TY - GEN A1 - Beck, Uwe T1 - Multidimensional Methods for Industrial Quality Assurance T2 - Optische Analytik in the Capital Region Berlin-Brandenburg N2 - The paper addresses the ā€žMultidimensional Methods for Industrial Quality Assuranceā€œ and the following points are discussed in more detail: thin film analysis, major trends regarding optical measuring methods. KW - optische Konstanten KW - Ellipsometrie KW - Klassifizierungssystem KW - Optical konstantyss KW - Ellipsometry KW - Classification stem PY - 2015 SP - 35 EP - 35 AN - OPUS4-37949 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER -