystallinity and higher crosslink density, respectively. Thermal ageing for up to 30 days (with 10 days intervals) took place in circulating hot air ovens at 125 °C. Pronounced crosslinking was found to take place in all peroxide-cured materials, as the unreacted double bonds of the ENB units acted as starting points for oxidation and crosslinking. Increasing the ethylene content resulted in an increase in the ageing resistance of EPDM. This improvement was attributed to the higher crystallinity that inhibits oxygen diffusion and to the smaller number of chain scissions which occur in the PP units. Although significant loss of the plasticizer was observed, the remaining plasticizer adequately improved the tensile properties of the material. The filler type did not significantly affect the ageing behavior of EPDM. Finally, the lower thermal stability of the sulfidic crosslinks resulted in desulfurization and, thus, in an increase in the crosslinking density. To sum up, it has been shown that the monomer composition, curing agent and additives used in EPDM formulations greatly influence the properties and ageing resistance of these materials. T2 - 12. Kautschuk Herbst Kolloquium CY - Hanover, Germany DA - 22.11.2016 KW - Degradation KW - Elastomer KW - Compound PY - 2016 AN - OPUS4-38484 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Chemello, Giovanni T1 - Correlative analysis through XPS and EDX measurements for accurate chemical composition of industrial Graphene N2 - The scientific and technological interest in graphene has been growing more and more in the late years due to its outstanding properties and diverse promising applications. However, graphene implementation into the industrial market is still limited and many challenges are yet to be addressed before this material can become suitable for the large-scale production. One of the most crucial challenge to overcome is to develop reliable and reproducible ways to characterize the material properties which can heavily affect the product performance. In our study the chemical composition of nine different samples of industrial graphene, graphene oxide and functionalized graphene were investigated. The samples were analysed both in form of powder and pellets. A comparative characterisation of the chemical composition was performed through X-ray Photoelectron Spectroscopy (XPS) and Energy Dispersive X-ray Spectroscopy (EDX). XPS depth resolution is in the order of 10 nm, while for EDX the analysis was performed at two different energy levels, i.e. 5 keV and 15 keV, and thus varying the analysis depth from 200 nm to 2000 nm. The XPS measurement area is 300x700 µm² while the EDX measurement was performed by analysing a grid of 25 locations (5x5) of 150 x 150 ?m2 area, covering the whole pellet surface of 5 mm diameter and then calculating the mean of the elemental concentration. The results of the elemental concentration values from XPS and EDX analyses show a good agreement for all the elements presents in the samples, despite the different spatial resolutions of the two techniques. Therefore, the samples appear homogeneous both in the lateral and vertical directions. The results relative to powder and pellets samples do not differ in a significant way except for a slight increase in the carbon content regarding the pellet samples, probably due to a minor contamination effect introduced through pressing. Nevertheless, pellets samples appear to be quite representative for the material while being much more convenient in terms of handling and safety compared to nano-powders and providing a regular flat surface for EDX analysis. Finally, this approach correlating XPS and EDS represents a simple, fast and reliable way for characterizing the chemical composition and the homogeneity of industrial graphene. This study is part of the project ?Standardisation of structural and chemical properties of graphene? (ISO-G-SCoPe) which has received funding from the EMPIR programme co-financed by the Participating States and from the European Union?s Horizon 2020 research and innovation programme under Grant agreement No. 19NRM04. T2 - 2021 Fall Meeting of the European Materials Research Society (E-MRS) CY - Online meeting DA - 20.9.2021 KW - Graphene KW - XPS KW - EDS KW - Standardisation KW - Graphene functionalization PY - 2021 UR - https://www.european-mrs.com/meetings/2021-fall-meeting AN - OPUS4-53462 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Sachse, René T1 - Spectroscopic ellipsometry for the determination of thickness and porosity of mesoporous metal oxide films N2 - Thin mesoporous metal oxide films are versatile and attractive candidates for several energy applications like photovoltaics, electrolysis or batteries. Due to their high surface area and ordered pore structure, mesoporous metal oxides demonstrate higher activities. The performance of the porous films is affected by properties like size and shape of the mesopores as well as the crystallinity of the framework. The exact determination and metrological evaluation of the complex morphology of thin mesoporous films requires a new analytical approach employing to combined data of different analytical methods. In this contribution we present a novel evaluation procedure for spectroscopic ellipsometry (SE) to analyse thin mesoporous iridium oxide films. Mesoporous iridium oxide films were prepared via dip-coating of a solution containing a triblock-copolymer as structure directing agent and an iridium precursor in ethanol. Deposited films were calcined in air at temperatures between 300 and 600 °C. Their morphology was studied with SEM and an electron probe microanalysis (EPMA)and correlated via SE with a Bruggeman effective medium approximation (BEMA). The developed SE model described the film thickness as well as the porosity. Figure 1a shows a top-view SEM image of mesoporous IrO2 film calcined at 375 °C. The image reveals that the films exhibit a well-ordered mesopore structure with an average pore diameter of 16 nm and a periodic distance between pore centres of 24 nm (FFT inset). Figure 1b is a parity plot of film thicknesses determined by cross-section SEM versus SE of IrO2 film samples prepared at different calcination temperatures. The porosity from the SE model is in good agreement to the porosity values obtained by EPMA. The contribution will assess in detail the novel approach to analyse the morphology and porosity of thin metal oxide films with spectroscopic ellipsometry. Moreover, the advantages of the new developed approach will be discussed as well as combination of datasets from multiple measurements to development new methods for innovative energy technologies. T2 - 30. Deutsche Zeolith-Tagung und Jahrestreffen der ProcessNet-Fachgruppe Adsorption CY - Kiel, Germany DA - 28.02.2018 KW - Mesoporous materials KW - Iridium oxide films KW - Electro catalyst KW - Spectroscopic ellipsometry KW - Thin film metrology KW - Multi-sample analysis PY - 2018 AN - OPUS4-45101 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Mishurova, Tatiana T1 - Influence of manufacturing parameters on microstructure and subsurface residual stress in SLM Ti-6Al-4V N2 - Residual stresses (RS) in SLM have a high impact on the chosen build strategy as well as on the mechanical performance of final product. RS are critical for the components since they can introduce distortion and cracking of the parts even during production. T2 - AAMS2018 CY - Sheffield, UK DA - 03.09.2018 KW - Residual stress KW - Selective laser melting KW - Synchrotron X-ray diffraction KW - Ti-6Al-4V PY - 2018 AN - OPUS4-45928 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER -